摘要:
A composition of matter is provided that results in a change of electrical properties through intra-molecular charge transfer or inter-molecular charge transfer or charge transfer between a molecule (12) and an electrode (14, 16; 14', 16'), wherein the charge transfer is induced by an electric field.
摘要:
A composition of matter is provided that results in a change of electrical properties through intra-molecular charge transfer or inter-molecular charge transfer or charge transfer between a molecule (12) and an electrode (14, 16; 14', 16'), wherein the charge transfer is induced by an electric field.
摘要:
One embodiment of the present invention is a method for constructing defect-and-failure-tolerant demultiplexers (figures 14 an 16). This method is applicable to nanoscale, microscal, or larger-scale demultiplexer circuits,. Demultiplexer circuits can be viewed as a set of AND gates (figures 9A-B), each including a reversibly switchable interconnection between a number of address lines (910-912 and 920-922), or address-line-derived signal lines, and an output signal line (914 and 924). Each reversibly switchable interconnection includes one ot more reversibly switchable elements (906-908 and 916-918). In certain demultiplexer embodiments, NMOS (102) and/or PMOS transistors (206) are employed as reversibly switchable elements. In the method that representd one embodiment of the present invention, two or more serially connected transistors (410, 412, and 411, 413; 1502) are employed in each reversibly switchable interconnection, so that short defects in up to one less then the number of serially interconnected transistors does not lead to failure of the reversibly switchable interconnection. In addition, error-control-encoding techniques are used to introduce additional address-line-derived signal lines (1602, 1604) and additional switchable interconnections (1610) so that the demultiplexer may function even when a number of individual, switchable interconnections are open-defective.
摘要:
Various embodiments of the present invention are directed to electronic means for reading the content of a nanowire-crossbar memory. In one embodiment of the present invention, a microscale or sub-microscale signal line (402) is interconnected with one set of parallel nanowires (310-315) emanating from a nanowire-crossbar memory by configurable, nanowire-junction switches (404). The microscale or sub-microscale signal line (402) serves as a single-wire multiplexer, allowing the contents of any particular single-bit atorage element (316) within the nanowire-crossbar memory to be read.
摘要:
Various embodiments of the present invention are directed to electronic means for reading the content of a nanowire-crossbar memory. In one embodiment of the present invention, a microscale or sub-microscale signal line (402) is interconnected with one set of parallel nanowires (310-315) emanating from a nanowire-crossbar memory by configurable, nanowire-junction switches (404). The microscale or sub-microscale signal line (402) serves as a single-wire multiplexer, allowing the contents of any particular single-bit atorage element (316) within the nanowire-crossbar memory to be read.
摘要:
A control layer (26, 26', 28, 28', 28') for use in a junction of a nanoscale electronic switching device (10) is disclosed. The control layer (26, 26', 28, 28', 28') includes a material that is chemically compatible with a connecting layer (16) and at least one electrode (12, 14) in the nanoscale switching device (10). The control layer (26, 26', 28, 28', 28') is adapted to control at least one of electrochemical reaction paths, electrophysical reaction paths, and combinations thereof during operation of the device (10).