公开(公告)号：EP2203734A1

公开(公告)日：2010-07-07

申请号：EP08807968.6

申请日：2008-10-13

申请人： Koninklijke Philips Electronics N.V.

发明人： SHAHZAD, Khalid ,  JANKOVIC, Ladislav

IPC分类号： G01N21/17 ,  G01N9/24 ,  A61B5/00 ,  A61B5/026 ,  A61B8/06 ,  A61B5/0265

CPC分类号： G01N21/1702 ,  A61B5/0059 ,  A61B5/0095 ,  A61B5/02007 ,  A61B2562/146 ,  G01N21/255 ,  G01N2021/1782 ,  G01N2021/1785 ,  G01N2201/0221 ,  G01N2201/0636 ,  G01N2201/0666 ,  G01N2291/02466 ,  G01N2291/02475 ,  G01N2291/106 ,  G02B6/4203 ,  G02B27/283

摘要： Apparatus, systems and methods are provided for production and integration of compact illumination schemes. More particularly, disclosed embodiments relate to apparatus/systems and methods for production of highly compact illumination schemes, whereby photoacoustic waves are induced in a target sample. Additionally, the disclosed apparatus/systems and methods are effective to produce compact and portable integrated transducer-illumination arrays. Apparatus disclosed generally include at least one lighting source and a beamsplitting assembly. Systems disclosed generally include one or more apparatus for the production of compact lighting schemes, an ultrasonic transducer assembly and means for coupling the one or more apparatus and US transducer assembly with a target sample.

公开(公告)号：EP0419517A1

公开(公告)日：1991-04-03

申请号：EP89906596.0

申请日：1989-05-24

申请人： ORASIS CORPORATION

发明人： DULMAN, Lev

IPC分类号： G01B11 ,  G01N21 ,  G06T1

CPC分类号： G01N21/95607 ,  G01N2021/1785

摘要： Un système de contrôle de qualité permet une comparaison de haute résolution à haute vitesse et en temps réel de la forme tridimensionnelle d'un échantillon (201) avec un étalon (203). Le système comprend un analyseur d'échantillons (103), un analyseur d'étalons (105), un comparateur (107), une unité de commande (101) et une mémoire de position (109). L'analyseur d'échantillons comprend un dispositif d'imagerie d'échantillons (111), un scanner d'échantillons (113) et un transducteur d'échantillons (115). L'analyseur d'étalons comprend un dispositif d'imagerie d'étalons (117), un scanner d'étalons (119) et un transducteur d'étalons (121).

公开(公告)号：EP0319797A3

公开(公告)日：1990-05-23

申请号：EP88119684.4

申请日：1988-11-25

申请人： MITSUI MINING & SMELTING CO., LTD.

发明人： Moriya, Kazuo

IPC分类号： G01N21/88 ,  G06T7/60

CPC分类号： G06T7/0004 ,  G01N21/9505 ,  G01N2021/1785 ,  G01N2021/4735 ,  G01N2021/8887 ,  G01N2201/102 ,  G01N2201/1087 ,  G06T2207/10056 ,  G06T2207/30148

摘要： A method and apparatus for measuring a defect distribution comprising introducing a narrowed laser beam into an object to be observed, receiving scattering lights generated at the defect portions of the object by a photoelectric conversion element, and measuring automatically the density and density distribution of the defects inside the object on the basis of the output image data of the photoelectric conversion element.

公开(公告)号：EP0266814A1

公开(公告)日：1988-05-11

申请号：EP87201919.5

申请日：1987-10-07

申请人： LABORATOIRES D'ELECTRONIQUE PHILIPS ,  Philips Electronics N.V.

发明人： Le Bris, Jean Société Civile S.P.I.D. ,  Erman, Marko Société Civile S.P.I.D.

IPC分类号： G01N21/21 ,  G01N21/03

CPC分类号： G01N21/211 ,  G01N21/03 ,  G01N2021/0339 ,  G01N2021/1785

摘要： Ellipsomètre spectroscopique comportant un dispositif d'éclairement présentant un point focal d'éclairement (Fʹ₂) d'une surface d'un échantillon (E) selon un angle d'incidence donné, et un dispositif d'analyse de la lumière réfléchie par la surface de l'échantillon.
Le porte-échantillon comporte trois platines de translation (20,30,40), selon trois directions respectivement (T₂, T₃, T₁).
Les translations selon les premières (T₁) et deuxième (T₂) directions permettent de réaliser des cartographies de l'échantillon (E), alors que la translation selon la troisième direction (T₃) permet de placer un point de la surface de l'échantillon (E) en coïncidence avec le point focal (Fʹ₂). Deux platines tournantes (PT₂, 12) autour d'axes respectivement ϑ₁ et ϑ₂ parallèles aux première (T₁) et deuxième (T₂) directions et se coupant audit point focal (Fʹ₂) permettent d'orienter l'échantillon (E) par rotation dans deux plans orthogonaux autour dudit point focal (Fʹ₂). Application à l'ellipsomètre résolue spatialement.

