RECOVERY OF PARTIAL MEMORY DIE
    3.
    发明申请

    公开(公告)号:US20190171506A1

    公开(公告)日:2019-06-06

    申请号:US15834050

    申请日:2017-12-06

    Abstract: A partial memory die is removed from an edge of a wafer such that the partial memory die is missing a portion of the memory structure that was not printed on the wafer. A usable portion of the incomplete memory structure is determined and one or more rectangular zones in the usable portion of the incomplete memory structure are identified. During operation of the memory system, the memory system receives logical addresses for memory operations to be performed on the partial memory die and determines physical addresses that corresponding to the logical addresses. The memory system performs an out of bounds response for a physical address that is on the partial memory die but outside of the one or more rectangular zones. The memory system performs memory operations for physical addresses that are inside the one or more rectangular zones.

    Partial memory die with masked verify

    公开(公告)号:US10276251B1

    公开(公告)日:2019-04-30

    申请号:US15851139

    申请日:2017-12-21

    Abstract: A memory system performs verification when writing to memory. It is possible that the memory system may be missing some components (or components may be otherwise unavailable). To account for missing or unavailable components when performing verification, the memory system uses a pattern of data that includes a mask identifying the missing or unavailable components. The mask is used to force a predetermined result of the verification for the missing or unavailable portions of the memory structure so that results of the verification that correspond to the missing or unavailable components are not counted as errors.

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