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公开(公告)号：US5440130A
公开(公告)日：1995-08-08
申请号：US76138
申请日：1993-06-14
CPC分类号： G01T1/2018 , G01T1/2928 , H01L27/14609 , H01L27/14618 , H01L27/14663 , H04N3/155 , H04N5/32 , H01L2924/0002
摘要： The x-ray imaging system comprises an x-ray source for producing an x-ray beam having an energy of at least 30 kVp and an x-ray detector. The x-ray detector comprises a solid state integrated circuit having a silicon substrate and a plurality of charge storage devices. The detector is responsive to x-rays of at least 30 keV to directly produce free electrons which interact with the charge storage devices.
摘要翻译： x射线成像系统包括用于产生具有至少30kVp的能量的x射线束的x射线源和x射线检测器。 x射线检测器包括具有硅衬底和多个电荷存储装置的固态集成电路。 检测器响应于至少30keV的x射线，以直接产生与电荷存储装置相互作用的自由电子。
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公开(公告)号：US5220170A
公开(公告)日：1993-06-15
申请号：US750273
申请日：1991-08-27
CPC分类号： G01T1/2018 , G01T1/2928 , H01L27/14609 , H01L27/14618 , H01L27/14663 , H04N3/155 , H04N5/32 , H01L2924/0002
摘要： The invention comprises a scintillator for converting impinging x-rays into visible light; a sensor array having two opposed surfaces with a plurality of detectors at one of the surfaces and having the other of the surfaces facing the scintillator; and a plurality of processing circuits facing the one surface and connected to the detectors by bump bonds. Another feature of the invention is a gain stage in close proximity to sensors, which may be MOS capacitors. A single gain stage may be connected to one capacitor or may be connected to several at one time.
摘要翻译： 本发明包括用于将入射的X射线转换成可见光的闪烁体; 传感器阵列，具有两个相对表面，在一个表面上具有多个检测器，并且另一个表面面向闪烁器; 以及面向所述一个表面并且通过凸块接合连接到所述检测器的多个处理电路。 本发明的另一个特征是靠近传感器的增益级，传感器可以是MOS电容器。 单个增益级可以连接到一个电容器，或者可以一次连接到几个。
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公开(公告)号：US20080309321A1
公开(公告)日：2008-12-18
申请号：US11996257
申请日：2006-07-19
IPC分类号： G01R31/28
CPC分类号： G01R21/01
摘要： A distributed RF/microwave power detector for detecting the power of a signal is provided. The distributed RF/microwave power detector includes a power detector on or at least partially embedded in a single substrate. The distributed RF/microwave power detector includes a detection unit that has a distributed amplifier for amplifying the signal and outputting an amplified signal, and a detector for detecting the power of the amplified signal. The distributed RF/microwave power detector further includes at least one additional detection unit cascaded with the first. The additional detection unit includes an additional distributed amplifier for amplifying the amplified signal and outputting a further amplified signal, as well as an additional detector for detecting a power of the further amplified signal. The distributed RF/microwave power detector also includes a multiplexer for multiplexing outputs of the detector and at least one additional detector, each having a dynamic range different from the other.
