Optical phase measurement of target
    1.
    发明申请
    Optical phase measurement of target 有权
    目标光学相位测量

    公开(公告)号:US20050194523A1

    公开(公告)日:2005-09-08

    申请号:US10795917

    申请日:2004-03-08

    CPC分类号: G01J9/00 G01N21/553

    摘要: Optical phase detection includes generating a first lightwave having a first polarization and a second lightwave having a polarization that is offset from the first polarization, and imposing a relative delay between the first and second lightwaves. The relative delay causes a frequency offset between the lightwaves as wavelength is tuned over a designated wavelength range. Directing the first and second lightwaves to a target provides a third lightwave and a fourth lightwave. A polarization component of the third lightwave and a polarization component of the fourth lightwave are detected to provide a detected signal at the frequency offset. The optical phase detection then includes extracting a phase difference, induced by the target, between the polarization components of the third and the fourth lightwaves.

    摘要翻译: 光相位检测包括产生具有第一偏振的第一光波和具有偏离第一偏振的偏振的第二光波,并且在第一和第二光波之间施加相对延迟。 当波长在指定的波长范围内调谐时,相对延迟会导致光波之间的频率偏移。 将第一和第二光波导向目标提供第三光波和第四光波。 检测第三光波的偏振分量和第四光波的偏振分量,以提供频偏处的检测信号。 然后,光学相位检测包括在第三和第四光波的偏振分量之间提取由目标感应的相位差。

    Sample holder for surface plasmon resonance measuring instruments
    3.
    发明申请
    Sample holder for surface plasmon resonance measuring instruments 有权
    表面等离子体共振测量仪器的样品架

    公开(公告)号:US20060269453A1

    公开(公告)日:2006-11-30

    申请号:US11141167

    申请日:2005-05-31

    IPC分类号: B01L3/00

    摘要: A droplet sample holder, especially a sample holder for use in a measuring instrument utilizing surface plasmon resonance. The sample holder reduces or minimizes the measurement distortion result of the droplet “pherpheral concentration effect” by surrounding the analysis zone with a wettable (hydrophilic) zone that captures the periphery of the droplet to keep the pheriphery of the droplet and the increased concentration of the analyte out of the analysis zone. The wettable zone is surrounded by a nonwettable (hydrophobic) zone that restricts the periphery of the droplet to analysis zone and the wettable zone.

    摘要翻译: 液滴样品架,特别是用于使用表面等离子体共振的测量仪器中的样品架。 样品架通过用可捕获液滴的周边的可湿性(亲水性)区围绕分析区来降低或最小化液滴“pherpheral浓度效应”的测量失真结果,以保持液滴的浓度,并且增加浓度 分析出分析区。 可湿润区域被不可润湿(疏水)区域围绕,该区域将液滴的周边限制到分析区域和可湿性区域。

    Wavelength-tuned intensity measurement of surface plasmon resonance sensor
    4.
    发明申请
    Wavelength-tuned intensity measurement of surface plasmon resonance sensor 审中-公开
    表面等离子体共振传感器的波长调谐强度测量

    公开(公告)号:US20050244093A1

    公开(公告)日:2005-11-03

    申请号:US10838790

    申请日:2004-05-03

    CPC分类号: G01N21/553

    摘要: An incident signal illuminates an SPR sensor over a wavelength range. Intensity of a reflected signal from the SPR sensor is detected with wavelength discrimination imposed on the incident signal or the reflected signal. The wavelength discrimination is imposed at a predesignated tuning rate within the wavelength range. The detected intensity is then sampled at a sampling rate and an intensity profile associated with the SPR sensor is established from the sampling with a wavelength resolution determined by the tuning rate and the sampling rate.

    摘要翻译: 入射信号在波长范围内照亮SPR传感器。 通过施加在入射信号或反射信号上的波长鉴别来检测来自SPR传感器的反射信号的强度。 在波长范围内以预定的调谐速率施加波长鉴别。 然后以采样率对检测到的强度进行采样,并从采用由调谐率和采样率确定的波长分辨率的采样建立与SPR传感器相关联的强度分布。

    Optical navigation based on laser feedback or laser interferometry
    5.
    发明申请
    Optical navigation based on laser feedback or laser interferometry 有权
    基于激光反馈或激光干涉测量的光学导航

    公开(公告)号:US20050134556A1

    公开(公告)日:2005-06-23

    申请号:US10741952

    申请日:2003-12-18

    摘要: A computer cursor control device includes (1) a light source generating light directed toward a stationary surface, (2) an optional phase modulator, (3) an optional function generator causing the phase modulator to periodically phase shift the light, and (4) a signal processor determining a direction in which the device is moving from a beat frequency or an asymmetry in the light intensity. Another computer cursor control device includes (1) an optical element combining reference and measurement beams to form a heterodyned beam, (2) a phase modulator located in an optical path of the reference beam or the measurement beam, (3) a function generator causing the phase modulator to phase shift the reference beam, and (4) a signal processor determining a direction in which the device is moving from a beat frequency of the heterodyned beam.