公开(公告)号：EP2976621A1

公开(公告)日：2016-01-27

申请号：EP14711520.8

申请日：2014-03-20

申请人： ETH Zürich ,  California Institute of Technology

发明人： PANTAZIS, Periklis ,  DEMPSEY, William P. ,  TRUONG, Thai V. ,  FRASER, Scott E. ,  GEORGIEVA, Lada

IPC分类号： G01N21/64 ,  G02B21/00 ,  G02B21/02 ,  G02B21/16 ,  G01J3/44

CPC分类号： G02B21/0076 ,  G01N21/6408 ,  G01N21/6428 ,  G01N21/6458 ,  G01N2021/1785 ,  G02B5/201 ,  G02B21/0032 ,  G02B27/141

摘要： The invention relates to a method and a system to achieve spatially (e.g. three-dimensionally) confined photomodulation at the focal volume (50) in a ample (55) mounted in a microscope system, comprising two or more laser light sources (41, 42) emitting light (32, 34) of different wavelengths adapted to excite a material in an identical number of independent excitation steps to a higher vibrational state from which the material relaxes, either emitting a conversion light to be detected (“photoexcitation”) or modulating the spectral properties of the material (“photomodulation”).

公开(公告)号：EP2697627A1

公开(公告)日：2014-02-19

申请号：EP12771262.8

申请日：2012-03-30

申请人： LI-COR, INC.

发明人： BOUZID, Ahmed

IPC分类号： G01N21/64

CPC分类号： G01N21/6456 ,  G01N2021/1785 ,  G02B21/16

摘要： Systems and methods for producing background-reduced fluorescence imaging signals include an illumination system that provides illumination light from an illumination source to a targeted area on the sample platform, a sensor adapted to detect light and having an array of sensing locations, and collection optics arranged and configured to project light emanating from the sample platform onto the sensor. In typical operation, light from the targeted area is projected onto a first portion of the sensor comprising a first plurality of the sensing locations and light from proximal to the targeted area on the platform is projected onto a second portion of the sensor comprising a second plurality of the sensing locations, and a second signal detected by the second portion of the sensor is subtracted from a first signal detected by the first portion of the sensor to produce a background-reduced signal, e.g., a signal with reduced background related noise.

公开(公告)号：EP2304488A2

公开(公告)日：2011-04-06

申请号：EP09769543.1

申请日：2009-06-26

申请人： Ecole Polytechnique

发明人： BEAUREPAIRE, Emmanuel, Jean-Marc ,  OLIVIER, Nicolas ,  DEBARRE, Delphine ,  SCHANNE-KLEIN, Marie-Claire ,  MARTIN, Jean Louis

IPC分类号： G02B21/24 ,  G02B26/04 ,  G02B26/06

CPC分类号： G01N21/636 ,  G01N2021/1785 ,  G01N2021/653 ,  G01N2021/655 ,  G01N2021/656

摘要： The invention relates to a method for the dimensional characterization of a structured material, in which method : an excitation laser beam suitable for coherent nonlinear microscopy is generated, this excitation laser beam being focused in a focal volume within the structured material; signals emitted by the structured material are detected; a plurality of emission patterns, each corresponding to one particular shape of the focal volume, is produced, the particular shapes being obtained for various non-Gaussian spatial profiles of the excitation laser beam wavefront; and on the basis of the emission patterns thus produced, dimensional characteristics of said structured material are deduced therefrom.

公开(公告)号：EP0387793B1

公开(公告)日：1998-01-07

申请号：EP90104729.0

申请日：1990-03-13

申请人： Krauss, Manfred, Prof., Dr.-Ing.habil.

发明人： Waldmann, Jürgen, Prof.Dr.sc.techn. ,  Krauss, Mannfred, Prof.Dr.-Ing.habil. ,  Bilz, Dietrich, Dr.sc.med. ,  Mende, Mattias, Dr.-Ing. ,  Kriegel, Bernd, Dipl.-Phys.

IPC分类号： A61B5/00 ,  G01N21/35

CPC分类号： G01N21/359 ,  A61B5/0059 ,  A61B5/0261 ,  A61B5/4064 ,  G01N2021/1785

公开(公告)号：EP0266814B1

公开(公告)日：1991-06-12

申请号：EP87201919.5

申请日：1987-10-07

申请人： LABORATOIRES D'ELECTRONIQUE PHILIPS ,  Philips Electronics N.V.

发明人： Le Bris, Jean Société Civile S.P.I.D. ,  Erman, Marko Société Civile S.P.I.D.

IPC分类号： G01N21/21 ,  G01N21/03

CPC分类号： G01N21/211 ,  G01N21/03 ,  G01N2021/0339 ,  G01N2021/1785

公开(公告)号：EP1180679B1

公开(公告)日：2012-10-10

申请号：EP00117522.3

申请日：2000-08-14

申请人： Evotec AG

发明人： Gall, Karsten ,  Kask, Peet ,  Klumpp, Martin

IPC分类号： G01N21/64

CPC分类号： G01N21/6456 ,  G01N21/6428 ,  G01N21/6445 ,  G01N2021/1782 ,  G01N2021/1785