公开(公告)号：EP2304488B1

公开(公告)日：2013-11-27

申请号：EP09769543.1

申请日：2009-06-26

申请人： Ecole Polytechnique

发明人： BEAUREPAIRE, Emmanuel, Jean-Marc ,  OLIVIER, Nicolas ,  DEBARRE, Delphine ,  SCHANNE-KLEIN, Marie-Claire ,  MARTIN, Jean Louis

IPC分类号： G02B21/24 ,  G02B26/04 ,  G02B26/06 ,  G01N21/63 ,  G01N21/17 ,  G01N21/65

CPC分类号： G01N21/636 ,  G01N2021/1785 ,  G01N2021/653 ,  G01N2021/655 ,  G01N2021/656

公开(公告)号：EP2394194A1

公开(公告)日：2011-12-14

申请号：EP10708273.7

申请日：2010-02-03

申请人： Ecole Polytechnique

发明人： BEAUREPAIRE, Emmanuel, Jean-Marc ,  VEILLEUX, Israël ,  OLIVIER, Nicolas ,  DEBARRE, Delphine, Malvina, Danièle, Marie ,  MARTIN, Jean Louis

IPC分类号： G02B21/00 ,  G01B11/25

CPC分类号： G02B21/002 ,  G02B21/0048

摘要： The invention relates to a method for acquiring signals in laser scanning microscopy, including the steps of: moving a focused optical excitation beam relative to an object to be measured so that the focus point of the beam follows a predetermined path in the space of said object; and acquiring optical measurement signals along said path according to at least one acquisition parameter; characterised in that the path of the excitation beam is determined so as to substantially minimise the variations of the optical properties of at least one portion of the environments crossed by said excitation beam between consecutive acquisitions, and in that at least one acquisition parameter among said acquisition parameters is modulated during the movement of the excitation beam. The invention also relates to a device for implementing said method.

公开(公告)号：EP2810050A1

公开(公告)日：2014-12-10

申请号：EP13705115.7

申请日：2013-02-01

申请人： Ecole Polytechnique ,  Centre National de la Recherche Scientifique

发明人： MAHOU, Pierre ,  BEAUREPAIRE, Emmanuel, Jean-Marc ,  DEBARRE, Delphine ,  SUPATTO, Willy ,  MARTIN, Jean Louis

IPC分类号： G01N21/64 ,  G02B21/00

CPC分类号： G01N21/6456 ,  G01N21/3151 ,  G01N21/6402 ,  G01N21/6458 ,  G01N2021/6419 ,  G01N2201/06113 ,  G01N2201/0668 ,  G01N2201/0697 ,  G02B17/023 ,  G02B21/16

摘要： The present invention concerns a multicolour excitation module 1 for a multiphoton imaging system 100. Such a module is used for imaging a sample 7 comprising at least three chromophores. The module 1 comprises: a first femtosecond laser source 2, emitting a first excitation beam 20; a second femtosecond laser source 3 emitting a second excitation beam 30. The first excitation beam 20 comprises a so-called "pumping" portion, said pumping portion acting as a pump beam to synchronously excite the second laser source 3, and a so-called "excitation" portion. An optical delay line 4 is arranged to spatially and temporally superpose the second excitation beam 30 and the excitation portion of the first excitation beam, so as to excite at least a third of the chromophores by multiphoton absorption, said absorbed photons coming from the first and second excitation beams 20, 30. The invention also concerns the complete multiphoton imaging system 100, and a method implemented in this module 1.

