公开(公告)号：EP2875386A1

公开(公告)日：2015-05-27

申请号：EP13739687.5

申请日：2013-07-19

申请人： Institut de Radioprotection et de Sûreté Nucléaire

发明人： PANZA, Fabien ,  GURRIARAN, Rodolfo

IPC分类号： G01T1/169 ,  G01T7/00

CPC分类号： G01V5/02 ,  G01N23/2206 ,  G01T1/169 ,  G01T1/36 ,  G01T7/00 ,  G06T11/006 ,  G06T2211/424

摘要： The invention relates to a method for a study of a photon emission source at a site, the method including the steps consisting of: measuring (100) the spectrometric data and the geographic coordinates of the measurement point at a surface point of said site and storing said data in association with said coordinates in a memory; moving (200) the detector to at least one other point of the site and, at each point, repeating the step of measuring and storing; and implementing a deconvolution step (500), using a predetermined detector response function, on all the measured spectrometric surface data, in order to obtain refined spectrometric surface information, said spectrometric surface information enabling the geographic location and the evaluation of the photon emission rate of said source. The invention further relates to a system suitable for implementing the method.

公开(公告)号：EP1188044B1

公开(公告)日：2012-07-04

申请号：EP00930899.0

申请日：2000-05-17

申请人： Metso Paper Automation OY

发明人： Peczkis, Marek Neles Automation (Toronto) ,  Munidasa, Mahendra Neles Automation (Toronto) ,  Wasqwski, Piotr Neles Automation (Toronto)

IPC分类号： G01N23/00

CPC分类号： G01N23/2206

摘要： The present invention is a method and apparatus for calculating the amount and composition of inorganic material in a sheet material. The apparatus of the present invention is capable of calculating the composition of all the additives at once without requiring multiple cycles. The apparatus uses a combination of two techniques, namely an X-ray fluorescence analysis and a preferential X-ray absorption analysis. X-ray fluorescence is measured by a thermoelectrically cooled solid state detector. The apparatus can measure more than three additives. Measurement of argon in the air is used for compensation of electronic drift. An empirical correction is used to compensate for mutual interaction between X-ray fluorescence radiation and clay or talc. The measurement is compensated for dust accumulation by means of fluorescing the dust.

公开(公告)号：EP2315009A1

公开(公告)日：2011-04-27

申请号：EP10188065.6

申请日：2010-10-19

申请人： PANalytical B.V.

发明人： Kharchenko, Alexander ,  van den Hoogenhof, Walter ,  Meier, Roger

IPC分类号： G01N23/20 ,  G01N23/207 ,  G01N23/22 ,  G01N23/223

CPC分类号： G01N23/20091 ,  G01N23/207 ,  G01N23/2206 ,  G01N23/223 ,  G01N2223/076

摘要： An instrument capable of both X-ray diffraction, XRD, and X-ray fluorescence measurements, XRF, arranges an X-ray source 10 creating an incident X-ray beam directed to a sample on a sample stage. An X-ray detection system is mounted at a fixed angle 2θ for high energy energy dispersive XRD For XRF, an X-ray detection system is used

摘要翻译： 能够进行X射线衍射，XRD和X射线荧光测量的仪器XRF布置X射线源10，产生指向样品台上的样品的入射X射线束。 X射线检测系统以固定角度2°安装，用于高能量能量色散XRD对于XRF，使用X射线检测系统

公开(公告)号：EP0597668A1

公开(公告)日：1994-05-18

申请号：EP93308932.8

申请日：1993-11-09

申请人： FISONS plc

发明人： Yellepeddi, Ravisekhar ,  Bapst, Alexandre ,  Negro, Pierre-Yves

IPC分类号： G01N23/22 ,  G01N23/207 ,  G01N23/223

CPC分类号： G01N23/2206 ,  G01N2223/056 ,  G01N2223/076 ,  G01N2223/1016

摘要： A device for performing both elemental and structural analysis of a crystalline sample, comprising a polychromatic x-ray source (11); a mounting means (15) for mounting the sample so that it is illuminated with x-rays; one or more fluorescence channels (17), able to select x-rays of a particular wavelength and energy and having means (20) for detecting said selected x-ray; a diffraction channel (28) able to select a characteristic x-ray wavelength at said source (11) following diffraction of the x-rays by said sample (14) and having means (33) for detecting a selected characteristic x-ray ; and an actuating means (32) for controlling arcuate movement of said diffraction channel (28) relative to said sample (14) so as to detect x-rays leaving the sample at different diffraction angles.

