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公开(公告)号：US20050084213A1
公开(公告)日：2005-04-21
申请号：US10755816
申请日：2004-01-12
申请人： Hendrik Hamann , Sharee McNab , Martin O'Boyle , Yurii Vlasov
发明人： Hendrik Hamann , Sharee McNab , Martin O'Boyle , Yurii Vlasov
CPC分类号： G02B6/1225 , B82Y20/00 , G02B6/26 , G02B6/29353 , G02F1/011 , G02F1/0147 , G02F1/025 , G02F2201/12 , G02F2202/32
摘要： The present invention is a method and an apparatus for thermo-optic control of optical signals using photonic crystal structures. In one embodiment, a first portion of a split signal is modulated by propagating the signal through a photonic crystal waveguide in which two electrical contacts are laterally spaced from the waveguide region by a plurality of apertures formed through the photonic crystal substrate. A voltage applied across the electrical contacts causes resistive heating of the proximate photonic crystal waveguide through which the signal propagates, thereby modulating the temperature relative to an un-modulated second portion of the split signal that is used as a reference.
摘要翻译： 本发明是一种使用光子晶体结构对光信号进行热光控制的方法和装置。 在一个实施例中，通过将信号传播通过光子晶体波导来调制分割信号的第一部分，其中两个电触点与通过光子晶体衬底形成的多个孔与波导区域横向间隔开。 施加在电触点上的电压引起信号传播的邻近光子晶体波导的电阻加热，从而调制相对于用作参考的分离信号的未调制第二部分的温度。
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2.发明申请Method and apparatus for dynamic manipulation and dispersion in photonic crystal devices 有权光子晶体器件动态操作和色散的方法和装置公开(公告)号：US20050196101A1
公开(公告)日：2005-09-08
申请号：US11122152
申请日：2005-05-04
申请人： Hendrik Hamann , Sharee McNab , Martin O'Boyle , Yurii Vlasov
发明人： Hendrik Hamann , Sharee McNab , Martin O'Boyle , Yurii Vlasov
CPC分类号： G02B6/1225 , B82Y20/00 , G02F1/011 , G02F1/0147 , G02F1/025 , G02F2201/12 , G02F2202/32
摘要： The present invention is a method and an apparatus for dynamic manipulation and dispersion in photonic crystal devices. In one embodiment, a photonic crystal structure comprises a substrate having a plurality of apertures formed therethrough, a waveguide formed by “removing” a row of apertures, and a plurality of pairs of lateral electrical contacts, the lateral electrical contact pairs extending along the length of the waveguide in a spaced-apart manner. The lateral electrical contact pairs facilitate local manipulation of the photonic crystal structure's refractive index. Thus, optical signals of different wavelengths that propagate through the photonic crystal structure can be dynamically manipulated.
摘要翻译： 本发明是用于光子晶体器件中的动态操作和分散的方法和装置。 在一个实施例中，光子晶体结构包括具有穿过其中形成的多个孔的基板，通过“移除”一排孔而形成的波导以及多对横向电接触，所述横向电接触对沿着该长度延伸 的波导。 横向电接触对有助于光子晶体结构折射率的局部操纵。 因此，可以动态地操纵传播通过光子晶体结构的不同波长的光信号。
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3.发明申请Method and apparatus for forming lateral electrical contacts for photonic crystal devices 审中-公开用于形成光子晶体器件的横向电触点的方法和装置公开(公告)号：US20050084195A1
公开(公告)日：2005-04-21
申请号：US10686216
申请日：2003-10-15
申请人： Hendrik Hamann , Sharee McNab , Yurii Vlasov
发明人： Hendrik Hamann , Sharee McNab , Yurii Vlasov
CPC分类号： G02F1/011 , B82Y20/00 , G02B6/1225 , G02F1/0147 , G02F1/025 , G02F2201/12 , G02F2202/32
摘要： The present invention is a method an apparatus for forming lateral electrical contacts for photonic crystal based structures. In one embodiment, a photonic crystal structure comprises a substrate having a plurality of apertures formed therethrough, a waveguide formed by “removing” a row of apertures, and a pair of lateral electrical contacts, each spaced a distance away from the waveguide by at least one row of apertures. The optical mode of the waveguide is confined in the lateral direction by the at least one row of apertures. Thus the apertures provide optical isolation for the electrical contacts, which minimizes losses due to absorption of light by the contacts. The contacts may be used to apply voltages for thermo-optic control of the waveguide, for current injection, or for configuring the waveguide as a photodetector, among other applications.
