OPTICAL INSPECTION DEVICE AND OPTICAL INSPECTION METHOD USING THE SAME

    公开(公告)号:US20240281923A1

    公开(公告)日:2024-08-22

    申请号:US18512425

    申请日:2023-11-17

    Inventor: Hyung Jin LEE

    CPC classification number: G06T3/4038

    Abstract: An optical inspection device includes: an optical inspection main body on which a target substrate is mounted; high-resolution cameras spaced from the target substrate and disposed in the optical inspection main body, where the high-resolution cameras photograph high-resolution images; and an image converter which converts the high-resolution images into a low-resolution image, where the image converter includes a gray uniformizer which adjusts grays of the high-resolution images to allow a gray deviation among the high-resolution images to be equal to or less than a deviation reference value.

    METHOD FOR INSPECTING DISPLAY DEVICE AND METHOD FOR FABRICATING DISPLAY DEVICE

    公开(公告)号:US20210366329A1

    公开(公告)日:2021-11-25

    申请号:US17166445

    申请日:2021-02-03

    Abstract: A method for inspecting a display device includes preparing a target substrate comprising sub-pixels in which light-emitting elements are disposed, dividing each of first regions of the sub-pixels into second regions, obtaining a gray value of each of the second regions, generating a random number using the gray value, calculating a representative value of each of the first regions by reflecting variables in the random number, and summing the representative values of the first regions to calculate a number of light-emitting elements of the sub-pixels.

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