MEMORY DEVICE INCLUDING REPAIR CIRCUIT AND OPERATING METHOD THEREOF

    公开(公告)号:US20250069682A1

    公开(公告)日:2025-02-27

    申请号:US18665817

    申请日:2024-05-16

    Abstract: A memory device including a repair circuit and an operating method of the memory device are provided. The operating method includes outputting a signal representing a pre-decoded faulty row address based on predecoding a faulty row address, outputting a signal representing a pre-decoded row address based on predecoding a row address, outputting hit signals based on comparing a bit value of the pre-decoded faulty row address with a bit value of the pre-decoded row address, outputting a repair enable signal based on the hit signals, and performing a row repair operation based on the repair enable signal.

    BITLINE SENSE AMPLIFIER AND SEMICONDUCTOR DEVICE INCLUDING THE SAME

    公开(公告)号:US20240371431A1

    公开(公告)日:2024-11-07

    申请号:US18511443

    申请日:2023-11-16

    Abstract: A bitline sense amplifier includes an amplifier circuit having a plurality of PMOS elements and a plurality of NMOS elements, a first switch circuit supplying a first power supply voltage to the plurality of PMOS elements, and a second switch circuit supplying one of a second power supply voltage, lower than the first power supply voltage, a first boost voltage higher than the second power supply voltage, and a second boost voltage, lower than the second power supply voltage, to the plurality of NMOS elements. The second switch circuit sequentially applies the first boost voltage, the second boost voltage, and the second power supply voltage to the plurality of NMOS elements based on an execution of a read operation.

    METHODS OF TESTING REPAIR CIRCUITS OF MEMORY DEVICES

    公开(公告)号:US20240290414A1

    公开(公告)日:2024-08-29

    申请号:US18515681

    申请日:2023-11-21

    CPC classification number: G11C29/44 G11C29/12015 G11C29/24

    Abstract: A method of testing a repair circuit of a memory device. The method may include storing first addresses in a first register of the repair circuit, wherein the first register is configured to store faulty addresses during a normal operation of the memory device, and the repair circuit is configured to perform a repair operation to replace the faulty addresses with redundancy addresses, storing test addresses in a second register of the repair circuit, wherein the test addresses are provided from a test host, outputting hit signals by comparing bit values of the addresses stored in the first register with bit values of the addresses stored in the second register, outputting repair enable signals based on the hit signals, and determining a status of a path where the repair enable signals are generated based on logic levels of the repair enable signals.

    ELECTRONIC DEVICE INCLUDING FLEXIBLE DISPLAY AND CAMERA

    公开(公告)号:US20220182521A1

    公开(公告)日:2022-06-09

    申请号:US17592962

    申请日:2022-02-04

    Abstract: An electronic device is provided that includes a first housing, a second housing configured to be slidable from the first housing, and a main printed circuit board (PCB) disposed inside the first housing and including a processor mounted therein. The electronic device also includes a camera module disposed in the second housing, and a display module. The display module includes a display having a first region exposed externally and a second region within an internal space of the first housing, while in a slide-in state of the second housing. The display module also includes a first flexible PCB (FPCB) connected to the main PCB. At least a portion of the first FPCB is movable as the second housing slides out from the first housing. The camera module is electrically connected to the first FPCB to transmit and receive electrical signals to and from the processor mounted on the main PCB.

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