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公开(公告)号：EP1326526B1
公开(公告)日：2006-12-27
申请号：EP01971471.6
申请日：2001-10-11
CPC分类号： G02B21/0052 , A61B3/135 , G02B5/005 , G02B21/0028 , G02B26/00 , G02B27/46
摘要： The invention relates to an imaging optical device, comprising a light source arrangement (25) and an illumination beam path (3) which is separated from an observation beam path (11) at least in sections. An illumination lens arrangement (4) is provided in the illumination beam path (3) and an observation lens arrangement (12) is provided in the observation beam path (11). In the illumination beam path (3), an illumination field stop (2) is provided at a distance from the illumination lens arrangement (4), an object (32) to be imaged lying in the illumination image plane (27) into which the illumination lens arrangement (4) projects a representation of the illumination field stop (2) and the observation lens arrangement (12) projecting a representation of the object (32)to be imaged into the observation image plane (28). The invention is characterised in that at least one spatial filter (17, 18) which is optionally formed by a stop is located in the observation beam path (11) outside of the observation image plane (28).Said spatial filter(s) and the illumination field stop (2), as well as an optionally provided observation field stop (13), are preferably mounted in a fixed geometrical manner in relation to each other in such a way that they are can move, preferably oscillate.
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12.发明公开Korrektur-Vorrichtung für eine optische Anordnung und konfokales Mikroskop mit einer solchen Vorrichtung 审中-公开用于光学器件和共聚焦显微镜利用这样的装置校正装置
公开(公告)号：EP1624329A3
公开(公告)日：2006-02-22
申请号：EP04023513.7
申请日：2004-10-01
申请人： Carl-Zeiss Jena GmbH
发明人： Wald, Matthias , Steinert, Jörg , Pergande, Saskia
CPC分类号： G02B7/004 , G02B21/0052 , G02B21/0072 , G02B26/0875 , G02B27/0068
摘要： Eine Korrektur-Vorrichtung für eine einen Strahlengang aufweisende, abbildende optische Anordnung (1), insbesondere für ein Mikroskop, weist mindestens eine planparallele transparente Platte (9) auf, die in einer Halterung im Abbildungsstrahlengang gehalten ist und durch diese in einer Kipp- und/oder Schwenkbewegung um mindestens eine Achse antreibbar ist, um durch Veränderung der Kipplage der Platte (9) einen bestimmten Parallelversatz der Strahlen im Abbildungsstrahlengang einzustellen. Ein konfokales Mikroskop mit einer solchen Korrekturvorrichtung weist eine konfokale Blende (4) auf, die ein Probenspot (10) abbildet, wobei die planparallele Platte (9) im Strahlengang der Detektoreinheit (2) vorgeordnet ist, um die Abbildung der Aperturblende auf die Detektoreinheit zu zentrieren.
摘要翻译： 该装置具有一安装板（11）成影像光束路径用于在图像光束路径保持平行平面的透明板（9），该安装板在倾斜运动移动所述透明板和一个上的轴线周围旋转 安装板，和bestimmt光束的明确并行错位成的透明板的倾斜状况变化的光路。 因此独立claimsoft包含用于共焦显微镜，包括：用于聚焦所选择的样本范围内的共焦屏幕上的校正装置。
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公开(公告)号：EP1617271A2
公开(公告)日：2006-01-18
申请号：EP05012843.8
申请日：2005-06-15
申请人： CARL ZEISS JENA GmbH
IPC分类号： G02B21/00
CPC分类号： G02B21/0032 , G02B15/173 , G02B21/0052
摘要： Für ein konfokales Raster-Mikroskop (1) ist eine Zoom-Optik (41) vorgesehen, die nicht nur eine Zoomfunktion ermöglicht, indem eine variable Vergrößerung bei einer Abbildung ermöglicht ist, sondern die zusätzlich eine Pupillenabbildung im Beleuchtungsstrahlengang (BS) realisiert und dabei eine veränderliche Abbildungslänge (Abstand zwischen ursprünglicher (EP) und abgebildeter Pupille (AP)) ermöglicht, so daß damit axial variierende Objektivpupillenlagen kompensiert werden können.
