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公开(公告)号：US11902813B2
公开(公告)日：2024-02-13
申请号：US17278501
申请日：2019-08-07
Applicant: ADVANTEST Corporation
Inventor： Takashi Fujisaki , Kazuhiro Shibano , Kenji Nishikawa
Abstract: A measurement result receiving apparatus receives measurement results transmitted from a plurality of measuring devices, the measurement results obtained by conducting a measurement at a predetermined sampling interval according to a reference clock of each measuring device. The measurement result receiving apparatus includes a receiving section that receives the measurement results from the plurality of measuring devices; and a sampling interval converting section that converts the measurement results into measurement values associated with a common sampling interval.
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公开(公告)号：US09250263B2
公开(公告)日：2016-02-02
申请号：US14618070
申请日：2015-02-10
Applicant: ADVANTEST CORPORATION
Inventor： Kiyoto Nakamura , Takashi Fujisaki
CPC classification number: G01R1/0433 , G01R1/0466 , G01R1/0483 , G01R1/0735 , G01R31/2601 , G01R31/2886
Abstract: A socket is electrically connected to a test carrier. The test carrier includes a film-shaped first member on which at least one internal terminal, which contacts at least one electrode of an electronic device, is provided; and at least one external terminal which is electrically connected to the internal terminal. The socket includes: at least one contactor which contacts the external terminal; and a first pusher which pushes a portion of the first member where the internal terminal is provided and a portion of the first member surrounding the internal terminal. The first pusher includes: a bag member which has a sealed space within the bag member; and a fluid which is housed in the sealed space.
Abstract translation: 插座电连接到测试载体。 测试载体包括薄膜状的第一构件，在其上提供与电子设备的至少一个电极接触的至少一个内部端子; 以及与内部端子电连接的至少一个外部端子。 插座包括：至少一个接触外部端子的接触器; 以及第一推动器，其推动设置有内部端子的第一构件的一部分和围绕内部端子的第一构件的一部分。 第一推动器包括：袋构件，其在袋构件内具有密封空间; 以及容纳在密封空间中的流体。
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公开(公告)号：US20150168448A1
公开(公告)日：2015-06-18
申请号：US14390557
申请日：2013-05-21
Applicant: ADVANTEST CORPORATION
Inventor： Kiyoto Nakamura , Takashi Fujisaki , Hiroki Ichikawa
CPC classification number: G01R1/0408 , G01R31/003 , G01R31/2863 , G01R31/2867
Abstract: A test carrier includes a base film that holds a die and a cover film that overlaps the base film so as to cover the die. The cover film has a self-adhesive property and is more flexible than the base film. The base film has a through hole. The through hole is formed in the vicinity of a region of the base film which contacts the die.
Abstract translation: 测试载体包括保持模具的基膜和与基膜重叠以覆盖模具的覆盖膜。 覆盖膜具有自粘性，比基膜更柔软。 基膜具有通孔。 通孔形成在与模具接触的基膜的区域附近。
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公开(公告)号：US08988095B2
公开(公告)日：2015-03-24
申请号：US13644197
申请日：2012-10-03
Applicant: Advantest Corporation
Inventor： Kiyoto Nakamura , Takashi Fujisaki
CPC classification number: G01R1/0433 , G01R1/0466 , G01R1/0483 , G01R1/0735 , G01R31/2601 , G01R31/2886
Abstract: A socket which enables occurrence of contact defects to be suppressed is provided. A socket 11 to which a test carrier 20, which has: a base film 32 on which bumps 324 are formed for contact with electrode pads 51 of a die 50; and external terminals 312 which are electrically connected to the bumps 324, is electrically connected comprises: contactors 125 which contact external terminals 312; and an elastic member 131 which pushes against bump-forming portions 32a and bump-surrounding portions 32b on the base film 32. The elastic member 131 has: a first elastic layer 132; and a second elastic layer 133 which is more flexible than the first elastic layer 132, and a second elastic layer 133 is laid over the first elastic layer 132 and contacts the base film 32.
Abstract translation: 提供能够抑制接触缺陷发生的插座。 具有测试载体20的插座11，其具有：基底膜32，其上形成有用于与模具50的电极焊盘51接触的凸块324; 电连接到凸块324的外部端子312电连接包括：接触外部端子312的接触器125; 以及弹性构件131，其在基底膜32上推动凸起形成部分32a和凸起部分32b。弹性构件131具有：第一弹性层132; 以及比第一弹性层132更柔性的第二弹性层133，并且第二弹性层133被放置在第一弹性层132上并与基膜32接触。
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