摘要:
Techniques for reducing scan overhead in a scannable flop tray are described herein. In one embodiment, a scan circuit for a flop tray comprises a tri-state circuit configured to invert an input data signal and output the inverted data signal to an input of a flip-flop of the flop tray in a normal mode, and to block the data signal from the input of the flip-flop in a scan mode. The scan circuit also comprises a pass gate configured to pass a scan signal to the input of the flip-flop in the scan mode, and to block the scan signal from the input of the flip-flop in the normal mode.
摘要:
A chip (110, 120, 130) applied to a serial transmission system includes an input terminal, a core circuit (114, 1 24, 1 34), an output terminal, a first transmission line, a second transmission line and a spare transmission line, where the input terminal is used to receive an input signal from a source outside the chip (110, 120, 130), the output terminal is used to output an output signal, the first transmission lines is coupled between the input terminal and the core circuit (114, 124, 134), the second transmission line is coupled between the core circuit (114, 124, 1 344) and the output terminal, and the spare transmission line is coupled between the input terminal and the output terminal. When the core circuit (114, 124, 1 34) cannot process the input terminal normally, the input signal is directly transmitted to the output terminal via the spare transmission line, and the input signal serves as the output signal to be outputted from the output terminal.
摘要:
Object An objective is to provide an integrated circuit capable of performing an operation check test for a combination circuit present in sections that are not connected by a scan chain. Solution Means An integrated circuit includes a first signal processing circuit in which a plurality of first combination circuits and a plurality of scan FFs (Flip Flop) are connected in an order of a scan FF, a first combination circuit, and a scan FF; a second signal processing circuit including a second combination circuit different from the first combination circuit; a first selection circuit configured to select data from a scan FF on an input side of one of the plurality of first combination circuits or data from an input terminal of the second signal processing circuit, and to output the selected data to the second combination circuit; and a second selection circuit configured to select data from another one of the plurality of first combination circuits different from the one of the plurality of first combination circuits or data from the second combination circuit, and to output the selected data to the scan FF on an output side of the another one of the plurality of first combination circuits.
摘要:
A scan test of a first latch and a second latch couples a given scan value to the input of the first latch, to switch the first latch to a state corresponding to the scan value, uncouples the scan value from the first latch to latch the first latch at that state, couples the output of the first latch while latched at that state to the input of the second latch to switch the second latch to that state, and uncoupling the output of the first latch from the input of the second latch to latch the second latch at that state.
摘要:
A method is disclosed for the automated synthesis of phase shifters - circuits (FIG. 10) used to remove effects of structural dependencies featured by pseudo-random test pattern generators driving parallel scan chains. Using a concept of duality, the method relates the logical states of linear feedback shift registers (LFSRs) and circuits spacing their inputs to each of the output channels. The method generates a phase shifter network balancing the loads of successive stages of LFSRs and satisfying criteria of reduced linear dependency, channel separation and circuit complexity.
摘要:
The present invention relates to an asynchronous set-reset circuit device (20) for improving the quality requirement and reducing the patterns generation time in the testing activity normally performed by using an Automatic Test Patterns Generation (ATPG) tool, said circuit device including a core portion (17) comprising a couple of logic gates (22, 23) with at least two inputs each. The set-reset circuit (20) of the invention further includes: - a logic gate structure (8) provided upstream with respect to the core portion (17) for driving one respective input of the couple of logic gates; - feedback connections (18, 19) between the outputs of the logic gates (22, 23) and respective inputs of the logic gate structure (8); - further inputs of the logic gate structure (8) receiving a couple of test command signals (TR, TS).
摘要:
A method (400) for race prevention and a device (100) that has race prevention capabilities. The method (400) includes: selectively providing (410) data or scan data to a input latching logic, activating (420) the input latching logic for a first scan mode activation period, introducing (430) a substantial time shift between the first scan mode activation period and a second scan mode activation period, and activating (440) a output latching logic, connected to the input latching logic for a second scan mode activation period. The device (100) includes: an interface logic (110), a input latching logic (120), a output latching logic (130) and a control logic (150). The interface logic (110) is adapted to selectively provide data or scan data to the input latching logic (120). The control logic (150) is adapted to introduce a substantial time difference between an end point of a first scan mode activation period of the input latching logic (120) and between a start point of a second scan mode activation period of the output latching logic (130).
摘要:
A wrapper architecture has a parent core A and a child core B. The parent core A comprises scan chains (70), wrapper input cells (71), wrapper output cells (74) and a parent TAM, PTAM [0:2]. Likewise, the child core comprises scan chains (76), wrapper input cells (75) and wrapper output cells (72), and is connected to a child TAM, CTAM [0:2]. Each wrapper input cell (75) and each wrapper output cell (72) of the child core is adapted to be connected to the parent TAM, PTAM, in addition to being connected to the child TAM, CTAM, thereby enabling the child core to be placed in the In-test and Ex-test modes at the same time, and allowing the parent and child cores to be tested in parallel.
摘要:
Novel peptides which are conformationally constrained backbone cyclized somatostatin analogs, having somatostatin receptor sub-type selectivity are disclosed. These patterns of receptor subtype selectivity provide compounds having improved therapeutic utility. Methods for synthesizing the somatostatin analogs and for screening of the somatostatin analogs are also disclosed. Furthermore, pharmaceutical compositions comprising somatostatin analogs, and methods of using such compositions are disclosed.