摘要翻译： 对于共焦扫描显微镜（1）是变焦透镜（41）提供一种不仅能够由可变放大倍率在成像提供了一种变焦功能，但其还包括在所述照明光束路径（BS）的光瞳成像而实现 可变成像长度（原始（EP）和成像瞳孔（AP）之间的距离）允许，从而可以补偿轴向变化的透镜瞳孔位置。
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公开(公告)号：EP0866993B1
公开(公告)日：2004-02-25
申请号：EP97935534.4
申请日：1997-07-22
申请人： CARL ZEISS JENA GmbH
CPC分类号： G02B21/0032 , G02B21/0024 , G02B21/0052 , G02B21/0072 , G02B21/06
摘要： The invention concerns a doublet system for a microscope, with one lens (25) being provided for focusing object illumination onto an object point, and one lens (33) for collecting light emitted by the object point. The optical axes of the two lens systems (25, 33) are at a slant to one another, so that the direction of observation and the direction of illumination are at an angle to one another. The two lens systems (25, 33) are grouped together into a doublet unit (1) on a joint holder (3); light can be supplied to this unit from an object illumination source, through a light aperture (5). A light deflection system (19, 21, 23, 37, 39) is also provided, which distorts the illumination path (35) and/or the observation path (35) in such a way that the observation light coming from the observation lens (33) leaves the doublet unit (1) through the light aperture (5). Thus the doublet unit can be employed in a conventional microscope design.
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公开(公告)号：EP1326526A2
公开(公告)日：2003-07-16
申请号：EP01971471.6
申请日：2001-10-11
CPC分类号： G02B21/0052 , A61B3/135 , G02B5/005 , G02B21/0028 , G02B26/00 , G02B27/46
摘要： The invention relates to an imaging optical device, comprising a light source arrangement (25) and an illumination beam path (3) which is separated from an observation beam path (11) at least in sections. An illumination lens arrangement (4) is provided in the illumination beam path (3) and an observation lens arrangement (12) is provided in the observation beam path (11). In the illumination beam path (3), an illumination field stop (2) is provided at a distance from the illumination lens arrangement (4), an object (32) to be imaged lying in the illumination image plane (27) into which the illumination lens arrangement (4) projects a representation of the illumination field stop (2) and the observation lens arrangement (12) projecting a representation of the object (32)to be imaged into the observation image plane (28). The invention is characterised in that at least one spatial filter (17, 18) which is optionally formed by a stop is located in the observation beam path (11) outside of the observation image plane (28).Said spatial filter(s) and the illumination field stop (2), as well as an optionally provided observation field stop (13), are preferably mounted in a fixed geometrical manner in relation to each other in such a way that they are can move, preferably oscillate.
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16.发明公开Optical image separation system and confocal scanner unit 审中-公开Optisches Bildtrennungssystem und konfokale Abtasteinheit
公开(公告)号：EP1168029A2
公开(公告)日：2002-01-02
申请号：EP00116790.7
申请日：2000-08-03
发明人： Kawamura, Shinichirou, c/o Yokogawa Electric Corp. , Negishi, Hideomi, c/o Yokogawa Electric Corporat. , Tomosada, Nobuhiro, c/o Yokogawa Electric Corp. , Ootsuki, Shinya, c/o Yokogawa Electric Corporation , Shelbee, Jafer, c/o Visitech International, Ltd. , Bell, Kenneth, c/o Visitech International, Ltd.
IPC分类号： G02B21/00
CPC分类号： G02B21/0044 , G02B21/0052
摘要： To provide an optical image separation system, connected to the confocal image output port of a Nipkow disk type confocal scanner, the system being capable of detecting the light returned from a sample and emitted from the above confocal image output port by separating the return light into a plurality of different wavelength regions respectively, and of holding the throughput high without increasing the cost.
Optical image separation system 300 is realized, which is provided with a dichroic mirror or dichroic mirrors 30 (return light separating means) that separates return light 7 from sample 60, emitted from confocal image output port 110 of confocal scanner 100.摘要翻译： 为了提供一种连接到Nipkow盘型共聚焦扫描器的共聚焦图像输出端口的光学图像分离系统，该系统能够通过将返回光分离成来检测从样品返回的光并从上述共焦图像输出端口发射的光 多个不同的波长区域，并且在不增加成本的情况下保持吞吐量高。 实现了光学图像分离系统300，其配备有从共聚焦扫描器100的共聚焦图像输出端口110发射的分离反射镜或分色镜30（返回光分离装置），其将返回光7与样品60分离。
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公开(公告)号：EP0866993A1
公开(公告)日：1998-09-30
申请号：EP97935534.0
申请日：1997-07-22
申请人： CARL ZEISS JENA GmbH
IPC分类号： G02B21
CPC分类号： G02B21/0032 , G02B21/0024 , G02B21/0052 , G02B21/0072 , G02B21/06
摘要： The invention concerns a doublet system for a microscope, with one lens (25) being provided for focusing object illumination onto an object point, and one lens (33) for collecting light emitted by the object point. The optical axes of the two lens systems (25, 33) are at a slant to one another, so that the direction of observation and the direction of illumination are at an angle to one another. The two lens systems (25, 33) are grouped together into a doublet unit (1) on a joint holder (3); light can be supplied to this unit from an object illumination source, through a light aperture (5). A light deflection system (19, 21, 23, 37, 39) is also provided, which distorts the illumination path (35) and/or the observation path (35) in such a way that the observation light coming from the observation lens (33) leaves the doublet unit (1) through the light aperture (5). Thus the doublet unit can be employed in a conventional microscope design.
