摘要:
A system and a method for operating a non-volatile memory (NVM) device including a micro-controller adapted to control peripheral circuitry associated with an NVM array. The method includes providing at least one operation command to the micro-controller of the NVM device and applying operating signals to peripheral circuitry of the NVM device to operate the NVM array based on at least one operation command. The system includes: a NVM device (20) with a NVM array (28) adapted to store data and commands, peripheral circuitry (P 1 ...P n ) adapted to operate the NVM array and a micro-controller (24) adapted to control the peripheral circuitry; and an external device to provide at least one command to the micro-controller of the NVM device.
摘要:
A non-volatile memory device includes a plurality of word line areas each separated from its neighbor by a contact area, an oxide-nitride-oxide (ONO) layer within the word line areas and at least partially within the contact areas and protective elements generated when spacers are formed in the periphery area, to protect silicon under the ONO layer in the contact areas A non-volatile memory device includes a plurality of word line areas each separated from is neighbor by a contact area and bit line oxides whose height is at least a quarter of the distance between neighboring bit line oxides.
摘要:
A method includes changing a read reference level for reading a group of memory cells as a function of changes in a threshold voltage distribution of a different group of memory cells. The changing step includes determining a history read reference level of a group of history cells associated with a group of memory cells of a non-volatile memory cell array, allowing correct reading of the group of history cells, selecting a memory read reference level according to the first read reference level, and reading the non-volatile memory array cells.
摘要:
A method includes determining groups of rows to erase together in order to minimize the margin loss associated with bake after a large number of program and erasure cycles. The method alternatively includes determining groups of rows to erase together to minimize the width of a resultant erase threshold voltage distribution, erasing the groups together, stopping erasure of a group when the group is erase verified and performing the step of erasing on those groups which were not previously erase verified.
摘要:
A method for embedding non-volatile memories with logic circuitry, without changing performance of both the logic circuitry and the NVM elements (and/or without changing a sequence of manufacturing steps for both the logic circuitry and the NVM elements). The embedding process includes insertion of NVM device and anay process steps into an existing logic CMOS process in a way that maintains the CMOS performance, thereby enabling use of existing circuit libraries. The NVM may thus be combined with the high-speed low-voltage CMOS without any performance or reliability penalty.
摘要:
A capacitor including a first active layer capacitively coupled to a second active layer, the second active layer being capacitively coupled to a third layer, the third layer being capacitively coupled to a fourth layer, wherein an anode of the capacitor is connected to one of the first and second active layers, and a cathode of the capacitor is connected to the other one of the first and second active layers, and wherein the third layer is left floating. The fourth layer may be connected to a supply voltage, such as but not limited to, ground.
摘要:
A method for erasing memory cells in a memory array, the method including applying an erase pulse to bits of a cell ensemble of a memory cell array, and performing an erase verification operation only on a subgroup of the cell ensemble being erased to check if the memory cells threshold voltage (Vt) has been lowered to an erase verify (EV) voltage level.
摘要:
The present invention is a method, circuit and system for determining a reference voltage. Some embodiments of the present invention relate to a system, method and circuit for establishing a set of operating reference cells to be used in operating (e.g. reading) cells in an NVM block or array. As part of the present invention, at least a subset of cells of the NVM block or array may be read using each of two or more sets of test reference cells, where each set of test reference cells may generate or otherwise provide reference voltages at least slightly offset from each other set of test reference cells. For each set of test reference cells used to read the at least a subset of the NVM block, a read error rate may be calculated or otherwise determined. A set of test reference cells associated with a relatively low read error rate may be selected as the set of operating reference cells to be used in operating (e.g. reading) other cells, outside the subset of cells, in the NVM block or array. In a further embodiment, the selected set of test reference cells may be used to establish an operating set of reference cells having reference voltages substantially equal to those of the selected test set.
摘要:
A method for operating an electrically erasable programmable read only memory (EEPROM) array includes providing an array including a multiplicity of memory cells, wherein each memory cell is connected to a word line and to two bit lines, selecting one of the memory cells, and erasing a bit of the selected memory cell while applying an inhibit word line voltage to a gate of an unselected memory cell. An EEPROM array is also described, the array including a multiplicity of NROM memory cells, wherein each memory cell is connected to a word line and to two bit lines, and wherein each NROM cell is individually erasable and individually programmable without significantly disturbing unselected cells.
摘要:
A nitride programmable read only memory (NROM) cell with a pocket implant (120) self-aligned to at least one bit line junction (102, 104). Alternatively, the bit line junction(s) (102, 104) can have a thin area of effective programming and erasing located nearby. Further alternatively, the channel (100) can have a threshold voltage level implant which has a low voltage level in a central area of the channel (100) and which has a peak of high voltage level near at least one of the bit line junctions (102, 104). With one pocket implant, the NROM cell stores one bit. With two pocket implants, the NROM cell stores two bits.