公开(公告)号：US11698017B2

公开(公告)日：2023-07-11

申请号：US17261672

申请日：2019-07-11

Applicant: CORNING INCORPORATED

Inventor： Joseph Henry Citriniti ,  En Hong ,  Philip Robert LeBlanc

IPC: F01N11/00 ,  B01D46/24 ,  G01N15/06 ,  G01N15/08 ,  B01D46/00 ,  C04B38/00 ,  F01N3/022

CPC classification number: F01N11/002 ,  B01D46/0086 ,  B01D46/2418 ,  C04B38/0012 ,  F01N3/022 ,  G01N15/0826 ,  B01D2279/30 ,  G01N2015/084

Abstract: Defect detection systems include at least one nozzle for delivering a CO2 particulate fluid to an inlet end of a plugged honeycomb body. Defects in the honeycomb, if any, are determined by monitoring CO2 particulate flow at the outlet end of the honeycomb body. Methods for detecting defects in plugged honeycomb bodies are also disclosed.

公开(公告)号：US10677739B2

公开(公告)日：2020-06-09

申请号：US16346704

申请日：2017-10-31

Applicant: Corning Incorporated

Inventor： Uta-Barbara Goers ,  En Hong ,  Sung-chan Hwang ,  Ji Hwa Jung ,  Tae-ho Keem ,  Philip Robert LeBlanc ,  Rajeshkannan Palanisamy ,  Sung-jong Pyo ,  Correy Robert Ustanik

IPC: G01N21/896 ,  G02B7/182 ,  G02B21/18 ,  G02B21/10

Abstract: A method of inspecting defects of a transparent substrate may include: illuminating a transparent substrate; calculating an incidence angle range of light so that a first region where the light meets a first surface of the transparent substrate and a second region where light meets a second surface being opposite the first surface of the transparent substrate do not overlap each other; adjusting an incidence angle according to the incidence angle range; adjusting a position of a first detector so that a first field-of-view of the first detector covers the first region and does not cover the second region; adjusting a position of a second detector so that a second field-of-view of the second detector covers the second region and does not cover the first region; and obtaining a first image of the first region and a second image of the second region from the first and second detector, respectively.

公开(公告)号：US20210262376A1

公开(公告)日：2021-08-26

申请号：US17261672

申请日：2019-07-11

Applicant: CORNING INCORPORATED

Inventor： Joseph Henry Citriniti ,  En Hong ,  Philip Robert LeBlanc

IPC: F01N11/00 ,  C04B38/00 ,  B01D46/24 ,  B01D46/00 ,  F01N3/022 ,  G01N15/08

Abstract: Defect detection systems include at least one nozzle for delivering a CO2 particulate fluid to an inlet end of a plugged honeycomb body. Defects in the honeycomb, if any, are determined by monitoring CO2 particulate flow at the outlet end of the honeycomb body. Methods for detecting defects in plugged honeycomb bodies are also disclosed.

公开(公告)号：US20190257765A1

公开(公告)日：2019-08-22

申请号：US16346704

申请日：2017-10-31

Applicant: Corning Incorporated

Inventor： Uta-Barbara Goers ,  En Hong ,  Sung-chan Hwang ,  Ji Hwa Jung ,  Tae-ho Keem ,  Philip Robert LeBlanc ,  Rajeshkannan Palanisamy ,  Sung-jong Pyo ,  Correy Robert Ustanik

IPC: G01N21/896 ,  G02B7/182

Abstract: A method of inspecting defects of a transparent substrate may include: illuminating a transparent substrate; calculating an incidence angle range of light so that a first region where the light meets a first surface of the transparent substrate and a second region where light meets a second surface being opposite the first surface of the transparent substrate do not overlap each other; adjusting an incidence angle according to the incidence angle range; adjusting a position of a first detector so that a first field-of-view of the first detector covers the first region and does not cover the second region; adjusting a position of a second detector so that a second field-of-view of the second detector covers the second region and does not cover the first region; and obtaining a first image of the first region and a second image of the second region from the first and second detector, respectively.

公开(公告)号：US12292387B2

公开(公告)日：2025-05-06

申请号：US17928005

申请日：2021-05-25

Applicant: CORNING INCORPORATED

Inventor： Chong Pyung An ,  En Hong ,  Tian Huang ,  Yuhui Jin ,  Philip Robert LeBlanc ,  Garrett Andrew Piech

IPC: G01N21/88 ,  G01N21/958

Abstract: A method for inspecting a transparent workpiece comprises: directing light from an illumination source onto a plurality of defects formed in the transparent workpiece, wherein the plurality of defects extends in a defect direction, wherein the transparent workpiece comprises a first surface and a second surface; detecting a scattering image signal from light scattered by the plurality of defects using an imaging system, wherein an imaging axis of the imaging system extends at a non-zero imaging angle relative to the defect direction, wherein entireties of at least a subset of the plurality of defects are within a depth of field of the imaging system; and generating a three-dimensional image of at least one of the plurality of defects based on the scattering signal.

