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1.
公开(公告)号:EP4133532A1
公开(公告)日:2023-02-15
申请号:EP21723326.1
申请日:2021-04-02
IPC分类号: H01L31/0296 , H01L31/103 , H01L31/109 , H01L31/18
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2.
公开(公告)号:EP4097766A1
公开(公告)日:2022-12-07
申请号:EP21732380.7
申请日:2021-04-02
发明人: LOBRE, Clément , ROCHETTE, Florent
IPC分类号: H01L31/0296 , H01L31/103 , H01L31/109 , H01L31/18
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公开(公告)号:EP3482421B1
公开(公告)日:2020-05-13
申请号:EP17737264.6
申请日:2017-07-07
发明人: EVIRGEN, Axel , REVERCHON, Jean-Luc
IPC分类号: H01L31/109
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公开(公告)号:EP3566249A1
公开(公告)日:2019-11-13
申请号:EP18701969.0
申请日:2018-01-05
IPC分类号: H01L31/0224 , H01L31/0304 , H01L31/108 , H01L31/109
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公开(公告)号:EP2835830B1
公开(公告)日:2018-10-17
申请号:EP14191472.1
申请日:2010-08-31
申请人: Intevac, Inc.
发明人: Aebi, Verle W.
IPC分类号: H01L27/146 , H01L31/109 , H01L31/0304
CPC分类号: H01L27/14643 , H01L27/1464 , H01L31/0304 , H01L31/03046 , H01L31/109 , Y02E10/544
摘要: The invention relates to a sensor for night vision applications, comprising an InP substrate (500); an InP buffer layer (510) fabricated on one surface of the InP substrate; an InGaAsP absorption layer (515) fabricated on the InP buffer layer; an InP cap layer (525) formed over the absorption layer; wherein the InGaAsP absorption layer limits long wavelength response cutoff to between 1.25 to 1.4µm wavelength. The invention further relates to a night vision apparatus, comprising a sensor that limits long wavelength response cutoff to between 1.25 to 1.4µm wavelength and an imaging chip positioned behind and connected to the sensor and comprising an array having 1600 x 1200 pixels at a 10.8 micron pixel pitch and operating at 60Hz.
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6.
公开(公告)号:EP2529417A4
公开(公告)日:2017-05-03
申请号:EP11737739
申请日:2011-01-28
申请人: HOWARD UNIV
发明人: BATES CLAYTON W JR
IPC分类号: H01L31/109 , H01J1/34 , H01J31/49 , H01L31/0352 , H01L31/09 , H01L31/108
CPC分类号: H01L31/035209 , H01J1/34 , H01J31/49 , H01L31/108
摘要: An infrared external photoemissive detector can have an n-p heterojunction comprising an n-type semiconductor layer and a p-layer; the n-layer semiconductor comprising doped silicon embedded with nanoparticles forming Schottky barriers; and the p-layer is a p-type diamond film. The nanoparticles can be about 20-30 atomic percentage metal particles (such as silver) having an average particle size of about 5-10 nm. The p-layer can have a surface layer that has a negative electron affinity. The n-layer can be in the range of about 3 μm to 10 μm thick, and preferably about 3 μm thick. The doped silicon can be doped with elements selected from the list consisting of phosphorus and antimony.
