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公开(公告)号：US20150139722A1
公开(公告)日：2015-05-21
申请号：US14402929
申请日：2013-03-04
Applicant: NHK Spring Co., Ltd.
Inventor： Yoshio Yamada , Kohei Hironaka , Yusman Sugianto , Chee Ping B. Loh , Choon Joo S. Yeow , Teck H. Wong , Xiaojun T. Wang
CPC classification number: H01R12/51 , G01R1/0466 , G01R1/0483 , H01R13/24 , H01R13/46 , H01R33/76 , H05K7/1007 , Y10T403/602
Abstract: A socket attachment structure for attaching a socket to a substrate, the socket including a plurality of contact probes that respectively contact the substrate and a contacted body at both longitudinal direction ends thereof, a probe holder that accommodates and holds therein the plurality of contact probes according to a predetermined pattern, and a holder member provided around the probe holder, includes: a plurality of support members that extend out from a principal plane of the substrate and are respectively inserted through insertion holes provided in the holder member; and a spring member that is attached to the plurality of support members in a state of biasing the holder member placed on the substrate towards the substrate.
Abstract translation: 一种用于将插座连接到基板的插座附接结构，所述插座包括多个接触探针，所述多个接触探针在其两个纵向端部处分别接触所述基板和接触体;探针保持器，其容纳并保持所述多个接触探针， 并且设置在探针保持架周围的保持构件包括：多个支撑构件，其从基板的主面向外延伸，并分别插入穿过设置在保持构件中的插入孔; 以及弹簧构件，其在将放置在基板上的保持构件朝向基板偏压的状态下附接到多个支撑构件。
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公开(公告)号：US11656246B2
公开(公告)日：2023-05-23
申请号：US17848603
申请日：2022-06-24
Applicant: NHK Spring Co., Ltd.
Inventor： Kohei Hironaka , Kazuya Soma
CPC classification number: G01R1/073 , G01R1/0466 , G01R1/06722
Abstract: A probe unit includes: a signal probe configured to receive and output a signal from and to a predetermined circuit structure; a power supply probe configured to supply power to the predetermined circuit structure; a grounding probe configured to supply a ground potential to the predetermined circuit structure; and a conductive probe holder including a plurality of hole portions in which the signal probe, the power supply probe, and the grounding probe are insertable, the plurality of hole portions having a same hole shape as one another, wherein the signal probe, the power supply probe, and the grounding probe inserted into the plurality of hole portions are interchangeable with one another to change an arrangement of the signal probe, the power supply probe, and the grounding probe.
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公开(公告)号：US11320461B2
公开(公告)日：2022-05-03
申请号：US16629147
申请日：2018-07-12
Applicant: NHK Spring Co., Ltd.
Inventor： Kohei Hironaka , Tsuyoshi Inuma , Shuji Takahashi
IPC: G01R1/073 , G01R1/067 , G01R31/28 , H01R13/24 , H01R13/6473
Abstract: A probe unit includes: a plurality of contact probes each of which has one end that is brought into contact with a contacting electrode, the one end being an end in a longitudinal direction; a first ground member connected to an external ground; a second ground member provided around each of the contact probes; a connecting member electrically connected to the first ground member, and electrically connected to one end of the second ground member; and a probe holder configured to hold the contact probes, the first ground member, the second ground member and the connecting member.
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公开(公告)号：US20200225265A1
公开(公告)日：2020-07-16
申请号：US16629147
申请日：2018-07-12
Applicant: NHK Spring Co., Ltd.
Inventor： Kohei Hironaka , Tsuyoshi Inuma , Shuji Takahashi
IPC: G01R1/073 , G01R31/28 , H01R13/6473 , H01R13/24 , G01R1/067
Abstract: A probe unit includes: a plurality of contact probes each of which has one end that is brought into contact with a contacting electrode, the one end being an end in a longitudinal direction; a first ground member connected to an external ground; a second ground member provided around each of the contact probes; a connecting member electrically connected to the first ground member, and electrically connected to one end of the second ground member; and a probe holder configured to hold the contact probes, the first ground member, the second ground member and the connecting member.
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公开(公告)号：US20220317155A1
公开(公告)日：2022-10-06
申请号：US17848603
申请日：2022-06-24
Applicant: NHK Spring Co., Ltd.