摘要翻译： 一种用于执行结晶样品的元素和结构分析的装置，包括多色X射线源（11）; 用于安装样品以使其被x射线照射的安装装置（15）; 一个或多个荧光通道（17），其能够选择特定波长和能量的x射线，并具有用于检测所述选择的X射线的装置（20）; 衍射通道（28），其能够在所述样品（14）的X射线衍射之后选择所述源极（11）处的特征x射线波长，并且具有用于检测所选择的特征x射线的装置（33） 以及用于控制所述衍射通道（28）相对于所述样品（14）的弓形运动的致动装置（32），以便检测离开所述样品的不同衍射角的x射线。

公开(公告)号：EP0227246B1

公开(公告)日：1993-02-17

申请号：EP86308153.5

申请日：1986-10-21

申请人： UNITED KINGDOM ATOMIC ENERGY AUTHORITY

发明人： Clayton, Colin Geoffrey

IPC分类号： G01N23/222 ,  G01N23/12 ,  G01N33/28

CPC分类号： G01N23/12 ,  G01N9/24 ,  G01N23/2206 ,  G01N23/222 ,  G01N2223/071 ,  G01N2223/0745 ,  G01N2223/3103 ,  G01N2223/3106 ,  G01N2223/616 ,  G01N2223/635 ,  G01P5/006 ,  G01P5/18

公开(公告)号：EP0202937B1

公开(公告)日：1991-08-07

申请号：EP86303888.1

申请日：1986-05-22

申请人： TEKSCAN LIMITED

发明人： McDonnell, Liam "Roisin Rubh" ,  Cashell, Eamonn M. "Copper Beeches"

IPC分类号： G01N23/225 ,  G01N23/227 ,  G01N23/22 ,  H01J49/48 ,  H01J49/06 ,  H01J37/252 ,  G01N25/72

CPC分类号： G01N23/2206 ,  G01N21/1702 ,  G01N25/72 ,  H01J37/252 ,  H01J49/06 ,  H01J49/482

公开(公告)号：EP0423803A2

公开(公告)日：1991-04-24

申请号：EP90120053.5

申请日：1990-10-19

申请人： SUMITOMO ELECTRIC INDUSTRIES, LTD. ,  TECHNOS CO., LTD.,

发明人： Ohsugi, Tetsuya, c/o Yokohama Works of ,  Kyoto, Michihisa, c/o Yokohama Works of ,  Nishihagi, Kazuo

IPC分类号： G01N23/223

CPC分类号： G01N23/2206

摘要： A total reflection X-ray fluorescence apparatus comprises a base material (6) having an optically flat surface for totally reflecting X-rays radiated at a small glancing angle, a first detector (13) such as an SSD for detecting fluorescent X-rays emerging from a specimen (7) located near the optically flat surface of the base material (6) and a second detector (11) such as a scintillation counter for detecting an intensity of an X-rays coming from the base material (6).

摘要翻译： 全反射X射线荧光装置包括具有光学平面的基体材料（6），用于全反射以小的扫视角度辐射的X射线;第一检测器（13），例如用于检测荧光X射线的SSD 从位于基材（6）的光学平坦表面附近的试样（7）和诸如用于检测来自基材（6）的X射线强度的闪烁计数器的第二检测器（11）。

公开(公告)号：EP0318012A3

公开(公告)日：1990-05-23

申请号：EP88119611.7

申请日：1988-11-24

申请人： HITACHI, LTD. ,  HORIBA, LTD.

