公开(公告)号：US08760650B2

公开(公告)日：2014-06-24

申请号：US12676642

申请日：2008-09-04

Applicant: Perry A. Palumbo

Inventor： Perry A. Palumbo

IPC: G01N21/00 ,  G01N1/10 ,  G01J1/10

CPC classification number: G01N21/4785 ,  G01N21/278

Abstract: A standard media suspension body (150) for verification and calibration of an optical particulate measurement instrument and configured to be at least partially immersed in a sample fluid is provided according to the invention. The body (150) includes a substantially solid outer surface including a first end (151) and a second end (152) disposed along an axis of illumination A and at least one outer surface (153). The first end (151) is configured to admit impinging light. The suspension body further includes an inner volume. At least a portion of the inner volume includes a substantially suspended light scattering material (155) that is configured to scatter a predetermined quantum of the admitted light. The suspension body (150) further includes an end cap (156) formed on the second end (152) and comprising a light absorbing material. Light exiting the second end (152) is substantially absorbed by the end cap (156).

Abstract translation: 根据本发明提供了一种用于验证和校准光学颗粒测量仪器并被配置为至少部分地浸入样品流体中的标准介质悬架体（150）。 主体（150）包括基本上实心的外表面，其包括沿着照明轴线A和至少一个外表面（153）设置的第一端（151）和第二端（152）。 第一端（151）被配置为允许入射光。 悬架体还包括内部容积。 内部体积的至少一部分包括基本上悬浮的光散射材料（155），其被配置为散射预定量的入射光。 悬挂体（150）还包括形成在第二端（152）上并包括光吸收材料的端盖（156）。 离开第二端（152）的光基本上被端盖（156）吸收。

公开(公告)号：US08687286B2

公开(公告)日：2014-04-01

申请号：US13395153

申请日：2010-09-08

Applicant: Perry A. Palumbo

Inventor： Perry A. Palumbo

IPC: G02B13/18

CPC classification number: G02B5/001 ,  G02B13/06 ,  G02B19/0028 ,  G02B19/008

Abstract: A meso-optic device (1) includes a substantially annular meso-optic body (100) including an axis of revolution (2), a divergent conic optical surface (112) substantially coaxial with the axis of revolution (2), with the divergent conic optical surface (112) configured to receive electromagnetic radiation propagating along an optical axis (3) from an impingent direction, wherein the optical axis (3) is coincident with or intersects the axis of revolution (2), and with the divergent conic optical surface (112) configured to divergently re-direct the electromagnetic radiation away from the axis of revolution (2), and a convergent conic optical surface (114) substantially coaxial with the axis of revolution (2), with the convergent conic optical surface (114) configured to receive the electromagnetic radiation divergently re-directed by the divergent conic optical surface (112) and with the convergent conic optical surface (114) configured to convergently re-direct the electromagnetic radiation toward the axis of revolution (2).

Abstract translation: 中视光学装置（1）包括基本上环形的中等光学主体（100），其包括旋转轴线（2），与旋转轴线（2）基本同轴的发散锥形光学表面（112），发散的 锥形光学表面（112），被配置为接收沿着光轴（3）从碰撞方向传播的电磁辐射，其中所述光轴（3）与所述旋转轴线（2）重合或相交，并且与所述发散锥形光学 配置成将电磁辐射远离旋转轴线（2）发散的表面（112）和与旋转轴线（2）基本上同轴的会聚锥形光学表面（114）与会聚锥形光学表面 114），其被配置为接收由发散锥形光学表面（112）发散地重新引导的电磁辐射，并且会聚的锥形光学表面（114）被配置成会聚地重新引导电磁辐射 朝向革命轴线（2）。

公开(公告)号：US08582106B2

公开(公告)日：2013-11-12

申请号：US12739988

申请日：2008-11-04

Applicant: Perry A. Palumbo ,  Brian Harmon

Inventor： Perry A. Palumbo ,  Brian Harmon

IPC: G01N21/00

CPC classification number: G01N35/00663 ,  G01N21/13 ,  G01N21/51 ,  G01N21/5907 ,  G01N2021/5969 ,  G01N2201/0256

Abstract: An automatic optical measurement system (100) is provided. The measurement system (100) includes a sample vial (10) and an automatic optical measurement apparatus (90) configured to receive the sample vial (10). The automatic optical measurement apparatus (90) is configured to detect a presence of the sample vial (10) in the automatic optical measurement apparatus (90) and measure a light intensity of light substantially passing through the sample vial (10) if the sample vial (10) is present. The measured light intensity is related to sample material properties of a sample material within the sample vial (10).

