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公开(公告)号:US12148784B2
公开(公告)日:2024-11-19
申请号:US17393855
申请日:2021-08-04
Applicant: Samsung Electronics Co., Ltd.
Inventor: Dae Shik Kim , Min-Sun Keel , Hoon Joo Na , Kang Ho Lee , Kil Ho Lee , Sang Kil Lee , Jung Hyuk Lee , Shin Hee Han
IPC: H01L21/768 , H01L27/146
Abstract: An image sensor including a variable resistance element is provided. The image sensor comprises first and second chips having first and second connecting structures; and a contact plug connecting the first and second chips. The first chip includes a photoelectric conversion element. The second chip includes a first variable resistance element. The contact plug extends from the first surface of the first semiconductor substrate to connect the first and second connecting structures.
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公开(公告)号:US11631711B2
公开(公告)日:2023-04-18
申请号:US17366868
申请日:2021-07-02
Applicant: Samsung Electronics Co., Ltd.
Inventor: Dae Shik Kim , Young Gu Jin
IPC: H01L27/146 , H04N25/771 , H04N25/75 , H04N25/40 , H04N25/76 , H04N25/77
Abstract: An image sensor comprises an upper chip including pixels; and a lower chip placed below the upper chip, wherein a pixel of the pixels includes an optical conversion element configured that light is incident on the optical conversion element, a first storage gate or a first storage node which is electrically connected to the optical conversion element and configured to store electric charge transferred from the optical conversion element during a first time interval, and a second storage gate or a second storage node which is electrically connected to the optical conversion element and configured to store the electric charge transferred from the optical conversion element during a second time interval different from the first time interval, the pixel is configured to generate a first pixel signal on the basis of the electric charge stored in the first storage gate, the lower chip includes a frame buffer.
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公开(公告)号:US11984467B2
公开(公告)日:2024-05-14
申请号:US17368112
申请日:2021-07-06
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Dae Shik Kim , Min-Sun Keel , Sang Kil Lee
IPC: H01L27/146 , H01L25/065 , H10B61/00
CPC classification number: H01L27/14636 , H01L25/0657 , H01L27/1462 , H01L27/14634 , H10B61/00
Abstract: An image sensor includes an upper chip having a pixel array connected to a first connecting structure, and a lower chip below the upper chip and having a second connecting structure connected to the first connecting structure and having first and second stacked metal layers with a same thickness, a third metal layer on the second metal layer and thicker than the second metal layer, a fourth metal layer on the third metal layer and thicker than the third metal layer, first through third insulating layers alternating with the first through fourth metal layers, a first memory device with a first MTJ element in at least one of the first and second insulating layers, and a second memory device with a second MTJ element different from the first MTJ element, the second MTJ element being in at least one of the first through third insulating layers.
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