Inventor： Kohei Hironaka , Kazuya Soma
Abstract: A probe unit includes: a signal probe configured to receive and output a signal from and to a predetermined circuit structure; a power supply probe configured to supply power to the predetermined circuit structure; a grounding probe configured to supply a ground potential to the predetermined circuit structure; and a conductive probe holder including a plurality of hole portions in which the signal probe, the power supply probe, and the grounding probe are insertable, the plurality of hole portions having a same hole shape as one another, wherein the signal probe, the power supply probe, and the grounding probe inserted into the plurality of hole portions are interchangeable with one another to change an arrangement of the signal probe, the power supply probe, and the grounding probe.
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Patent Agency Ranking
公开(公告)号：US11422156B2
公开(公告)日：2022-08-23
申请号：US16633597
申请日：2018-07-26
Applicant: NHK Spring Co., Ltd.
Inventor： Kohei Hironaka , Kazuya Soma
Abstract: A contact probe includes: a cylindrical pipe member; a collar including a hollow portion and fixed to an inner circumferential side of at least one end in a longitudinal direction of the pipe member; and an inner conductor including a flange configured to abut on a stepped portion formed by the pipe member and the collar, the inner conductor being expandable and contractible along the longitudinal direction and penetrating the pipe member.
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公开(公告)号：US10274517B2
公开(公告)日：2019-04-30
申请号：US15576605
申请日：2017-02-01
Applicant: NHK SPRING CO., LTD.
Inventor： Kohei Hironaka , Kazuya Souma , Satoshi Shoji , Ryosuke Yamaguchi
Abstract: Provided is a conductive probe having a first end portion and a second end portion opposing the first end portion. The first end portion includes first to fourth linear ridges and first to fifth vertexes, and the first to fourth linear ridges are spaced from one another and arranged to form a cross. The first to fourth vertexes are located on an outer circumference of the first end portion and further arranged between the first linear ridge and the second linear ridge, between the second linear ridge and the third linear ridge, between the third linear ridge and the fourth linear ridge, and between the fourth linear ridge and the first linear ridge, respectively.
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公开(公告)号：US11293946B2
公开(公告)日：2022-04-05
申请号：US16618930
申请日：2018-06-14
Applicant: NHK Spring Co., Ltd.
Inventor： Kohei Hironaka , Tsuyoshi Inuma
Abstract: A conductive contactor unit includes: a signal conductive contactor configured to input or output a signal to or from a predetermined circuit structure, the signal conductive contactor including a first plunger, a second plunger, and a spring member; and a conductive contactor holder configured to house the signal conductive contactor used for inputting and outputting the signal to and from the predetermined circuit structure, the conductive contactor holder having a coaxial structure with the signal conductive contactor, and including a holder substrate including an opening configured to allow the signal conductive contactor to be inserted therethrough, a holding member housed in the opening, and including a holding hole configured to hold one or more of the signal conductive contactors, and a stab configured to form a hollow space extending from the holding hole in a direction perpendicular to a central axis of the holding hole.
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公开(公告)号：US20210156887A1
公开(公告)日：2021-05-27
申请号：US16633597
申请日：2018-07-26
Applicant: NHK Spring Co., Ltd.
Inventor： Kohei Hironaka , Kazuya Soma
Abstract: A contact probe includes: a cylindrical pipe member; a collar including a hollow portion and fixed to an inner circumferential side of at least one end in a longitudinal direction of the pipe member; and an inner conductor including a flange configured to abut on a stepped portion formed by the pipe member and the collar, the inner conductor being expandable and contractible along the longitudinal direction and penetrating the pipe member.
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公开(公告)号：US10120011B2
公开(公告)日：2018-11-06
申请号：US15117884
申请日：2015-02-12
Applicant: NHK Spring Co., Ltd.
Inventor： Kohei Hironaka , Takashi Nidaira , Tomohiro Yoneda
Abstract: A test unit according to the present invention includes: a first contact probe contacting with an electrode provided on a front surface of one of contact targets, and contacting with an electrode of the other contact target; a second contact probe contacting with an electrode provided on a back surface of the one of contact targets and contacting with an electrode of a substrate; a first probe holder including a suction holder that sucks and holds the one of contact targets, and accommodating and holding therein the first contact probes; a second probe holder accommodating and holding therein the second contact probes; and a base portion, which is layered over the first probe holder and holds the other contact target at a side thereof layered over the first probe holder; and a gap is formed between the other contact target and the first probe holder.
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