摘要:
The invention relates to a nonlinear optical microscope using a Bessel laser beam so as to image a sample with good lateral resolution and extended field depth. This microscope incorporates a slide scanner. The sample is disposed on a slide, which is loaded automatically onto a motorized platen, so that the laser beam can sweep the entire slide. The useful signals originating from the sample are combined with the conventional image of the slide scanner so as to obtain a global image which clearly reveals, with good resolution, elements of interest.
摘要:
The invention relates to a method for acquiring signals in laser scanning microscopy, including the steps of: moving a focused optical excitation beam relative to an object to be measured so that the focus point of the beam follows a predetermined path in the space of said object; and acquiring optical measurement signals along said path according to at least one acquisition parameter; characterised in that the path of the excitation beam is determined so as to substantially minimise the variations of the optical properties of at least one portion of the environments crossed by said excitation beam between consecutive acquisitions, and in that at least one acquisition parameter among said acquisition parameters is modulated during the movement of the excitation beam. The invention also relates to a device for implementing said method.
摘要:
The invention relates to a method for the dimensional characterization of a structured material, in which method : an excitation laser beam suitable for coherent nonlinear microscopy is generated, this excitation laser beam being focused in a focal volume within the structured material; signals emitted by the structured material are detected; a plurality of emission patterns, each corresponding to one particular shape of the focal volume, is produced, the particular shapes being obtained for various non-Gaussian spatial profiles of the excitation laser beam wavefront; and on the basis of the emission patterns thus produced, dimensional characteristics of said structured material are deduced therefrom.