Abstract:
A SUBSTRATE AND SOURCE, OF SILICON (SI) OR ALUMINUM (AL), ARE POSITIONED WITHIN A NITROGEN-CONTAINING ATMOSPHERE OF LESS THAN 20 MICRONS. RADIO-FREQUENCY ENERGY IS APPLIED ACROSS THE SUBSTRATE AND SOURCE TO GENERATE A PLASMA CONTAINING SOURCE MATERIAL, AND NITROGEN WHICH REACT SO AS TO DEPOSIT A THIN INSULATING FILM, E.G., OF SILICON NITRIDE (SI3N4) OR ALUMINUM NITRIDE (ALN), RESPECTIVELY, ON THE SUBSTRATE SURFACE. PREFERABLY, THE SUBSTRATE IS MAINTAINED IN EXCESS OF 300*C. DURING THE DEPOSITION PROCESS.
Abstract:
A method of forming a resistive barrier film on an electrically conducting body of an anodizable material through reaction of negative ions with positive ions in a plasma with the positive ions of the anodizable material. A grid of positively charged wires, in the plasma adjacent the anodizable material, absorbs the low energy or cold electrons, while trapping the hot electrons in a potential well of considerable spatial extent, so that the anodization process is speeded up.