公开(公告)号：EP2795390A1

公开(公告)日：2014-10-29

申请号：EP12816697.2

申请日：2012-12-03

申请人： Ecole Polytechnique ,  Centre National de la Recherche Scientifique (CNRS)

发明人： SCHANNE-KLEIN, Marie-Claire ,  BEAUREPAIRE, Emmanuel, Jean-Marc ,  STRUPLER, Mathias ,  DEBARRE, Delphine ,  OLIVIER, Nicolas ,  MAHOU, Pierre

IPC分类号： G02B21/36 ,  G02B21/00

CPC分类号： G02B21/06 ,  G01N21/6486 ,  G01N21/65 ,  G01N33/4833 ,  G01N2021/653 ,  G01N2201/0697 ,  G02B21/0032 ,  G02B21/004 ,  G02B21/0076 ,  G02B21/26 ,  G02B21/365

摘要： The invention relates to a nonlinear optical microscope using a Bessel laser beam so as to image a sample with good lateral resolution and extended field depth. This microscope incorporates a slide scanner. The sample is disposed on a slide, which is loaded automatically onto a motorized platen, so that the laser beam can sweep the entire slide. The useful signals originating from the sample are combined with the conventional image of the slide scanner so as to obtain a global image which clearly reveals, with good resolution, elements of interest.

摘要翻译： 提供非线性光学显微镜，包括脉冲激光束源; 用于调制脉冲激光束的空间分布的空间光调制器; 用于将调制束引导到用于携带样本的载玻片的目的; 以及用于收集源自样本的信号的检测器，其中空间光调制器被设计成调制物镜的后瞳孔上的脉冲激光束的强度和/或相位，以产生轴向延伸并限制在其中的光束 在被物镜聚焦之后的一个或两个横向方向，并且其中滑块被放置在组织学幻灯片扫描器组件的机动台上。

公开(公告)号：EP2795390B1

公开(公告)日：2018-03-28

申请号：EP12816697.2

申请日：2012-12-03

申请人： Ecole Polytechnique ,  Centre National de la Recherche Scientifique (C.N.R.S.)

发明人： SCHANNE-KLEIN, Marie-Claire ,  BEAUREPAIRE, Emmanuel, Jean-Marc ,  STRUPLER, Mathias ,  DEBARRE, Delphine ,  OLIVIER, Nicolas ,  MAHOU, Pierre

IPC分类号： G01N33/483 ,  G02B21/06 ,  G01N21/64 ,  G01N21/65 ,  G02B21/26 ,  G02B21/00 ,  G02B21/36

CPC分类号： G02B21/06 ,  G01N21/6486 ,  G01N21/65 ,  G01N33/4833 ,  G01N2021/653 ,  G01N2201/0697 ,  G02B21/0032 ,  G02B21/004 ,  G02B21/0076 ,  G02B21/26 ,  G02B21/365

公开(公告)号：EP2394194B1

公开(公告)日：2016-08-03

申请号：EP10708273.7

申请日：2010-02-03

申请人： Ecole Polytechnique

发明人： BEAUREPAIRE, Emmanuel, Jean-Marc ,  VEILLEUX, Israël ,  OLIVIER, Nicolas ,  DEBARRE, Delphine, Malvina, Danièle, Marie ,  MARTIN, Jean Louis

IPC分类号： G02B21/00 ,  G01B11/25

CPC分类号： G02B21/002 ,  G02B21/0048

公开(公告)号：EP2304488A2

公开(公告)日：2011-04-06

申请号：EP09769543.1

申请日：2009-06-26

申请人： Ecole Polytechnique

发明人： BEAUREPAIRE, Emmanuel, Jean-Marc ,  OLIVIER, Nicolas ,  DEBARRE, Delphine ,  SCHANNE-KLEIN, Marie-Claire ,  MARTIN, Jean Louis

IPC分类号： G02B21/24 ,  G02B26/04 ,  G02B26/06

CPC分类号： G01N21/636 ,  G01N2021/1785 ,  G01N2021/653 ,  G01N2021/655 ,  G01N2021/656

摘要： The invention relates to a method for the dimensional characterization of a structured material, in which method : an excitation laser beam suitable for coherent nonlinear microscopy is generated, this excitation laser beam being focused in a focal volume within the structured material; signals emitted by the structured material are detected; a plurality of emission patterns, each corresponding to one particular shape of the focal volume, is produced, the particular shapes being obtained for various non-Gaussian spatial profiles of the excitation laser beam wavefront; and on the basis of the emission patterns thus produced, dimensional characteristics of said structured material are deduced therefrom.