公开(公告)号：US20240174561A1

公开(公告)日：2024-05-30

申请号：US18383547

申请日：2023-10-25

Applicant: CORNING INCORPORATED

Inventor： Robert Randall Hancock, JR. ,  En Hong ,  Ming-Huang Huang ,  Aize Li

IPC: C03C23/00 ,  C03C3/085 ,  C03C3/093 ,  C11D7/02

CPC classification number: C03C23/0075 ,  C03C3/085 ,  C03C3/093 ,  C11D7/02

Abstract: Various aspects of the present disclosure relate to a method of cleaning a glass substrate. The method includes contacting the glass substrate with a cleaning agent for a predetermined amount of time. The cleaning agent includes a substance having a sublimation point in a range of from about −90° C. to about −70° C. and the cleaning agent is dispersed in a gas carrier.

公开(公告)号：US20230221261A1

公开(公告)日：2023-07-13

申请号：US17928005

申请日：2021-05-25

Applicant: CORNING INCORPORATED

Inventor： Chong Pyung An ,  En Hong ,  Tian Huang ,  Yuhui Jin ,  Philip Robert LeBlanc ,  Garrett Andrew Piech

IPC: G01N21/88 ,  G01N21/958

CPC classification number: G01N21/8806 ,  G01N21/958 ,  G01N21/8851 ,  G01N2021/8822 ,  G01N2021/8887

Abstract: A method for inspecting a transparent workpiece comprises: directing light from an illumination source onto a plurality of defects formed in the transparent workpiece, wherein the plurality of defects extends in a defect direction, wherein the transparent workpiece comprises a first surface and a second surface; detecting a scattering image signal from light scattered by the plurality of defects using an imaging system, wherein an imaging axis of the imaging system extends at a non-zero imaging angle relative to the defect direction, wherein entireties of at least a subset of the plurality of defects are within a depth of field of the imaging system; and generating a three-dimensional image of at least one of the plurality of defects based on the scattering signal.

公开(公告)号：US10732126B2

公开(公告)日：2020-08-04

申请号：US16346711

申请日：2017-10-31

Applicant: Corning Incorporated

Inventor： Chong Pyung An ,  Uta-Barbara Goers ,  En Hong ,  Sung-chan Hwang ,  Ji Hwa Jung ,  Tae-ho Keem ,  Philip Robert LeBlanc ,  Hyeong-cheol Lee ,  Michal Mlejnek ,  Johannes Moll ,  Rajeshkannan Palanisamy ,  Sung-jong Pyo ,  Amanda Kathryn Thomas ,  Correy Robert Ustanik

IPC: G01N21/896 ,  G01N21/958

Abstract: A method of inspecting defects on a transparent substrate may include: selecting a gradient of an illumination optical system so that light incident on the transparent substrate has a first angle; selecting a gradient of a detection optical system so that an optical axis of the detection optical system located over the transparent substrate has a second angle, which is equal to or less than the first angle; adjusting a position of at least one of the illumination optical system, the transparent substrate, and the detection optical system so that a field-of-view of the detection optical system covers a first region where the light meets a first surface of the transparent substrate and does not cover a second region where light meets a second surface of the transparent substrate, the second surface being opposite to the first surface; illuminating the transparent substrate; and detecting light scattered from the transparent substrate.

公开(公告)号：US20190277774A1

公开(公告)日：2019-09-12

申请号：US16346711

申请日：2017-10-31

Applicant: Corning Incorporated

Inventor： Chong Pyung An ,  Uta-Barbara Goers ,  En Hong ,  Sung-chan Hwang ,  Ji Hwa Jung ,  Tae-ho Keem ,  Philip Robert LeBlanc ,  Hyeong-cheol Lee ,  Michal Mlejnek ,  Johannes Moll ,  Rajeshkannan Palanisamy ,  Sung-jong Pyo ,  Amanda Kathryn Thomas ,  Correy Robert Ustanik

IPC: G01N21/896 ,  G01N21/958

Abstract: A method of inspecting defects on a transparent substrate may include: selecting a gradient of an illumination optical system so that light incident on the transparent substrate has a first angle; selecting a gradient of a detection optical system so that an optical axis of the detection optical system located over the transparent substrate has a second angle, which is equal to or less than the first angle; adjusting a position of at least one of the illumination optical system, the transparent substrate, and the detection optical system so that a field-of-view of the detection optical system covers a first region where the light meets a first surface of the transparent substrate and does not cover a second region where light meets a second surface of the transparent substrate, the second surface being opposite to the first surface; illuminating the transparent substrate; and detecting light scattered from the transparent substrate.