摘要翻译： 本发明是一种用于形成基于光子晶体的结构的横向电触头的装置的方法。 在一个实施例中，光子晶体结构包括具有穿过其形成的多个孔的衬底，通过“移除”一排孔而形成的波导，以及一对侧向电触点，每个远离波导至少离开波导 一排孔。 波导的光学模式通过至少一排孔限制在横向上。 因此，孔为电触点提供光隔离，这使由触点吸收光引起的损耗最小化。 触点可以用于施加用于波导的热光学控制的电压，用于电流注入，或用于将波导配置为光电检测器，以及其他应用。
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公开(公告)号：US20070032979A1
公开(公告)日：2007-02-08
申请号：US11195426
申请日：2005-08-02
IPC分类号： G01K17/00
CPC分类号： G01K1/026 , G01K2213/00
摘要： An apparatus and method for measuring the physical quantities of a data center during operation and method for servicing large-scale computing systems is disclosed. The apparatus includes a cart that supports a plurality of sensors. The cart is moveable within the data center. The sensors capture temperature or other physical parameters within the room. The sensor readings, along with position and orientation information pertaining to the cart are transmitted to a computer system where the data is analyzed to select the optimum temperature or other system environmental parameters for the data center.
摘要翻译： 公开了一种用于在操作期间测量数据中心的物理量的装置和方法以及用于维护大规模计算系统的方法。 该装置包括支撑多个传感器的推车。 购物车可在数据中心内移动。 传感器捕获房间内的温度或其他物理参数。 传感器读数以及与推车相关的位置和方向信息被传送到计算机系统，在该系统中分析数据以选择数据中心的最佳温度或其他系统环境参数。
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5.发明申请Method and system for measuring temperature and power distributions of a device in a package 失效用于测量包装中的装置的温度和功率分布的方法和系统公开(公告)号：US20060039114A1
公开(公告)日：2006-02-23
申请号：US10919692
申请日：2004-08-17
申请人： Hendrik Hamann , James Lacey , Martin O'Boyle , Robert von Gutfeld , Jamil Wakil , Alan Weger
发明人： Hendrik Hamann , James Lacey , Martin O'Boyle , Robert von Gutfeld , Jamil Wakil , Alan Weger
IPC分类号： H05K7/20
CPC分类号： H01L22/34 , H01L23/34 , H01L2924/0002 , H01L2924/00
摘要： A present invention provides real-time temperature and power mapping of fully operating electronic devices. The method utilizes infrared (IR) temperature imaging, while an IR-transparent coolant flows through a specially designed cell directly over the electronic device. In order to determine the chip power distributions the individual temperature fields for each heat source of a given power and size on the chip (as realized by a scanning focused laser beam) are measured under the same cooling conditions. Then the measured chip temperature distribution is represented as a superposition of the temperature fields of these individual heat sources and the corresponding power distribution is calculated with a set of linear equations.
摘要翻译： 本发明提供了完全操作的电子设备的实时温度和功率映射。 该方法利用红外（IR）温度成像，而IR透明冷却剂直接通过电子设备流经专门设计的单元。 为了确定芯片功率分布，在相同的冷却条件下测量芯片上给定功率和尺寸（通过扫描聚焦激光束实现）的每个热源的各个温度场。 然后，测量的芯片温度分布被表示为这些单个热源的温度场的叠加，并且用一组线性方程计算相应的功率分布。
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公开(公告)号：US20050094706A1
公开(公告)日：2005-05-05
申请号：US10699399
申请日：2003-10-30
申请人： Supratik Guha , Hendrik Hamann , James Lacey , Maurice McGlashan-Powell , Martin O'Boyle , Robert von Gutfeld
发明人： Supratik Guha , Hendrik Hamann , James Lacey , Maurice McGlashan-Powell , Martin O'Boyle , Robert von Gutfeld
CPC分类号： G01J5/00 , G01J5/0096 , G01J2005/0077
摘要： A system and method for measuring the thermal distributions of an electronic device during operation is described. In an embodiment of the present invention, the system includes a duct adapted to be coupled with an electronic device and a coolant flowing through the duct so as to cool the electronic device. The duct and the coolant are at least partially transparent to photons with wavelengths between about 0.1 micron to 20 microns. The system further includes a photon detector located adjacent to the duct for detecting photons. The photon detector captures thermal information from the electronic device during operation of the electronic device, wherein the electronic device is operating under conditions for which the electronic device is designed. The system further includes a processor coupled to the photon detector for generating a thermal distribution of the electronic device based on information received from the photon detector.
