DECORATIVE MATERIAL
    83.
    发明公开
    DECORATIVE MATERIAL 审中-公开

    公开(公告)号:EP3536497A1

    公开(公告)日:2019-09-11

    申请号:EP17868225.8

    申请日:2017-11-02

    Abstract: Provided is a decorative material having excellent designability and scratch resistance. Of first and second gloss-adjusting layers (5, 6), one with lower gloss contains a matting agent having an average particle diameter of 6.0 µm or more and 15.0 µm or less. That is, the average particle diameter of the matting agent in the gloss-adjusting layer with lower gloss, i.e., the gloss-adjusting layer whose scratch resistance is likely to be low, is set within an optimal range in which the gloss-adjusting layer has excellent scratch resistance and designability. In this manner, the scratch resistance and designability of the entire decorative material (1) can be improved. Thus, a decorative material (1) having excellent scratch resistance and designability can be provided.

    ORGANIC THIN FILM TRANSISTOR, METHOD FOR MANUFACTURING SAME AND IMAGE DISPLAY DEVICE

    公开(公告)号:EP3506337A1

    公开(公告)日:2019-07-03

    申请号:EP17843585.5

    申请日:2017-08-22

    Abstract: Provided are an organic thin-film transistor produced by a printing method with high yield without causing a short circuit failure especially between the gate electrode and the capacitor electrode, ensuring a sufficient capacitor electrode area, and an image display device. The organic thin-film transistor includes: on an insulating substrate, at least a gate electrode; a capacitor electrode; an insulating layer of at least two or more layers; and a source electrode, a drain electrode, and a semiconductor layer containing an organic semiconductor material, which are formed on the insulating layer, wherein: a first insulating layer is formed to cover at least the capacitor electrode; the gate electrode is formed on the first insulating layer; and a second insulating layer is formed to cover the gate electrode.

    PUNCTURE IMPLEMENT FOR MICRONEEDLE
    88.
    发明公开

    公开(公告)号:EP3485934A1

    公开(公告)日:2019-05-22

    申请号:EP17827740.6

    申请日:2017-07-14

    Inventor: SUMIDA, Tomoya

    Abstract: A microneedle puncture instrument includes a pinch section (11) including a first pinch element (11a) and a second pinch element (11b) arrayed in an array direction (Da) and configured to individually pinch the skin in a pinch direction (Dh), which intersects with the array direction (Da), the first pinch element (11a) and the second pinch element (11b) being connected to each other with a distance (Dist) therebetween maintained within a predetermined range; and a puncture section (12) configured to puncture the skin while pinching the skin in the pinch direction (Dh) at a position between the first pinch element (11a) and the second pinch element (11b) in the array direction (Da), the puncture section (12) including a microneedle (12a) for puncturing the skin and a support portion (12b) that supports the microneedle (12a).

Patent Agency Ranking