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公开(公告)号：EP0492292A2
公开(公告)日：1992-07-01
申请号：EP91121285.0
申请日：1991-12-11
发明人： Sölkner, Gerald, Dr.
IPC分类号： G02B21/00
CPC分类号： G02B21/0052 , G02B5/122 , G02B21/0072
摘要： Um die konfokale Abbildungstechnik in einem Raster-Lasermikroskop im Durchlichtbetrieb anwenden zu können, war man bisher gezwungen, die zu untersuchende Probe (IC) horizontal im Laserstrahl (LA) zu verschieben. Dieses Verfahren ist äußerst zeitaufwendig, insbesondere wenn die Messung die Abtastung einer Vielzahl von Probenpunkten erfordert. Das erfindungsgemäße Raster-Lasermikroskop verwendet eine Kollektorlinse (KL), um die auf der Probenunterseite divergent austretende Laserstrahlung zu bündeln und einem als Reflektor dienenden Tripelprisma (TP) zuzuleiten. Da das Tripelprisma (TP) das einfallende Strahlenbündel parallel zu sich selbst reflektiert und die Brennebenen (BE) der Kollektor- und der Objektivlinse (KL, OL) zusammenfallen, durchläuft die Laserstrahlung erneut den Meßstellenbereich (FO). Die auf der Probenoberseite austretende Laserstrahlung (LA') wird von der Objektivlinse (OL) erfaßt, in der Ablenkeinheit (S) umgelenkt und mit Hilfe eines Strahlteilers (HS) ausgekoppelt. Ein konfokaler Strahlengang gewährleistet eine hohe Tiefenauflösung, die etwa dem 0,7fachen der Wellenlänge der verwendeten Laserstrahlung (LA) entspricht.
摘要翻译： 为了能够在透射光模式的扫描激光显微镜中应用共聚焦成像技术，以前一直以来必须将激光束（LA）中水平测量的样品（IC）置换。 该方法非常耗时，特别是当测量需要多个采样点进行扫描时。 根据本发明的扫描激光显微镜使用收集透镜（KL），以便将分散出的激光辐射聚焦在样本下侧上并将其转发到用作反射器的三棱镜（TP）。 由于三棱镜（TP）反射平行于其自身的入射光束，并且聚光透镜和物镜（KL，OL）的焦平面（BE）重合，因此激光辐射再次穿过测量的区域（FO） 点。 通过物镜（OL）检测在样品顶侧上出现的激光辐射（LA'），在偏转单元（S）中偏转，并借助分束器（HS）耦合出来。 共聚焦光束路径保证了高分辨率的深度，其大约相当于使用的激光辐射（LA）的波长的0.7倍。
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公开(公告)号：EP3181703A1
公开(公告)日：2017-06-21
申请号：EP16204727.8
申请日：2016-12-16
申请人： Paris Sciences et Lettres - Quartier Latin , Centre National de la Recherche Scientifique (CNRS) , Université Pierre et Marie Curie (Paris 6) , Université Paris Diderot - Paris 7
CPC分类号： G02B21/365 , C12Q1/6816 , G01B11/002 , G02B5/005 , G02B5/04 , G02B21/0032 , G02B21/0052 , G02B21/02 , G02B21/086 , G02B21/10 , G02B21/18 , G02B21/241 , G02B21/361 , G06T7/70 , H04N5/2256
摘要： The invention relates to an optical device (1) for measuring the position of an object (B) along a first axis (z), the object (B) being subjected to light radiations emitted by a light source (2, 21, 22), the optical device (1) comprising:
- an imaging system (5) comprising an objective for collecting light radiations diffused by the object (B), the imaging system (5) having an optical axis (O) extending parallel to the first axis (z),
- a transmission mask (8) having at least a first aperture (81, 83) and a second aperture (82, 84), the first aperture and second aperture being spaced from each other along a second axis (x), perpendicular to the first axis (z), the transmission mask (8) being arranged so as to let a first part of the radiations (R1) and a second part of the radiations (R2) which are diffused by the object (B) pass through the first aperture and the second aperture respectively, while blocking a part of the radiations (R3) emitted by the light source which is not diffused by the object, and
