APPARATUS FOR CRYSTAL GROWTH
    1.
    发明公开
    APPARATUS FOR CRYSTAL GROWTH 有权
    DEVICE晶体生长

    公开(公告)号:EP2152943A1

    公开(公告)日:2010-02-17

    申请号:EP08750643.2

    申请日:2008-05-16

    IPC分类号: C30B23/06 C30B29/48

    摘要: Apparatus for vapour phase growing of crystals having a single multi-zone heater arranged to heat a heated zone to give a predetermined temperature profile along the length of the heated zone. A generally U-shaped tube having a first limb, a second limb, and a linkage connecting the first alid second limbs is located on the heated zone. The first limb contains a source material. The second limb supports a seed such that the source material and seed are spaced longitudinally within the heated zone to provide a predetermined temperature differential between the source and seed. The crystal is grown on the seed.

    SEMICONDUCTOR DEVICE STRUCTURE AND METHOD OF MANUFACTURE THEREOF
    3.
    发明公开
    SEMICONDUCTOR DEVICE STRUCTURE AND METHOD OF MANUFACTURE THEREOF 有权
    半导体元件结构和工艺及其

    公开(公告)号:EP2162924A2

    公开(公告)日:2010-03-17

    申请号:EP08762623.0

    申请日:2008-06-30

    摘要: A semiconductor device structure comprising a first bulk crystal semiconductor material and a second bulk crystal semiconductor material provided on a surface of the first bulk crystal semiconductor material with or without a deliberate intermediate region, the second bulk crystal semiconductor material being a Group II-VI material dissimilar to the first bulk crystal semiconductor material, wherein portions of the first and/or second bulk crystal semiconductor material have been selectively removed to produce a patterned area of reduced thickness of the first and/or second bulk crystal semiconductor and preferably to expose a patterned area of the said surface of the first and/or second bulk crystal semiconductor material.

    INSPECTION OF MATERIALS BY EVALUATING THE CONTRIBUTION OF BRAGG SCATTERING TO ENERGY DESPERSIVE X-RAY ATTENUATION
    4.
    发明公开
    INSPECTION OF MATERIALS BY EVALUATING THE CONTRIBUTION OF BRAGG SCATTERING TO ENERGY DESPERSIVE X-RAY ATTENUATION 有权
    材料检查BY评价布拉格泄漏AT能量分散型X射线的贡献

    公开(公告)号:EP2147297A2

    公开(公告)日:2010-01-27

    申请号:EP08750755.4

    申请日:2008-05-19

    摘要: A method of and apparatus for obtaining radiation transmission data and especially an image of an object which involves providing a radiation source such as an x-ray or gamma-ray source and a radiation detector system such as an x-ray or gamma-ray detection system spaced therefrom to define a scanning zone therebetween, the detector system being capable of detecting and collecting spectroscopically resolvable information about incident radiation; collecting a dataset of information about radiationincident at the detector and hence transmissivity of an object in the scanning zone at at least one and preferably a plurality of scanning positions from radiation transmitted through the object and received at the detector system; resolving each such dataset spectroscopically across a plurality of frequency bands within the spectrum of the source; wherein at least one of the said plurality of frequency bands corresponds to a characteristically scattered wavelength of a target species to be identified, andwherein the absence of or substantial reduction in a transmitted signal intensity at the frequency band is interpreted as the presence of the said target species. The resolved data is preferably resolved as one or more images.