摘要翻译: 红外外部光发射检测器可以具有包括n型半导体层和p层的n-p异质结; 所述n层半导体包括嵌入有形成肖特基势垒的纳米颗粒的掺杂硅; 并且p层是p型金刚石膜。 纳米颗粒可以是平均粒径为约5-10nm的约20-30个原子百分比金属颗粒(例如银)。 p层可以具有负电子亲和力的表面层。 n层可以在约3μm至10μm厚的范围内,并且优选地约3μm厚。 掺杂的硅可以掺杂选自由磷和锑组成的列表中的元素。
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公开(公告)号:EP1189289B1
公开(公告)日:2015-09-16
申请号:EP00935563.7
申请日:2000-06-07
申请人: Nichia Corporation
发明人: TANIZAWA, Koji
IPC分类号: H01L33/00 , H01L31/072 , H01L31/109 , H01L29/68 , H01S5/343
CPC分类号: B82Y20/00 , H01L31/03042 , H01L31/03046 , H01L31/035236 , H01L31/0735 , H01L31/1852 , H01L33/025 , H01L33/06 , H01L33/32 , H01S5/305 , H01S5/3086 , H01S5/309 , H01S5/3407 , H01S5/34333 , Y02E10/544
摘要: An nitride semiconductor device for the improvement of lower operational voltage or increased emitting output, comprises an active layer comprising quantum well layer or layers and barrier layer or layers between n-type nitride. semiconductor layers and p-type nitride semiconductor layers, wherein said quantum layer in said active layer comprises InxGa1-xN (0 to 2 x 10 /cm .
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8.
公开(公告)号:EP2474034A4
公开(公告)日:2014-02-26
申请号:EP10812779
申请日:2010-08-31
申请人: INTEVAC INC
发明人: AEBI VERLE W
IPC分类号: H01L27/146 , H01L31/0304 , H01L31/109
CPC分类号: H01L27/14643 , H01L27/1464 , H01L31/0304 , H01L31/03046 , H01L31/109 , Y02E10/544
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公开(公告)号:EP2530723A3
公开(公告)日:2014-01-15
申请号:EP12163317.6
申请日:2012-04-05
申请人: Sony Corporation
IPC分类号: H01L31/0328 , H01L31/0352 , H01L31/042 , H01L31/109 , H01L31/055 , H01L31/072 , H01L31/0745 , H01L31/0384
CPC分类号: H01L31/03529 , H01L31/0384 , H01L31/055 , H01L31/072 , H01L31/0745 , Y02E10/52
摘要: The present invention relates to a heterojunction photovoltaic device comprising silicon microparticles and to a method of producing the same. The photovoltaic device comprises a conductor layer with a workfunction which matches the Fermi Energy of the silicon microparticle; a semiconductor layer (e.g. CuI, CuSCN, Cu2O); an insulator layer (e.g. an organic film) sandwiched between said conductor layer and said semiconductor layer, and a silicon microparticle, wherein said silicon microparticle is partially embedded in said conductor layer and partially embedded in said insulator layer, and wherein said silicon microparticle is in contact with said semiconductor layer and said conductor layer, and wherein said semiconductor layer comprises a material which is not silicon.
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公开(公告)号:EP2529417A2
公开(公告)日:2012-12-05
申请号:EP11737739.0
申请日:2011-01-28
申请人: Howard University
IPC分类号: H01L31/109 , H01L31/09
CPC分类号: H01L31/035209 , H01J1/34 , H01J31/49 , H01L31/108
摘要: An infrared external photoemissive detector can have an n-p heterojunction comprising an n-type semiconductor layer and a p-layer; the n-layer semiconductor comprising doped silicon embedded with nanoparticles forming Schottky barriers; and the p-layer is a p-type diamond film. The nanoparticles can be about 20 - 30 atomic percentage metal particles (such as silver) having an average particle size of about 5 - 10 nm. The p-layer can have a surface layer that has a negative electron affinity. The n-layer can be in the range of about 3 µm to 10 µm thick, and preferably about 3 µm thick. The doped silicon can be doped with elements selected from the list consisting of phosphorus and antimony.
摘要翻译: 红外外部发光检测器可以具有包括n型半导体层和p层的n-p异质结; 所述n层半导体包括掺杂有形成肖特基势垒的纳米颗粒的掺杂硅; p层是p型金刚石膜。 纳米颗粒可以是平均粒径约5-10nm的约20-30原子百分比的金属颗粒(如银)。 p层可以具有具有负电子亲和力的表面层。 n层可以在约3μm至10μm厚的范围内,优选约3μm厚。 掺杂的硅可掺杂有选自磷和锑的元素。
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