    摘要翻译: 计算机光标控制装置包括:(1)产生朝向静止面的光的光源,(2)任选的相位调制器,(3)使所述相位调制器周期性地相移所述光的可选函数发生器,以及(4) 信号处理器确定设备从拍频或光强度的不对称性移动的方向。 另一个计算机光标控制装置包括(1)组合参考和测量光束以形成外差光束的光学元件,(2)位于参考光束或测量光束的光路中的相位调制器,(3)功能发生器, 所述相位调制器使所述参考光束相移,以及(4)信号处理器确定所述装置从所述外差束的拍频开始移动的方向。

    Nonlinear filtering for events in SPR sensing
    6.
    发明申请
    Nonlinear filtering for events in SPR sensing 有权
    SPR传感事件的非线性滤波

    公开(公告)号:US20060087656A1

    公开(公告)日:2006-04-27

    申请号:US10971604

    申请日:2004-10-22

    IPC分类号: G01N21/55

    CPC分类号: G01N21/553

    摘要: A nonlinear filtering system determines the duration of a designated event in an SPR sensorgram, selects a filter length based on the determined duration of the designated event in the SPR sensorgram, and applies a nonlinear filter, having the selected filter length to the SPR sensorgram, to establish an output signal.

    摘要翻译: 非线性滤波系统确定SPR传感器图中的指定事件的持续时间,基于所确定的SPR传感器图中的指定事件的持续时间来选择滤波器长度,并将具有所选滤波器长度的非线性滤波器应用于SPR传感图, 建立输出信号。

    Parallel interferometric measurements using an expanded local oscillator signal
    8.
    发明申请
    Parallel interferometric measurements using an expanded local oscillator signal 有权
    使用扩展的本地振荡器信号的并行干涉测量

    公开(公告)号:US20050030544A1

    公开(公告)日:2005-02-10

    申请号:US10634358

    申请日:2003-08-05

    CPC分类号: G01M11/331 G01M11/31

    摘要: A system for characterizing optical properties of a device under test (DUT) uses an expanded local oscillator signal to perform multiple parallel interferometric measurements. In one system, the expanded local oscillator signal is optically connected to a lens array. The lens array focuses the expanded swept local oscillator signal into multiple beams. The multiple beams are then used in multiple parallel interferometric measurements. The multiple beams may be used as the reference beams or applied to the DUT and used as the test beams depending on the application. The test beams and reference beams are combined to perform the interferometric measurements. In another system, a portion of the expanded local oscillator signal is applied directly to a DUT as the test beam while another portion of the expanded local oscillator signal is used for the reference beam.

    摘要翻译: 用于表征被测器件(DUT)的光学特性的系统使用扩展的本地振荡器信号来执行多个并行干涉测量。 在一个系统中,扩展的本地振荡器信号被光学连接到透镜阵列。 透镜阵列将扩展的扫频本地振荡器信号聚焦成多个波束。 然后将多个光束用于多个并行干涉测量。 可以将多个光束用作参考光束或施加到DUT并且根据应用用作测试光束。 测试光束和参考光束被组合以执行干涉测量。 在另一个系统中,扩展的本地振荡器信号的一部分被直接施加到DUT作为测试波束,而扩展的本地振荡器信号的另一部分被用于参考波束。

    System and method for self-referenced SPR measurements
    9.
    发明申请
    System and method for self-referenced SPR measurements 有权
    用于自参考SPR测量的系统和方法

    公开(公告)号:US20070046943A1

    公开(公告)日:2007-03-01

    申请号:US11210633

    申请日:2005-08-24

    IPC分类号: G01N21/55

    CPC分类号: G01N21/553 G01N2201/067

    摘要: A system and method of using a refractive index sensor to determine a characteristic of a sample. The operation of the system and method allow for determining a change in a bulk index of the sample, and an amount of sample adsorption, using a reflected beam from an interface of the sensor. An embodiment of a system and method further provide for identifying changes in incident angles determine from reflective measurement data of the sensor, in combination with different proportionality constants of the refractive index sensor to determine a characteristic of the sample.

    摘要翻译: 一种使用折射率传感器来确定样品特征的系统和方法。 系统和方法的操作允许使用来自传感器的界面的反射光束来确定样品的体积指数的变化和样品吸附的量。 系统和方法的实施例进一步提供用于识别入射角度的变化,其根据传感器的反射测量数据,结合折射率传感器的不同比例常数来确定样本的特性。

    Characterization of active and passive optical properties of an optical device

    公开(公告)号:US20050030522A1

    公开(公告)日:2005-02-10

    申请号:US10634952

    申请日:2003-08-05

    摘要: Characterizing active and passive properties of an optical device involves applying a local oscillator signal to a device under test (DUT) and providing a portion of the local oscillator signal (referred to as the reference local oscillator signal) directly to the an optical analyzer. Providing the reference local oscillator signal to the optical analyzer enables interferometric measurements associated with the DUT to be obtained along with direct measurements, where the interferometric measurements result from combining the portion of the local oscillator signal that is applied to the DUT with the reference local oscillator signal. The interferometric measurements are used to characterize passive properties of the DUT while the direct measurements are used to characterize active properties of the DUT.