摘要:
Dispositif mémoire (100) comprenant : - une matrice (102) de cellules mémoires comportant des transistors FET incluant des éléments de polarisation arrière, dont au moins une colonne (104.1, 104.2) forme des bits de polarisation arrière ; - un circuit de polarisation arrière (106) délivrant des tensions dépendantes des bits de polarisation arrière ; - des premiers et deuxièmes éléments de couplage (108, 110), couplant des points mémoires des bits de polarisation arrière avec le circuit de polarisation arrière, et le circuit de polarisation arrière avec les éléments de polarisation arrière des cellules de la matrice ; dans lequel : - le dispositif forme un circuit 3D comprenant des première et deuxième couches actives entre lesquelles plusieurs couches d'interconnexions sont empilées ; - les premiers et/ou deuxièmes éléments de couplage comportent des portions métalliques d'une des couches d'interconnexions.
摘要:
Mémoire SRAM (100) comportant : - une matrice de cellules mémoires (102) ; - des lignes de bit (110) et des lignes de mot (112) ; - des ports de lecture (104) associés aux cellules mémoires et couplés aux lignes de bit et aux lignes de mot ; - des lignes de masse virtuelle locale (122), LVGND, chacune couplée à des bornes de potentiel de référence des ports de lecture d'au moins une ligne de cellules mémoires ; - des éléments de commande locaux (124) chacun configuré pour coupler électriquement l'une des lignes LVGND à un potentiel d'alimentation ou à une ligne de masse virtuelle générale (130), ou ligne GVGND ; - un élément de commande général (132) configuré pour coupler la ligne GVGND au potentiel électrique d'alimentation ou à un potentiel électrique de référence.
摘要:
Read-assist circuits for memory bit cells employing a P-type Field-Effect Transistor (PFET) read port(s) are disclosed. Related memory systems and methods are also disclosed. It has been observed that as node technology is scaled down in size, PFET drive current (i.e., drive strength) exceeds N-type FET (NFET) drive current for like-dimensioned FETs. In this regard, in one aspect, it is desired to provide memory bit cells having PFET read ports, as opposed to NFET read ports, to increase memory read times to the memory bit cells, and thus improve memory read performance. To mitigate or avoid a read disturb condition that could otherwise occur when reading the memory bit cell, read-assist circuits are provided for memory bit cells having PFET read ports
摘要:
A programmable integrated circuit may include configuration random-access memory (CRAM) cells and lookup table random-access memory (LUTRAM) cells. The programmable integrated circuit may include a CRAM column and at least two LUTRAM columns, a first portion of which is operable as LUTRAM cells and a second portion of which is reused as CRAM cells. Each of the memory cells have a configuration write port and a read port. The configuration write ports of the first portion may be gated, whereas the configuration write ports of the second portion lack gating logic. The read port of the memory cells in the LUTRAM columns may be masked only when the first portion of cells are operated in RAM mode and are currently being accessed.
摘要:
A static random access memory (SRAM) with high efficiency. The SRAM has a first bistable cell, a first bit line, a first complementary bit line, a first word line, and a second word line. The first bistable cell has a first access terminal, a second access terminal, a first access switch and a second access switch. The first access switch is controlled by the first word line to couple the first access terminal to the first bit line. The second access switch is controlled by the second word line to couple the second access terminal to the first complementary bit line.
摘要:
Integrated circuits with volatile random-access memory cells are provided. A memory cell may be coupled to write bit lines and a read bit line. The write bit line may not be coupled to any precharge circuitry. The read bit line may only be precharged during memory access operations. In one suitable arrangement, the read bit line may be precharge immediately after an address decoding operation and before an evaluation phase. In another suitable arrangement, the read bit line may be precharged after an addressing decoding operation and in parallel with the evaluation phase. In either arrangement, a substantial amount of leakage and active power can be reduced.