摘要翻译： 提供了用于检测信号功率的分布式RF /微波功率检测器。 分布式RF /微波功率检测器包括在至少部分地嵌入单个衬底中或至少部分地嵌入在单个衬底中的功率检测器。 分布式RF /微波功率检测器包括具有用于放大信号并输出放大信号的分布式放大器的检测单元和用于检测放大信号功率的检测器。 分布式RF /微波功率检测器还包括与第一级联的至少一个额外的检测单元。 附加检测单元包括用于放大放大信号并输出进一步放大的信号的附加分布式放大器，以及用于检测另外的放大信号的功率的附加检测器。 分布式RF /微波功率检测器还包括多路复用器，用于复用检测器和至少一个附加检测器的输出，每个检测器具有不同于另一个的动态范围。
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公开(公告)号：US07839137B2
公开(公告)日：2010-11-23
申请号：US11996257
申请日：2006-07-19
CPC分类号： G01R21/01
摘要： A distributed RF/microwave power detector for detecting the power of a signal is provided. The distributed RF/microwave power detector includes a power detector on or at least partially embedded in a single substrate. The distributed RF/microwave power detector includes a detection unit that has a distributed amplifier for amplifying the signal and outputting an amplified signal, and a detector for detecting the power of the amplified signal. The distributed RF/microwave power detector further includes at least one additional detection unit cascaded with the first. The additional detection unit includes an additional distributed amplifier for amplifying the amplified signal and outputting a further amplified signal, as well as an additional detector for detecting a power of the further amplified signal. The distributed RF/microwave power detector also includes a multiplexer for multiplexing outputs of the detector and at least one additional detector, each having a dynamic range different from the other.
摘要翻译： 提供了用于检测信号功率的分布式RF /微波功率检测器。 分布式RF /微波功率检测器包括在至少部分地嵌入单个衬底中或至少部分地嵌入在单个衬底中的功率检测器。 分布式RF /微波功率检测器包括具有用于放大信号并输出放大信号的分布式放大器的检测单元和用于检测放大信号功率的检测器。 分布式RF /微波功率检测器还包括与第一级联的至少一个额外的检测单元。 附加检测单元包括用于放大放大信号并输出进一步放大的信号的附加分布式放大器，以及用于检测另外的放大信号的功率的附加检测器。 分布式RF /微波功率检测器还包括多路复用器，用于复用检测器和至少一个附加检测器的输出，每个检测器具有不同于另一个的动态范围。
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公开(公告)号：US07925229B2
公开(公告)日：2011-04-12
申请号：US12109915
申请日：2008-04-25
申请人： William R. Eisenstadt , Robert M. Fox , Jang Sup Yoon , Tao Zhang
发明人： William R. Eisenstadt , Robert M. Fox , Jang Sup Yoon , Tao Zhang
CPC分类号： H03F3/50 , H03F3/24 , H03F3/72 , H03F2200/105 , H03F2203/5031 , H04B17/19 , H04B17/318 , H04B2001/0408
摘要： A self-testing transceiver having an on-chip power detection capability is provided. The self-testing transceiver can include a semiconductor substrate and a transmitter having a high-power amplifier disposed on the substrate. The self-testing transceiver also can include a receiver disposed on the substrate for selectively coupling to an antenna. The self-testing transceiver can further include at least one power detector disposed on the semiconductor substrate for determining a power such as an RMS and/or peak-power of a signal at an internal node of the self-testing transceiver. Additionally, the self-testing transceiver can include a loopback circuit disposed on the substrate.
摘要翻译： 提供具有片上功率检测能力的自检收发器。 自检收发器可以包括半导体衬底和具有设置在衬底上的高功率放大器的发射器。 自检收发器还可以包括布置在衬底上的接收器，用于选择性地耦合到天线。 所述自检收发器还可以包括设置在所述半导体衬底上的至少一个功率检测器，用于确定所述自检收发器的内部节点处的信号的RMS和/或峰值功率的功率。 此外，自检收发器可以包括设置在基板上的环回电路。
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公开(公告)号：US20080191712A1
公开(公告)日：2008-08-14
申请号：US11996913
申请日：2006-07-25
申请人： William R. Eisenstadt , Robert M. Fox , Tao Zhang , Jang Sup Yoon
发明人： William R. Eisenstadt , Robert M. Fox , Tao Zhang , Jang Sup Yoon
IPC分类号： G01R27/28
CPC分类号： G01R27/28 , G01R31/2884
摘要： An embedded s-parameter measurement system for measuring or determining an s-parameter is provided. The system includes an s-parameter test circuit for connecting to a port of a high-frequency multi-port device-under-test (DUT). The s-parameter test circuit includes a directional coupler for sampling a forward signal conveyed to the DUT and for sampling a reverse signal reflected by the DUT. The s-parameter test circuit also includes a peak detector electrically connected to the directional coupler for detecting a magnitude of a signal conveyed to the peak detector by the directional coupler. The s-parameter test circuit further includes a phase detector electrically connected to the directional coupler for determining a phase of a signal conveyed to the phase detector by the directional coupler, and at least one other s-parameter test circuit for connecting to another port of the high-frequency multi-port DUT.
