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Patent Agency Ranking
公开(公告)号：US09494617B2
公开(公告)日：2016-11-15
申请号：US13787472
申请日：2013-03-06
Applicant: OmniVision Technologies, Inc.
Inventor： Shih-Duen Lin , Wen-Jen Ho , Chih-Pin Jen , Wei-Feng Lin , Yi-Chang Hsieh
CPC classification number: G01R1/07364 , G01R1/07342 , G01R1/07378 , G01R3/00 , G01R31/311 , Y10T29/49165
Abstract: A probe card for use in testing a wafer and a method of making the probe card include a printed circuit board (PCB) formed with a conductor pattern and a probe head in proximity to the PCB, the probe head defining at least one hole through the probe head, and the probe head being made of an electrically insulating material. At least one conductive pogo pin is disposed respectively in the at least one hole, the pogo pin having a first end electrically connected to the conductor pattern on the PCB. At least one conductive probe pin includes a cantilever portion and a tip portion. The cantilever portion is in contact with and electrically connected to a second end of the pogo pin, and the tip portion is electrically connectable to the wafer to electrically connect the wafer to the conductor pattern on the PCB. The cantilever portion of the probe pin is fixedly attached to the probe head.
Abstract translation: 用于测试晶片的探针卡和制造探针卡的方法包括形成有导体图案的印刷电路板（PCB）和位于PCB附近的探针头，探针头限定至少一个通过 探针头，探针头由电绝缘材料制成。 至少一个导电弹簧针分别设置在至少一个孔中，弹簧销具有电连接到PCB上的导体图案的第一端。 至少一个导电探针包括悬臂部分和尖端部分。 悬臂部分与弹簧销的第二端接触并电连接，并且尖端部分可电连接到晶片以将晶片电连接到PCB上的导体图案。 探针的悬臂部分固定在探头上。
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公开(公告)号：US20140125368A1
公开(公告)日：2014-05-08
申请号：US13671335
申请日：2012-11-07
Applicant: OMNIVISION TECHNOLOGIES, INC.
Inventor： Chih-Pin Jen , Ming-Chang Yang , Sheng-Kuai Yang
Abstract: An apparatus and method for increasing uniformity in light from a light source at a plurality of targets of the light include a plurality of movable aperture elements, locatable between the light source and the targets, each aperture element defining an aperture through which the light passes from the light source to an associated one of the plurality of targets associated with the aperture element along a longitudinal axis of the aperture element. A holder movably holds the plurality of aperture elements, each of the plurality of aperture elements being movable within the holder along the longitudinal axis of the aperture element to change a feature of light incident on the target associated with the aperture element.
Abstract translation: 用于在光的多个目标处增加来自光源的光的均匀性的装置和方法包括可定位在光源和靶之间的多个可移动孔径元件，每个孔径元件限定出光从该孔径穿过的孔 所述光源沿着所述孔元件的纵向轴线与所述孔元件相关联地连接到所述多个靶中的相关联的一个靶。 保持器可移动地保持多个孔元件，多个孔元件中的每一个可沿着孔元件的纵向轴线在保持器内移动，以改变入射在与孔元件相关联的靶上的光的特征。
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公开(公告)号：US09239147B2
公开(公告)日：2016-01-19
申请号：US13671335
申请日：2012-11-07
Applicant: OmniVision Technologies, Inc.
Inventor： Chih-Pin Jen , Ming-Chang Yang , Sheng-Kuai Yang
Abstract: An apparatus and method for increasing uniformity in light from a light source at a plurality of targets of the light include a plurality of movable aperture elements, locatable between the light source and the targets, each aperture element defining an aperture through which the light passes from the light source to an associated one of the plurality of targets associated with the aperture element along a longitudinal axis of the aperture element. A holder movably holds the plurality of aperture elements, each of the plurality of aperture elements being movable within the holder along the longitudinal axis of the aperture element to change a feature of light incident on the target associated with the aperture element.
Abstract translation: 用于在光的多个目标处增加来自光源的光的均匀性的装置和方法包括可定位在光源和靶之间的多个可移动孔径元件，每个孔径元件限定出光从该孔径穿过的孔 所述光源沿着所述孔元件的纵向轴线与所述孔元件相关联地连接到所述多个靶中的相关联的一个靶。 保持器可移动地保持多个孔元件，多个孔元件中的每一个可沿着孔元件的纵向轴线在保持器内移动，以改变入射在与孔元件相关联的靶上的光的特征。
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公开(公告)号：US10775413B2
公开(公告)日：2020-09-15
申请号：US15285731
申请日：2016-10-05
Applicant: OmniVision Technologies, Inc.
Inventor： Chih-Pin Jen , Ming-Chang Yang , Sheng-Kuai Yang
IPC: G01R31/311 , G01R1/073 , G01R3/00
Abstract: A method of increasing uniformity in light from a light source at a plurality of targets of the light includes locating a plurality of movable aperture elements between the light source and the targets. Each aperture element defines an aperture through which the light passes from the light source to an associated one of the plurality of targets associated with the aperture element along a longitudinal axis of the aperture element. The method also includes moving at least one of the aperture elements along its longitudinal axis to change a feature of light incident on the target associated with the aperture element.
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公开(公告)号：US20140125370A1
公开(公告)日：2014-05-08
申请号：US13787472
申请日：2013-03-06
Applicant: OMNIVISION TECHNOLOGIES, INC.
Inventor： Shih-Duen Lin , Wen-Jen Ho , Chih-Pin Jen , Wei-Feng Lin , Yi-Chang Hsieh
CPC classification number: G01R1/07364 , G01R1/07342 , G01R1/07378 , G01R3/00 , G01R31/311 , Y10T29/49165
Abstract: A probe card for use in testing a wafer and a method of making the probe card include a printed circuit board (PCB) formed with a conductor pattern and a probe head in proximity to the PCB, the probe head defining at least one hole through the probe head, and the probe head being made of an electrically insulating material. At least one conductive pogo pin is disposed respectively in the at least one hole, the pogo pin having a first end electrically connected to the conductor pattern on the PCB. At least one conductive probe pin includes a cantilever portion and a tip portion. The cantilever portion is in contact with and electrically connected to a second end of the pogo pin, and the tip portion is electrically connectable to the wafer to electrically connect the wafer to the conductor pattern on the PCB. The cantilever portion of the probe pin is fixedly attached to the probe head.
Abstract translation: 用于测试晶片的探针卡和制造探针卡的方法包括形成有导体图案的印刷电路板（PCB）和位于PCB附近的探针头，探针头限定至少一个通过 探针头，探针头由电绝缘材料制成。 至少一个导电弹簧针分别设置在至少一个孔中，弹簧销具有电连接到PCB上的导体图案的第一端。 至少一个导电探针包括悬臂部分和尖端部分。 悬臂部分与弹簧销的第二端接触并电连接，并且尖端部分可电连接到晶片以将晶片电连接到PCB上的导体图案。 探针的悬臂部分固定在探头上。
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