- a detector (6) adapted for generating an image including a first spot (S1) and a second spot (S2) representative of the first part (R1) and second part (R2) of the radiations impacting the detector plane (61),
wherein variation of the position of the object (B) relative to the object plane of the imaging system (5) along the first axis (z) causes variation of a position of the first spot (S1) and of the second spot (S2) relative to each other along the second axis (x).摘要翻译： 本发明涉及一种用于测量物体（B）沿第一轴（z）的位置的光学装置（1），物体（B）受到由光源（2,21,22）发射的光辐射， ，所述光学装置（1）包括： - 成像系统（5），其包括用于收集由所述物体（B）扩散的光辐射的物镜，所述成像系统（5）具有平行于所述第一轴线 （z）， - 具有至少第一孔径（81,83）和第二孔径（82,84）的透射掩模（8），所述第一孔径和第二孔径沿着第二轴线（x）彼此间隔开， ，垂直于所述第一轴线（z），所述透射掩模（8）布置成使得由所述物体（B）扩散的所述辐射（R1）的第一部分和所述辐射（R2）的第二部分， 分别通过第一孔径和第二孔径，同时阻挡由不是漫射的光源发射的一部分辐射（R3） 以及 - 检测器（6），适于生成包括代表影响所述第一部分（R1）和第二部分（R2）的辐射的第一点（S1）和第二点（S2）的图像， 其中，所述物体（B）相对于所述成像系统（5）的物平面沿着所述第一轴（z）的位置的变化引起所述第一光斑（S1）的位置和所述第一光点 第二点（S2）沿着第二轴（x）相对于彼此。
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20.发明公开METHODS, ARRANGEMENTS AND SYSTEMS FOR OBTAINING INFORMATION ASSOCIATED WITH AN ANATOMICAL SAMPLE USING OPTICAL MICROSCOPY 审中-公开方法，措施和与解剖样本相关信息获取利用光学显微镜系统
公开(公告)号：EP3143926A1
公开(公告)日：2017-03-22
申请号：EP16185740.4
申请日：2007-02-08
发明人： Yun, Seok-Hyun
CPC分类号： C07K14/70503 , A61B3/102 , A61B3/117 , A61B5/0059 , A61B5/0066 , A61B5/0073 , A61B5/0075 , A61B5/0084 , A61B5/0086 , A61B5/0095 , A61B5/0097 , A61B5/4088 , A61B5/412 , A61B5/413 , C07K2319/30 , C07K2319/32 , C07K2319/70 , G01B9/02091 , G01J3/4412 , G01N21/1717 , G01N21/4795 , G01N21/636 , G01N2021/1725 , G01N2021/638 , G01N2201/06 , G01N2201/0612 , G01N2800/042 , G01N2800/387 , G01N2800/7023 , G01N2800/7028 , G02B21/0052
摘要： Arrangements and methods are provided for obtaining information associated with an anatomical sample. For example, at least one first electro-magnetic radiation can be provided to the anatomical sample so as to generate at least one acoustic wave in the anatomical sample. At least one second electro-magnetic radiation can be produced based on the acoustic wave. At least one portion of at least one second electro-magnetic radiation can be provided so as to determine information associated with at least one portion of the anatomical sample. In addition, the information based on data associated with the second electro-magnetic radiation can be analyzed. The first electro-magnetic radiation may include at least one first magnitude and at least one first frequency. The second electro-magnetic radiation can include at least one second magnitude and at least one second frequency. The data may relate to a first difference between the first and second magnitudes and/or a second difference between the first and second frequencies. The second difference may be approximately between -100 GHz and 100 GHz, excluding zero.
摘要翻译： 提供了用于获取与在解剖样品相关联的信息的装置和方法。 对于实施例，至少一个第一电磁辐射可被提供给所述解剖样品，以便产生所述解剖样品中的至少一个声波。 至少一个第二电磁辐射可基于声波产生。 至少一个第二电磁辐射中的至少一个部分可以以与解剖样品中的至少一个部分相关联的确定性矿信息来提供。 此外，基于与所述第二电磁辐射相关联的数据中的信息进行分析。 所述第一电磁辐射可包括至少一个第一量值和至少一个第一频率。 第二电磁辐射可以包括至少一个第二级和至少一个第二频率。 该数据可以涉及在第一和第二幅度和/或所述第一和第二频率之间的第二差值之间的第一差值。 第二差可以是大约-100 GHz和100千兆赫，但不包括零之间。
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