发明人： Yamamoto, Naoki ,  Takano, Yukio ,  Hosokawa, Yoshinori ,  Yoshino, Kenji

IPC分类号： G01N23/207 ,  G01N23/223

CPC分类号： G01N23/2076 ,  G01N23/2206

摘要： The X-ray analyzer is arranged for conduction both an X-ray fluorescence analysis and X-ray diffraction comprises an X-­ray source (1), an X-ray guide tube (2) for collecting X-­ray emitted from said X-ray source (1), a sample table (4) disposed in the vicinity of an end of said X-ray guide tube (2) for placing a sample to be subjected to the application of the above described X-rays thereon, and an X-ray detect­or (6). Said sample table (4) and said X-ray detector (6) are disposed within the same one vacuum tank (5) and an in­side of said X-ray guide tube (2) is opened into said va­cuum tank (5). Preferably, the X-ray guide tube (2) compri­ses at least in the range of an X-ray beam outlet a para­boloid of revolution shape with an essentially cylinder type of an outlet end tube portion (23). With the X-ray analyzer according to the present invention, the X-ray beams are highly parallel to each other, so that is is easy to set the conditions for the total reflection of the beams incident upon the sample, whereby for example, the so-call­ed total reflection XS-ray fluorescence analysis becomes possible.

公开(公告)号：EP0202937A3

公开(公告)日：1988-01-07

申请号：EP86303888

申请日：1986-05-22

申请人： TEKSCAN LIMITED

发明人： McDonnell, Liam "Roisin Rubh" ,  Cashell, Eamonn M. "Copper Beeches"

IPC分类号： G01N23/225 ,  G01N23/227 ,  G01N23/22 ,  H01J49/48 ,  H01J49/06 ,  H01J37/252 ,  G01N25/72

CPC分类号： G01N23/2206 ,  G01N21/1702 ,  G01N25/72 ,  H01J37/252 ,  H01J49/06 ,  H01J49/482

摘要： In an apparatus for surface analysis microscopy, a number of analysis devices (5, 11) are mounted on an ultra-high vacuum chamber (1). The devices (5, 11) include a beam source for locally heating a selected region of a specimen and a temperature-detector for monitoring the heating of the selected region, as well as an electron gun (11) and an analyser (5) for detecting emission from a specimen region subjected to electron bombardment. An ion gun may also be provided. The apparatus enables thermal microscopy of a specimen to be carried out in conjunction with other surface analysis techniques including, inter alia, scanning electron microscopy and Auger electron microscopy, within a single apparatus and during a single experimental operation. A novel configuration of cylindrical mirror analyser facilitates mounting a multiplicity of analysis devices on the chamber in a compact manner for studying a specimen at a single position.

公开(公告)号：EP0227246A2

公开(公告)日：1987-07-01

申请号：EP86308153.5

申请日：1986-10-21

申请人： UNITED KINGDOM ATOMIC ENERGY AUTHORITY

发明人： Clayton, Colin Geoffrey

IPC分类号： G01N23/222 ,  G01N23/12 ,  G01N33/28

CPC分类号： G01N23/12 ,  G01N9/24 ,  G01N23/2206 ,  G01N23/222 ,  G01N2223/071 ,  G01N2223/0745 ,  G01N2223/3103 ,  G01N2223/3106 ,  G01N2223/616 ,  G01N2223/635 ,  G01P5/006 ,  G01P5/18

摘要： A method and apparatus are provided for analysing a fluid, especially an oil/water/gas mixture of unknown composition flowing in a pipeline (10). The apparatus can operate remotely, for example on the sea bed. A gamma-ray source (12) and a diametrically arranged scintillator (20) enable the density to be determined; while a fast neutron source (14) and a diametrically arranged germanium gamma spectrometer (22) cooled by a cryo-cooler (26) enable the concentrations of the elements present to be determined. The apparatus enables the weight fractions of oil, water and gas to be derived.