摘要:
Die Erfindung betrifft ein Verfahren (40) zum Erzeugen von Tiefenwerten eines Oberflächenbereichs einer Oberfläche eines Werkstücks (12), mit: - Empfangen (42) eines Fokalbildstapels, wobei der Fokalbildstapel eine Mehrzahl von Bildern des Werkstücks (12) aufweist, wobei die Bilder den Oberflächenbereich der Oberfläche des Werkstücks (12) mit in einer Tiefenrichtung unterschiedlichen Fokalebenenpositionen (22) als Bildbereich des Bildes abbilden, wobei jedem Bild des Fokalbildstapels eine Fokalebenenposition (22) zugeordnet ist und wobei Bildpunkte der Bilder jeweils einem entsprechenden Objektpunkt auf der Oberfläche des Werkstücks (12) zugeordnet sind; - Bestimmen (44) jeweils eines Bildschärfenwerts für eine Mehrzahl von Teilbereichen des Bildbereichs jedes Bildes des Fokalbildstapels; - Anpassen (46) eines Modells, mit dem ein Verlauf von Bildschärfenwerten jeweils für einen gemeinsamen abgebildeten Teilbereich des Oberflächenbereichs über die Bilder des Bildstapels beschreibbar ist, jeweils an tatsächliche Verläufe der bestimmten Bildschärfenwerte derjenigen Teilbereiche der Bildbereiche, die einen Stapel von Bild-Teilbereichen bilden, weil sie einem gemeinsamen abgebildeten Teilbereich des Oberflächenbereichs entsprechen; - Bestimmen (52) jeweils eines Tiefenwerts für die gemeinsamen Teilbereiche, wobei der Tiefenwert in dem Verlauf von Bildschärfenwerten des Modells einer größten Bildschärfe für den jeweiligen Stapel von Bild-Teilbereichen entspricht und ein Maß für eine Tiefenposition des gemeinsamen abgebildeten Teilbereichs des Oberflächenbereichs ist; - Korrigieren (52) mindestens eines Abbildungsfehlers der Bilder des Fokalbildstapels für zumindest einen der bestimmten oder zu bestimmenden Tiefenwerte, wobei der mindestens eine Abbildungsfehler ein Kippfehler und/oder ein Bildfeldwölbungs-Fehler und/oder ein Astigmatismus-Fehler ist.
摘要:
A method and system are provided for focusing an imaging device on a liquid sample flowing through a field of view of the imaging device. Objects are segmented in the captured frames and used to account for the fact that the sample is flowing. Object velocities are calculated and used in selecting an appropriate focus value. The calculation of a focus measure takes account of the number of objects in captured frames in order to ensure a consistent calculation of the focus measure.
摘要:
An apparatus for scanning microscope slides is provided. The apparatus comprises an objective (108); a specimen stage (111); a camera sensor (110) configured to capture a first plurality of images at a first rate while focus is changed in continuous motion; and a flash unit (101) configured to flash at a second rate, wherein the first rate and the second rate are synchronized.
摘要:
By using the method according to the invention, a wavelength-dependent refractive index of a sample medium is determined which is examined using a light microscope (100). The light microscope is used to carry out a sample measurement on the sample medium with an unknown refractive index. Illuminating light (22) is irradiated onto the sample medium, and detection light coming from the sample medium is measured. A sample measurement focal position of the illuminating and/or detection light is measured by means of the sample measurement. A mathematical model, in which a focal position (25) of the illuminating and/or detection light is expressed on the basis of a refractive index of a medium, is used to determine the refractive index of the sample medium from the sample measurement focal position. The invention additionally relates to a light microscope for carrying out the method.
摘要:
System for acquiring a digital image of a sample on a microscope slide. In an embodiment, the system comprises a stage configured to support a sample, an objective lens having a single optical axis that is orthogonal to the stage, an imaging sensor, and a focusing sensor. The system further comprises at least one beam splitter optically coupled to the objective lens and configured to receive a field of view corresponding to the optical axis of the objective lens, and simultaneously provide at least a first portion of the field of view to the imaging sensor and at least a second portion of the field of view to the focusing sensor. The focusing sensor may simultaneously acquire image(s) at a plurality of different focal distances and/or simultaneously acquire a pair of mirrored images, each comprising pixels acquired at a plurality of different focal distances.
摘要:
In the image capturing apparatus M, the optical path difference producing member 21 is disposed on the second optical path L2. Thereby, it is possible to suppress the amount of light when an optical image which is focused at the front of an optical image made incident into the first imaging device 18 (front focus) and an optical image which is focused at the rear thereof (rear focus) are respectively imaged at the second imaging device 20 and also to secure the amount of light on image pickup by the first imaging device 18. Further, in the image capturing apparatus M, a position of the first imaging region 22A and a position of the second imaging region 22B on the imaging area 20a are reversed with respect to the axis P in association with reversal of a scanning direction of the sample S. Therefore, despite the scanning direction of the sample S, it is possible to obtain a deviation direction of the focus position under the same conditions.
摘要:
To enable observation of the operating site to be continued more easily in the case in which the picture of the operating site is no longer displayed normally. Provided is a surgical microscope device including: a microscope unit that images an observation target, and outputs a picture signal; a support unit that supports the microscope unit, and is configured as a balance arm; and an auxiliary observation device that is attachable to the microscope unit or the support unit, and is configured to enable observation of an observation range provided by the microscope unit.
摘要:
The present application relates to an observation apparatus comprising a structured illumination section that emits structured illumination light having a light-dark pattern; a phase difference measurement illumination section that emits illumination light for phase difference measurement onto a subject-mount surface; a phase contrast lens that has a phase plate for dimming illumination light for phase difference measurement, where the illumination light for phase difference measurement having passed through the subject-mount surface is incident into the phase contrast lens, and the structured illumination light is incident into the phase contrast lens in a direction different from a direction of incidence of the illumination light for phase difference measurement through an optical system; a detection section that detects reflected light of the structured illumination light which is reflected on the subject-mount surface; and an observation section that images the illumination light for phase difference measurement which has passed through the phase contrast lens. According to the invention, the phase plate has frequency characteristics in which a transmittance of the structured illumination light is higher than a transmittance of the illumination light for phase difference measurement.