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    Spectrometer using concave holographic diffraction grating
    72.
    发明公开
    Spectrometer using concave holographic diffraction grating 失效
    Spektralphotometer mit Verwendung eines konkaven holographischen Beugungsgitters。

    公开(公告)号：EP0322654A2

    公开(公告)日：1989-07-05

    申请号：EP88120935.7

    申请日：1988-12-14

    Applicant: Hewlett-Packard Company

    Inventor： Sullivan, James J.

    IPC: G01J3/18 ,  G01J3/36

    CPC classification number: G01J3/32 ,  G01J3/02 ,  G01J3/0237 ,  G01J3/04 ,  G01J3/1838 ,  G01J3/2803

    Abstract: A spectrometer includes a source of light (12), a slit member (18) along the path of the light emitted from the source, a holographic, concave grating (24) in the path of the light passing through the slit member, and a photodetector (28) in the path of the diffracted light reflected from the grating. The photodetector (28) is positioned sub­stantially along the portion of the primary horizontal focal curve of the grating where it is intersected three times by a vertical focal curve of the grating. The three intersections are on the same side of the normal vector to the grating and two of the intersecting points being the positions of the laser used to form the grating.

    Abstract translation: 光谱仪包括光源（12），沿着从源发射的光的路径的狭缝构件（18），穿过狭缝构件的光的路径中的全息凹面光栅（24），以及 在从光栅反射的衍射光的路径中的光电检测器（28）。 光电检测器（28）基本上沿着光栅的主水平焦点曲线的部分定位，其中光栅与光栅的垂直焦点曲线相交三次。 三个交点位于与光栅的法向量相同的一侧，两个相交点是用于形成光栅的激光的位置。

    SPECTROMETER, AND SPECTROMETER PRODUCTION METHOD
    76.
    发明公开
    SPECTROMETER, AND SPECTROMETER PRODUCTION METHOD 审中-公开

    公开(公告)号：EP3351912A1

    公开(公告)日：2018-07-25

    申请号：EP18159898.8

    申请日：2015-02-03

    Applicant: Hamamatsu Photonics K.K.

    Inventor： Yokino, Takafumi ,  Shibayama, Katsumi

    IPC: G01J3/02 ,  G01J3/18 ,  G01J3/36 ,  G01J3/04

    CPC classification number: G01J3/0256 ,  G01J3/021 ,  G01J3/0286 ,  G01J3/0289 ,  G01J3/0291 ,  G01J3/04 ,  G01J3/18 ,  G01J3/36

    Abstract: A spectrometer comprises a light detection element provided with a light passing part (21) and a light detection part (22); a support (30) fixed to the light detection element such that a space (S) is formed between the light passing part and the support; a first reflection part (11) provided in the support and configured to reflect light passing through the light passing part in the space; a dispersive part (42) provided in the light detection element and configured to disperse and reflect the light reflected by the first reflection part in the space; and a second reflection part (41) provided in the support and configured to reflect the light dispersed and reflected by the dispersive part to the light detection part in the space.

    SPECTROMETER, AND SPECTROMETER PRODUCTION METHOD
    77.
    发明公开
    SPECTROMETER, AND SPECTROMETER PRODUCTION METHOD 审中-公开
    SPEKTROMETER UND SPEKTROMETERHERSTELLUNGSVERFAHREN

    公开(公告)号：EP3104144A4

    公开(公告)日：2017-09-27

    申请号：EP15745768

    申请日：2015-02-03

    Applicant: HAMAMATSU PHOTONICS KK

    Inventor： YOKINO TAKAFUMI ,  SHIBAYAMA KATSUMI

    IPC: G01J3/02 ,  G01J3/04 ,  G01J3/18 ,  G01J3/36

    CPC classification number: G01J3/0256 ,  G01J3/021 ,  G01J3/0286 ,  G01J3/0289 ,  G01J3/0291 ,  G01J3/04 ,  G01J3/18 ,  G01J3/36

    Abstract: A spectrometer 1A includes a light detection element 20 provided with a light passing part 21, a first light detection part 22, and a second light detection part 26, a support 30 fixed to the light detection element 20 such that a space S is formed, a first reflection part 11 provided in the support 30 and configured to reflect light L1 passing through the light passing part 21 in the space S, a second reflection part 12A provided in the light detection element 20 and configured to reflect the light L1 reflected by the first reflection part 11 in the space S, and a dispersive part 40A provided in the support 30 and configured to disperse and reflect the light L1 reflected by the second reflection part 12A to the first light detection part 22 in the space S. A plurality of second light detection parts 26 is disposed in a region surrounding the second reflection part 12A.

    Abstract translation: 光谱仪1A具备：具备光通过部21，第1光检测部22和第2光检测部26的光检测元件20，以形成空间S的方式固定在光检测元件20上的支撑体30， 第一反射部分11，其设置在支撑件30中并且被配置为将穿过光通过部分21的光L1反射到空间S中;第二反射部分12A，其被设置在光检测元件20中并且被配置为反射由 第一反射部11以及空间S中设置的分散部40A，该分散部40A被配置为将由第二反射部12A反射的光L1分散并反射至空间S中的第一光检测部22。 第二光检测部件26设置在围绕第二反射部件12A的区域中。

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