摘要翻译： 描述了用于测量操作期间电子设备的热分布的系统和方法。 在本发明的一个实施例中，系统包括适于与电子设备耦合的管道和流过管道的冷却剂以冷却电子设备。 管道和冷却剂对波长在约0.1微米至20微米之间的光子至少部分透明。 该系统还包括位于与用于检测光子的管道相邻的光子检测器。 光子检测器在电子设备的操作期间捕获来自电子设备的热信息，其中电子设备在设计电子设备的条件下操作。 该系统还包括耦合到光子检测器的处理器，用于基于从光子检测器接收的信息产生电子设备的热分布。
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7.发明申请公开(公告)号：US20080057719A1
公开(公告)日：2008-03-06
申请号：US11931242
申请日：2007-10-31
IPC分类号： H01L21/302
CPC分类号： H01L21/76892 , H01L21/31111 , H01L21/31116 , H01L21/32134 , H01L21/32135 , H01L29/66742 , H01L29/78684 , Y10S977/855 , Y10S977/857 , Y10S977/89 , Y10S977/891 , Y10S977/892
摘要： A method and apparatus for fabricating or altering a microstructure use means for heating to facilitate a local chemical reaction that forms or alters the submicrostructure.
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8.发明申请Techniques for distributing power in electronic circuits and computer systems 失效在电子电路和计算机系统中分配电力的技术公开(公告)号：US20070098037A1
公开(公告)日：2007-05-03
申请号：US11264968
申请日：2005-11-02
申请人： Hendrik Hamann , James Lacey , Jamil Wakil , Alan Weger
发明人： Hendrik Hamann , James Lacey , Jamil Wakil , Alan Weger
IPC分类号： G01K3/00
CPC分类号： G01K7/42 , G01K7/425 , G01K2215/00
摘要： Techniques for enhancing thermal design of a system having a number of boundary values are provided. A method for such enhancement includes representing thermal response of the system to the boundary values, obtaining at least one constraining parameter, and determining spatial and/or temporal distribution of the boundary values. The thermal response is represented as a superposition of temperature fields associated with given boundary values. The spatial and/or temporal distribution of the boundary values is determined based on the thermal response represented in the representing step, so as to satisfy the constraining parameter. The boundary values can be, for example, power sources, and the at least one constraining parameter can be, for example, a spatial or temporal location of one of the power sources.
摘要翻译： 提供了一种用于增强具有多个边界值的系统的热设计的技术。 用于这种增强的方法包括表示系统对边界值的热响应，获得至少一个约束参数，以及确定边界值的空间和/或时间分布。 热响应表示为与给定边界值相关联的温度场的叠加。 基于代表步骤中表示的热响应来确定边界值的空间和/或时间分布，以满足约束参数。 边界值可以是例如电源，并且至少一个约束参数可以是例如电源之一的空间或时间位置。
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公开(公告)号：US20060042358A1
公开(公告)日：2006-03-02
申请号：US10928396
申请日：2004-08-27
IPC分类号： G01M3/04
摘要： One embodiment of the present method and apparatus for detecting leaks in a fluid cooling system enables a user to rapidly detect fluid leaks in the vicinity of a microprocessor chip or other delicate item. In one embodiment, the invention comprises a detector and a border coupled to the detector and disposed peripherally about a protected item (e.g., the microprocessor chip or other delicate item). In one embodiment, the border is a layered structure that is adapted to complete an electrical circuit with the detector when the border comes into contact with fluid.
摘要翻译： 用于检测流体冷却系统中的泄漏的本方法和装置的一个实施例使得用户能够快速检测微处理器芯片附近或其它微妙物品的流体泄漏。 在一个实施例中，本发明包括检测器和耦合到检测器的边界，并围绕受保护物品（例如，微处理器芯片或其它精细物品）周边设置。 在一个实施例中，边界是分层结构，其适于在边界与流体接触时与检测器完成电路。
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公开(公告)号：US07684666B2
公开(公告)日：2010-03-23
申请号：US11558847
申请日：2006-11-10
申请人： Hendrik Hamann , Yurii A. Vlasov , Fengnian Xia
发明人： Hendrik Hamann , Yurii A. Vlasov , Fengnian Xia
IPC分类号： G02B6/42
CPC分类号： G02B6/12007 , G02B6/2861
摘要： The present invention is a method and an apparatus for tuning an optical delay line. In one embodiment, an optical delay line includes at least one ring resonator in which light is guided or is confined and at least one heater positioned laterally from the ring resonator. The heater produces heat in a localized area, allowing for the tuning of individual delay elements with minimal crosstalk.
摘要翻译： 本发明是用于调整光学延迟线的方法和装置。 在一个实施例中，光学延迟线包括至少一个环形谐振器，其中光被引导或被限制，并且至少一个加热器从环形谐振器横向定位。 加热器在局部区域产生热量，允许以最小的串扰调谐各个延迟元件。
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