Abstract translation: 提供了一种自动光学测量系统（100）。 测量系统（100）包括样品瓶（10）和被配置为接收样品瓶（10）的自动光学测量装置（90）。 自动光学测量装置（90）被配置为在自动光学测量装置（90）中检测样品瓶（10）的存在并测量基本上通过样品瓶（10）的光的光强度，如果样品瓶 （10）。 测量的光强度与样品瓶（10）中的样品材料的样品材料性质相关。

公开(公告)号：US20100188660A1

公开(公告)日：2010-07-29

申请号：US12668926

申请日：2008-07-15

Applicant: Perry A. Palumbo

Inventor： Perry A. Palumbo

IPC: G01N21/59 ,  G01N21/55

CPC classification number: G01N21/59 ,  G01N21/49 ,  G01N21/51 ,  G01N21/55

Abstract: A spatial frequency optical measurement instrument (100) is provided according to the invention. The instrument (100) includes a spatial frequency mask (120) positioned in a light path and configured to encode light with spatial frequency information, a light receiver (140) positioned to receive the light encoded with the spatial frequency information, wherein the light encoded with the spatial frequency information has been interacted with a sample material, and a processing system (180) coupled to the light receiver (140) and configured to determine a change in the spatial frequency information due to the interaction of the light with the sample material.

Abstract translation: 根据本发明提供一种空间频率光学测量仪器（100）。 仪器（100）包括位于光路中并被配置为用空间频率信息对光进行编码的空间频率掩模（120），光接收器（140）定位成接收用空间频率信息编码的光，其中光编码 其中所述空间频率信息已经与样本材料相互作用，以及耦合到所述光接收器（140）并且被配置为确定由于所述光与所述样本材料的相互作用而导致的空间频率信息的变化的处理系统（180） 。

公开(公告)号：US07505132B2

公开(公告)日：2009-03-17

申请号：US11609110

申请日：2006-12-11

Applicant: Perry A. Palumbo

Inventor： Perry A. Palumbo

IPC: G01N21/00

CPC classification number: G01N15/0227 ,  G01N21/276 ,  G01N21/532 ,  G01N2015/0294

Abstract: A measurement system that can self calibrate is disclosed. The measurement system comprising a first light source directed along a first axis and configured to illuminate a sample volume. The measurement system has a sensor aligned along a second axis and is configured to detect scattered light in the sample volume. The measurement system has a second light source aligned along the second axis that is configured to illuminate the sensor during a calibration procedure.

Abstract translation: 公开了可以进行自校准的测量系统。 测量系统包括沿着第一轴指向并被配置为照亮样品体积的第一光源。 测量系统具有沿着第二轴对准的传感器，并且被配置为检测样品体积中的散射光。 测量系统具有沿着第二轴对准的第二光源，该第二光源配置成在校准过程期间照亮传感器。

公开(公告)号：US20070222985A1

公开(公告)日：2007-09-27

申请号：US11609211

申请日：2006-12-11

Applicant: Perry A. Palumbo

Inventor： Perry A. Palumbo

IPC: G01N21/00

CPC classification number: G01N15/0227 ,  G01N21/276 ,  G01N21/532 ,  G01N33/18

Abstract: A measurement system having dual measurements capabilities is disclosed. The measurement system has a light source configured to provide light along a first axis that illuminates a sample media. The measurement system has a first sensor configured to measure scattered light in a sample media. The measurement system has a second sensor configured to measure light passing through the sample media.

Abstract translation: 公开了一种具有双重测量能力的测量系统。 测量系统具有被配置为沿着照亮样品介质的第一轴提供光的光源。 测量系统具有配置成测量样品介质中的散射光的第一传感器。 测量系统具有被配置成测量通过样品介质的光的第二传感器。

公开(公告)号：US20070222984A1

公开(公告)日：2007-09-27

申请号：US11609168

申请日：2006-12-11

Applicant: Perry A. Palumbo

Inventor： Perry A. Palumbo

IPC: G01N21/00

CPC classification number: G01N15/0227 ,  G01N21/05 ,  G01N21/532 ,  G01N2201/065

Abstract: A measurement system that has multiple sensors or multiple light sources is disclosed. The measurement system comprising a light source directed along a first axis and configured to illuminate a sample volume. The measurement system has a first sensor aligned along a second axis and is configured to detect scattered light in the sample volume. The measurement system has a second sensor aligned along a third axis and is also configured to detect scattered light in the sample volume.