摘要翻译： 提供了一种用于测量或确定s参数的嵌入式s参数测量系统。 该系统包括用于连接到高频多端口被测设备（DUT）端口的s参数测试电路。 s参数测试电路包括定向耦合器，用于对传送到DUT的正向信号进行采样，并对由DUT反射的反向信号进行采样。 s参数测试电路还包括电连接到定向耦合器的峰值检测器，用于检测由定向耦合器传送到峰值检测器的信号的幅度。 s参数测试电路还包括电连接到定向耦合器的相位检测器，用于确定由定向耦合器传送到相位检测器的信号的相位，以及至少一个其它s参数测试电路，用于连接到另一端口 高频多端口DUT。
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公开(公告)号：US07379716B2
公开(公告)日：2008-05-27
申请号：US11088933
申请日：2005-03-24
申请人： William R. Eisenstadt , Robert M. Fox , Jang Sup Yoon , Tao Zhang
发明人： William R. Eisenstadt , Robert M. Fox , Jang Sup Yoon , Tao Zhang
IPC分类号： H04B1/04
CPC分类号： H03F3/50 , H03F3/24 , H03F3/72 , H03F2200/105 , H03F2203/5031 , H04B17/19 , H04B17/318 , H04B2001/0408
摘要： A self-testing transceiver having an on-chip power detection capability is provided. The self-testing transceiver can include a semiconductor substrate and a transmitter having a high-power amplifier disposed on the substrate. The self-testing transceiver also can include a receiver disposed on the substrate for selectively coupling to an antenna. The self-testing transceiver can further include at least one power detector disposed on the semiconductor substrate for determining a power such as an RMS and/or peak-power of a signal at an internal node of the self-testing transceiver. Additionally, the self-testing transceiver can include a loopback circuit disposed on the substrate.
摘要翻译： 提供具有片上功率检测能力的自检收发器。 自检收发器可以包括半导体衬底和具有设置在衬底上的高功率放大器的发射器。 自检收发器还可以包括布置在衬底上的接收器，用于选择性地耦合到天线。 所述自检收发器还可以包括设置在所述半导体衬底上的至少一个功率检测器，用于确定所述自检收发器的内部节点处的信号的RMS和/或峰值功率的功率。 此外，自检收发器可以包括设置在基板上的环回电路。
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公开(公告)号：US07924025B2
公开(公告)日：2011-04-12
申请号：US11996913
申请日：2006-07-25
CPC分类号： G01R27/28 , G01R31/2884
摘要： An embedded s-parameter measurement system for measuring or determining an s-parameter is provided. The system includes an s-parameter test circuit for connecting to a port of a high-frequency multi-port device-under-test (DUT). The s-parameter test circuit includes a directional coupler for sampling a forward signal conveyed to the DUT and for sampling a reverse signal reflected by the DUT. The s-parameter test circuit also includes a peak detector electrically connected to the directional coupler for detecting a magnitude of a signal conveyed to the peak detector by the directional coupler. The s-parameter test circuit further includes a phase detector electrically connected to the directional coupler for determining a phase of a signal conveyed to the phase detector by the directional coupler, and at least one other s-parameter test circuit for connecting to another port of the high-frequency multi-port DUT.
