中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

59 records (took 0.01 seconds)

    LIGHT SOURCE APPARATUS AND MEASUREMENT METHOD
    2.
    发明公开
    LIGHT SOURCE APPARATUS AND MEASUREMENT METHOD 失效
    LICHTQUELLE UND MESSMETHODE

    公开(公告)号：EP0867697A1

    公开(公告)日：1998-09-30

    申请号：EP96935502.3

    申请日：1996-10-30

    Applicant: Kyoto Dai-ichi Kagaku Co., Ltd.

    Inventor： XU, Kexin Kyoto Daiichi Kagaku Co., Ltd. ,  FUKADA, Keiichi Kyoto Daiichi Kagaku Co., Ltd.

    IPC: G01J3/10

    CPC classification number: G01J3/10 ,  G01J2003/1828

    Abstract: An acousto-optic tunable filter 4 including: an acousto-optic crystal 41; an acoustic wave driver 42; and a piezoelectric transducer 43, is provided in front of a light source section 2 including a plurality of light sources 2A, 2B, ... 2N having different wavelength characteristics. The frequency of RF generated by the acoustic wave driver 42 is varied in accordance with a desired wavelength. Thus, the light having the desired wavelength is incident on a converging lens 5 as plus and minus first-order light beams, and the light having wavelengths other than the desired wavelength is incident on a converging lens 5 as a zero-order light beam. The converging lens 5 converges the plus and minus first-order light beams and the zero-order light beams at positions different from each other. A selector 6 having openings located at the positions onto which the plus and first-order light beams are converged is provided in front of the converging lens 5. Therefore, only the light having the desired wavelength can pass through the selector 6 and is emitted from the light source apparatus 1.

    Abstract translation: 声光可调滤波器4，包括：声光晶体41; 声波驱动器42; 和压电换能器43设置在包括具有不同波长特性的多个光源2A，2B，... 2N的光源部分2的前面。 由声波驱动器42产生的RF的频率根据期望的波长而变化。 因此，具有期望波长的光作为正，负一级光束入射在会聚透镜5上，并且具有除期望波长以外的波长的光作为零级光束入射在会聚透镜5上。 会聚透镜5将正，负一级光束和零级光束会聚在彼此不同的位置。 在会聚透镜5的前面设置有具有位于正和一级光束会聚的位置的开口的选择器6，因此只有具有期望波长的光才能通过选择器6并从 光源装置1.

    An optical system providing concurrent detection of a calibration signal and a test signal in an optical spectrum analyzer
    8.
    发明公开
    An optical system providing concurrent detection of a calibration signal and a test signal in an optical spectrum analyzer 审中-公开
    光学系统与校准信号的同时检测和在光谱分析仪的测试信号

    公开(公告)号：EP1130445A3

    公开(公告)日：2002-09-04

    申请号：EP01301318.0

    申请日：2001-02-15

    Applicant: Tektronix, Inc.

    Inventor： Anderson, Duwayne R.

    IPC: G02B26/02 ,  G01J3/18

    CPC classification number: G01J3/1804 ,  G01J3/02 ,  G01J3/0218 ,  G01J3/0243 ,  G01J3/0294 ,  G01J2003/1828 ,  G01J2003/2866 ,  G02B6/3534 ,  G02B6/3568 ,  G02B6/3586

    Abstract: An optical system having a first order spectral range that is usable in an optical spectrum analyzer receives an broadband optical test signal and a optical calibration signal and couples the optical signals via two optically isolated paths to separate optical detectors. First and second pairs of optical fibers, with each pair having an input fiber and an output fiber, are positioned in a focal plane of a collimating optic that has an optical axis. The fiber pairs are symmetrically positioned on either side of the optical axis with the input fibers positioned on one side of the optical axis and the output fibers positioned on the opposite side of the optical axis. The input fibers receive the optical test signal and the optical calibration signal. The output optical fibers are coupled to first and second optical detectors. An optical calibration source generates second order or greater spectral lines that fall within the first order spectral range of the optical system. A diffraction grating receives the optical test signal and the optical calibration signal from the collimating optic and separates the first order spectral components of the broadband optical test signal and passes the second order or greater spectral lines of the optical calibration signal. The first optical detector that is responsive to the first order spectral components of the optical test signal receives the optical test signal from the collimating optic and converts the optical test signal to an electrical signal. A second optical detector that is responsive to the second order or greater spectral lines of the optical calibration signal concurrently receives the optical calibration signal from the collimating optic and converts the calibrations signal to an electrical signal.

Patent Agency Ranking