摘要:
A power module comprises: a baseplate (L0) comprising aluminum silicon carbide; a power substrate (L3) on the baseplate, the power substrate comprising silicon nitride; and a switch module (SM1 -SM10) mounted on the power substrate, the switch module comprising a silicon carbide transistor (Q1-Q10). The power module has a power density of up to 500 watts/cm 2 .
摘要:
A semiconductor device (10) comprises a drift layer (22) having a first surface with an active region (14) and a plurality of junction barrier element recesses (40), the drift layer being doped with a doping material of a first conductivity type and associated with an edge termination region (16) that is substantially laterally adjacent the active region. A Schottky layer (24) is over the active region of the first surface to form a Schottky junction. A plurality of first doped regions (30) extend into the drift layer about corresponding ones of the plurality of junction barrier element recesses (40) wherein the plurality of first doped regions are doped with a doping material of a second conductivity type, which is opposite the first conductivity type, and form an array of junction barrier elements in the drift layer below the Schottky junction. A well (34) ia formed in the drift layer in the edge termination region, the well having guard rings (36) and being doped with the doping material of the second conductivity type where the plurality of guard rings are formed in the well, wherein the guard rings are coplanar with the junction barrier element recesses.
摘要:
The present disclosure relates to a power module that has a housing with an interior chamber and a plurality of switch modules interconnected to facilitate switching power to a load. Each of the plurality of switch modules comprises at least one transistor and at least one diode mounted within the interior chamber and both the at least one transistor and the at least one diode are majority carrier devices, are formed of a wide bandgap material system, or both. The switching modules may be arranged in virtually any fashion depending on the application. For example, the switching modules may be arranged in a six-pack, full H-bridge, half H-bridge, single switch or the like.
摘要:
A semiconductor device (10) comprises a drift layer (22) having a first surface with an active region (14) and a plurality of junction barrier element recesses (40), the drift layer being doped with a doping material of a first conductivity type and associated with an edge termination region (16) that is substantially laterally adjacent the active region. A Schottky layer (24) is over the active region of the first surface to form a Schottky junction. A plurality of first doped regions (30) extend into the drift layer about corresponding ones of the plurality of junction barrier element recesses (40) wherein the plurality of first doped regions are doped with a doping material of a second conductivity type, which is opposite the first conductivity type, and form an array of junction barrier elements in the drift layer below the Schottky junction. A well (34) ia formed in the drift layer in the edge termination region, the well having guard rings (36) and being doped with the doping material of the second conductivity type where the plurality of guard rings are formed in the well, wherein the guard rings are coplanar with the junction barrier element recesses.
摘要:
Embodiments of a semiconductor device having increased channel mobility and methods of manufacturing thereof are disclosed. In one embodiment, the semiconductor device includes a substrate including a channel region and a gate stack on the substrate over the channel region. The gate stack includes an alkaline earth metal. In one embodiment, the alkaline earth metal is Barium (Ba). In another embodiment, the alkaline earth metal is Strontium (Sr). The alkaline earth metal results in a substantial improvement of the channel mobility of the semiconductor device.
摘要:
A high electron mobility transistor (HEMT) (10) is disclosed that includes a semi-insulating silicon carbide substrate (11), an aluminum nitride buffer layer (12) on the substrate, an insulating gallium nitride layer (13) on the buffer layer, an active structure of aluminum gallium nitride (14) on the gallium nitride layer, a passivation layer (23) on the aluminum gallium nitride active structure, and respective source, drain and gate contacts (21, 22, 23) to the aluminum gallium nitride active structure.
摘要:
Embodiments of a semiconductor device having increased channel mobility and methods of manufacturing thereof are disclosed. In one embodiment, the semiconductor device includes a substrate including a channel region and a gate stack on the substrate over the channel region. The gate stack includes an alkaline earth metal. In one embodiment, the alkaline earth metal is Barium (Ba). In another embodiment, the alkaline earth metal is Strontium (Sr). The alkaline earth metal results in a substantial improvement of the channel mobility of the semiconductor device.
摘要:
Elements of an edge termination structure, such as multiple concentric guard rings, are effectively doped regions in a drift layer. To increase the depth of these doped regions, individual recesses may be formed in a surface of the drift layer where the elements of the edge termination structure are to be formed. Once the recesses are formed in the drift layer, these areas about and at the bottom of the recesses are doped to form the respective edge termination elements.
摘要:
The present disclosure generally relates to a Schottky diode that has a substrate, a drift layer provided over the substrate, and a Schottky layer provided over an active region of the substrate. A junction barrier array is provided in the drift layer just below the Schottky layer. The elements of the junction barrier array are generally doped regions in the drift layer. To increase the depth of these doped regions, individual recesses may be formed in the surface of the drift layer where the elements of the junction barrier array are to be formed. Once the recesses are formed in the drift layer, areas about and at the bottom of the recesses are doped to form the respective elements of the junction barrier array.