摘要翻译： 提供了一种用于测量或确定s参数的嵌入式s参数测量系统。 该系统包括用于连接到高频多端口被测设备（DUT）端口的s参数测试电路。 s参数测试电路包括定向耦合器，用于对传送到DUT的正向信号进行采样，并对由DUT反射的反向信号进行采样。 s参数测试电路还包括电连接到定向耦合器的峰值检测器，用于检测由定向耦合器传送到峰值检测器的信号的幅度。 s参数测试电路还包括电连接到定向耦合器的相位检测器，用于确定由定向耦合器传送到相位检测器的信号的相位，以及至少一个其它s参数测试电路，用于连接到另一端口 高频多端口DUT。
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公开(公告)号：US20090005103A1
公开(公告)日：2009-01-01
申请号：US12109915
申请日：2008-04-25
申请人： William R. Eisenstadt , Robert M. Fox , Jang Sup Yoon , Tao Zhang
发明人： William R. Eisenstadt , Robert M. Fox , Jang Sup Yoon , Tao Zhang
IPC分类号： H04B7/00
CPC分类号： H03F3/50 , H03F3/24 , H03F3/72 , H03F2200/105 , H03F2203/5031 , H04B17/19 , H04B17/318 , H04B2001/0408
摘要： A self-testing transceiver having an on-chip power detection capability is provided. The self-testing transceiver can include a semiconductor substrate and a transmitter having a high-power amplifier disposed on the substrate. The self-testing transceiver also can include a receiver disposed on the substrate for selectively coupling to an antenna. The self-testing transceiver can further include at least one power detector disposed on the semiconductor substrate for determining a power such as an RMS and/or peak-power of a signal at an internal node of the self-testing transceiver. Additionally, the self-testing transceiver can include a loopback circuit disposed on the substrate.
摘要翻译： 提供具有片上功率检测能力的自检收发器。 自检收发器可以包括半导体衬底和具有设置在衬底上的高功率放大器的发射器。 自检收发器还可以包括布置在衬底上的接收器，用于选择性地耦合到天线。 所述自检收发器还可以包括设置在所述半导体衬底上的至少一个功率检测器，用于确定所述自检收发器的内部节点处的信号的RMS和/或峰值功率的功率。 此外，自检收发器可以包括设置在基板上的环回电路。
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公开(公告)号：US3965531A
公开(公告)日：1976-06-29
申请号：US631053
申请日：1975-11-12
申请人： Robert M. Fox , Gary A. Wize
发明人： Robert M. Fox , Gary A. Wize
IPC分类号： E05D11/08
CPC分类号： E05D11/082 , E05Y2900/531 , Y10T16/54033 , Y10T16/54035
摘要： An infinite position door hold open includes a pair of pivotally interconnected hinge members which are respectively mounted on the door and body. The door mounted hinge member pivotally supports an arcuate link having oppositely facing braking and frictional surfaces, both generated about the pivotal axis of the hinge members. The braking surface is frictionally engageable with a brake pad adjustably mounted on the body mounted hinge member. The engagement of the braking surface with the brake pad is controlled by pivotal movement of a wedging cam relative to the door mounted hinge member between non-wedging limit positions through an intermediate wedging position. The cam has a friction member in constant engagement with the frictional surface of the brake member. Any reversal of the direction of movement of the door relative to the body causes the friction member of the cam to move the cam to the intermediate wedging position and wedge the braking surface of the brake member into frictional engagement with the brake pad.
摘要翻译： 无限位置门保持打开包括分别安装在门和主体上的一对枢转互连的铰链构件。 门安装的铰链构件枢转地支撑具有相对的制动和摩擦表面的弓形连杆，两者都围绕铰链构件的枢转轴线产生。 制动表面与可调节地安装在主体安装的铰链构件上的制动衬片摩擦接合。 通过楔入凸轮相对于门安装的铰链构件在非楔形极限位置之间通过中间楔入位置的枢转运动来控制制动表面与制动衬块的接合。 凸轮具有与制动构件的摩擦表面恒定接合的摩擦构件。 门相对于身体的移动方向的任何反转使得凸轮的摩擦构件将凸轮移动到中间楔入位置，并且将制动构件的制动表面楔块与制动衬块摩擦接合。
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