Method and apparatus for scanning a workpiece through an ion beam
    4.
    发明授权
    Method and apparatus for scanning a workpiece through an ion beam 有权
    用于通过离子束扫描工件的方法和装置

    公开(公告)号:US07608843B2

    公开(公告)日:2009-10-27

    申请号:US11565267

    申请日:2006-11-30

    IPC分类号: H01J37/08

    摘要: A method and apparatus 300 for better controlling scanning of a workpiece 330 through an ion beam path 306 provide for mounting a workpiece 330 on an elongated member, partially repetitively rotating the elongated member 500 around a point of rotation 368 to make repetitive scans of the workpiece 330 along and arcuate path 504 and bending the elongated member 500 at a joint 322 to move the one and out of the ion beam path 306 to facilitate attachment and removal of individual workpieces 330. A motor 315 used for the rotating may be suspended within a partial vacuum enclosure 304 against gravity for raising and lowering the elongated member and 500 a workpiece 306 for linear vertical scanning.

    摘要翻译: 用于更好地控制通过离子束路径306的工件330的扫描的方法和装置300提供将工件330安装在细长构件上,部分地重复地使细长构件500围绕旋转点368旋转以对工件进行重复扫描 330和弓形路径504,并且在接头322处将细长构件500弯曲以将离子束路径306中的一个移出并离开离子束路径306,以便于各个工件330的附接和移除。用于旋转的马达315可以悬挂在 部分真空外壳304反对用于升高和降低细长构件的重力,以及500个用于线性垂直扫描的工件306。