摘要:
An IC is provided with supply pins extending beyond the chip's encapsulation. The location of the supply pins is chosen so as to minimize the length of the associated bonding wires. Moreover the supply pins are located next to each other so as to reduce the effective inductance of the associated bonding wires. Output pins connected with on-chip buffers are located next to the supply pins so as to reduce the length of the buffer's supply lines, giving rise to a further reduction is inductive parasitic effects.
摘要:
A smart video memory (10) is provided that includes data storage (12 and 18), a serial access memory (19), and a processing core (14 and 16) for executing instructions stored in the data storage area (12 and 18). Externally, smart memory (10) is directly accessible as a standard video memory device.
摘要:
Random access memory unit having a plurality of test modes, which is constructed as an integrated circuit and which does not include specific input/output pins to define and to command the passage to test mode. This unit is equipped with means (1) for detecting whether a predefined sequence of logic signals, which is not contained, within a set of sequences which are normally used, but the voltages of which are nevertheless included within the range of voltages which are specified for such signals, is supplied to certain inputs (CE, WE, AO), and for placing the unit in-test mode when such a sequence has been detected. In order to define the nature of the test to be performed, address input terminals, (A1-A8) of the unit are connected to a test mode decoding circuit (2), in which the data applied to the said input terminals are used as data defining the nature of the test to be performed.