Abstract translation: 公开了具有多个传感器或多个光源的测量系统。 所述测量系统包括沿着第一轴线指向并被配置为照亮样本体积的光源。 测量系统具有沿着第二轴对准的第一传感器，并且被配置为检测样品体积中的散射光。 测量系统具有沿着第三轴对准的第二传感器，并且还被配置为检测样品体积中的散射光。

公开(公告)号：US06894778B2

公开(公告)日：2005-05-17

申请号：US10420250

申请日：2003-04-22

Applicant: Perry A. Palumbo ,  Paul D. Schlegel ,  Jeffrey M. Huhta ,  Richard P. Kolman

Inventor： Perry A. Palumbo ,  Paul D. Schlegel ,  Jeffrey M. Huhta ,  Richard P. Kolman

IPC: G01N21/51 ,  G01N21/00

CPC classification number: G01N21/51 ,  G01N2201/0642

Abstract: A turbidimeter having an arrangement of internal surfaces, optical surfaces, and optical restrictions to the field of view of both the illumination and the detector means to significantly improve the lower detection limit of the turbidimeter by reducing the detected signal due to stray light.

Abstract translation: 具有内部表面，光学表面和对照明和检测器装置的视野的光学限制的浊度计，通过减少由于杂散光引起的检测信号来显着地提高浊度计的较低检测限。

公开(公告)号：US06538736B1

公开(公告)日：2003-03-25

申请号：US09705990

申请日：2000-11-03

Applicant: Perry A. Palumbo

Inventor： Perry A. Palumbo

IPC: G01J328

CPC classification number: G01J3/04 ,  G01J3/02 ,  G01J3/0262 ,  G01J3/18

Abstract: Concentric spectrometers are plagued with internal reflections due to inherent nature of more than one optical surface possessing a common center of curvature. Reflections from optical surfaces arise when there is a difference or change in the refractive index of the media in which an optical beam or ray of a given wavelength is propagating. Internal reflections in concentric optical systems can produce a myriad of undesirable optical phenomenon at the image plane such as multiple images of an object, interference fringes, and stray light. As a result a loss in contrast or detection limit arise from such phenomenon in which light or detectable radiation that impinges on the image plane does not add to the formation of the intended image, (stray light). The present invention produces high quality images without the optical phenomenon(s) that arise from internal reflections by removing the reflected radiation from propagating through the optical system.

Abstract translation: 由于具有共同的曲率中心的多于一个的光学表面的固有特性，同心光谱仪受到内部反射的困扰。 当光束或给定波长的光线正在传播的介质的折射率存在差异或变化时，会产生光学表面的反射。 同心光学系统中的内部反射可能在像平面上产生无数不希望的光学现象，例如物体的多个图像，干涉条纹和杂散光。 结果，造成对比度或检测限制的损失是由于这种现象，其中照射在图像平面上的光或可检测的辐射不会增加预期图像的形成（杂散光）。 本发明通过去除通过光学系统传播的反射辐射而产生高质量图像而没有由内部反射产生的光学现象。

公开(公告)号：US08675198B2

公开(公告)日：2014-03-18

申请号：US13814669

申请日：2011-08-01

Applicant: Perry A. Palumbo

Inventor： Perry A. Palumbo

IPC: G01N21/00

CPC classification number: G02B19/0076 ,  G01N15/06 ,  G01N21/01 ,  G01N21/53 ,  G01N33/18 ,  G01N2015/0693 ,  G01N2201/064 ,  G02B3/04 ,  G02B5/001 ,  G02B13/18 ,  G02B19/0028 ,  G02B19/008 ,  G02B26/0808 ,  G02B2003/0093 ,  Y10T29/49826

Abstract: An annular optical device (100) includes an annular meso-optic (1) including an annulus (11) centered about an axis of revolution (A) and a secondary optical structure (2) substantially coaxial within the annulus (11). The secondary optical structure (2) and the annular meso-optic (1) are separated by a media (12) including a media refractive index that is lower than the refractive index of the secondary optical structure. The secondary optical structure (2) holds a specimen to be radiated by impinging electromagnetic radiation. Scattered radiation from the secondary optical structure (2) and within the annulus (11) of the annular meso-optic (1) is allowed into the annular meso-optic (1) if an angle of incidence of the scattered radiation exceeds a predetermined incidence threshold. The annular meso-optic (1) re-directs the scattered radiation to comprise re-directed radiation that is substantially parallel to the axis of revolution (A).

Abstract translation: 环形光学装置（100）包括环形介质光学器件（1），其包括以旋转轴线（A）为中心的环形空间（11）和在环形空间（11）内基本同轴的次级光学结构（2）。 二次光学结构（2）和环形中视镜（1）由介质折射率低于第二光学结构的折射率的介质（12）分开。 二次光学结构（2）通过撞击电磁辐射而保持待辐射的样本。 如果散射辐射的入射角超过预定的入射角，则允许来自环形介质光学器件（1）的二次光学结构（2）和环形空间（11）内的散射辐射进入环形中视镜（1） 阈。 环形介质光学器件（1）重新引导散射的辐射，以包括基本上平行于旋转轴线（A）的重新定向的辐射。