摘要:
Techniques for performing data tracing in an integrated circuit with multiple embedded memories are described. A trace module within the integrated circuit forms packets of trace data for memory accesses of the multiple memories. The trace module includes multiple data capture units (one for each memory) and a trace stream generator. Each data capture unit includes a register, a comparator, an address compressor, a data compressor, and a packetizer. The register stores an address for a prior memory access of the associated memory. The comparator compares an address for a current memory access against the address stored in the register. The address and data compressors perform address and data compression, respectively, for the current memory access. The packetizer forms a packet of trace data for the current memory access. The trace stream generator generates a stream containing trace data packets from all data capture units.
摘要:
A nonvolatile memory device (10) has a signature code generator (14, 15, 17) generating a present signature code (Q) from an algorithm modified dynamically as a function of predefined varying parameters. A variable parameter may be the address (A) of a memory cell being addressed; in this case the output of the code generator (Q) is a function of data (D) read from the cell array (24), the previously calculated signature code (Q) and the address of the read data. The data are read in sequence, using an internal clock (CK) generated by an internal clock oscillator (11). In test mode, the memory is scanned sequentially, beginning from any memory location, selected randomly, and the signature code (Q) varies in dynamic way; at the end of memory scanning, the signature code (Q) is compared to an expected result.
摘要:
Techniques for performing data tracing in an integrated circuit with multiple embedded memories are described. A trace module within the integrated circuit forms packets of trace data for memory accesses of the multiple memories. The trace module includes multiple data capture units (one for each memory) and a trace stream generator. Each data capture unit includes a register, a comparator, an address compressor, a data compressor, and a packetizer. The register stores an address for a prior memory access of the associated memory. The comparator compares an address for a current memory access against the address stored in the register. The address and data compressors perform address and data compression, respectively, for the current memory access. The packetizer forms a packet of trace data for the current memory access. The trace stream generator generates a stream containing trace data packets from all data capture units.
摘要:
The invention relates to a method for testing a data memory with an integrated test data compression circuit (16). Said data memory (1) comprises a memory cell field (10) having a plurality of addressable memory cells, a write/read amplifier (12) for writing and reading data into the memory cells by means of an internal data bus (12) of the data memory (1), and a test data compression circuit (16). Test data sequences which are respectively successively read out of the memory cell field (10) are compressed with stored reference test data sequences in order to respectively produce a display date which indicates whether at least one data error has occurred in the test data sequence which has been read out.
摘要:
Described herein is a method for compressing a sequence of repetitive data, which uses in combination one or more words with a format for non-compressible data and one or more words with a format for compressible data, in which a word with a format for non-compressible data is made up of a set of bits, in which the most significant bit is set at the logic value "1" and the remaining bits are the bits of a non-compressible datum to be encoded, whilst a word with a format for compressible data is made up of a set of bits, in which the most significant bit is set at a the logic value "0", the next five most significant bits indicate the total number of subsequent words which encode the sequence of repetitive data, and the remaining eleven bits indicate the number of times that the words indicated by the preceding five most significant bits are repeated.
摘要:
The invention relates to a method for testing a data memory with an integrated test data compression circuit (16). Said data memory (1) comprises a memory cell field (10) having a plurality of addressable memory cells, a write/read amplifier (12) for writing and reading data into the memory cells by means of an internal data bus (12) of the data memory (1), and a test data compression circuit (16). Test data sequences which are respectively successively read out of the memory cell field (10) are compressed with stored reference test data sequences in order to respectively produce a display date which indicates whether at least one data error has occurred in the test data sequence which has been read out.
摘要:
A nonvolatile memory device (10) has a signature code generator (14, 15, 17) generating a present signature code (Q) from an algorithm modified dynamically as a function of predefined varying parameters. A variable parameter may be the address (A) of a memory cell being addressed; in this case the output of the code generator (Q) is a function of data (D) read from the cell array (24), the previously calculated signature code (Q) and the address of the read data. The data are read in sequence, using an internal clock (CK) generated by an internal clock oscillator (11). In test mode, the memory is scanned sequentially, beginning from any memory location, selected randomly, and the signature code (Q) varies in dynamic way; at the end of memory scanning, the signature code (Q) is compared to an expected result.