Semiconductor device including variable resistance memory device

    公开(公告)号:US10319784B2

    公开(公告)日:2019-06-11

    申请号:US15858349

    申请日:2017-12-29

    Abstract: A semiconductor device includes a substrate including a memory cell region and a logic region; a variable resistance memory device on the memory cell region; a logic device on the logic region; a first horizontal bit line extending in a horizontal direction on a surface of the substrate on the memory cell region and electrically connected to the variable resistance memory device; a second horizontal bit line extending in a horizontal direction on the surface of the substrate on the logic region and electrically connected to the logic device; and a vertical bit line electrically connected to the first horizontal bit line and the second horizontal bit line and extending perpendicular to the surface of the substrate.

    Semiconductor device including variable resistance memory device

    公开(公告)号:US10651236B2

    公开(公告)日:2020-05-12

    申请号:US16392969

    申请日:2019-04-24

    Abstract: A semiconductor device includes a substrate including a memory cell region and a logic region; a variable resistance memory device on the memory cell region; a logic device on the logic region; a first horizontal bit line extending in a horizontal direction on a surface of the substrate on the memory cell region and electrically connected to the variable resistance memory device; a second horizontal bit line extending in a horizontal direction on the surface of the substrate on the logic region and electrically connected to the logic device; and a vertical bit line electrically connected to the first horizontal bit line and the second horizontal bit line and extending perpendicular to the surface of the substrate.

    Memory device and memory system having multiple error correction functions, and operating method thereof

    公开(公告)号:US11301319B2

    公开(公告)日:2022-04-12

    申请号:US16575615

    申请日:2019-09-19

    Abstract: A memory system includes a memory cell array including a first memory area and a second memory area, an input/output circuit including input/output lines for transmitting or receiving data bits and parity bits to or from the first and second memory areas, and an error correction circuit including a plurality of sub error correction circuits including a first sub error correction circuit for performing a first error correction operation on first data bits of the first memory area received through the input/output lines, and a second sub error correction circuit for performing a second error correction operation on second data bits of the second memory area received through the input/output lines. The first memory area has a higher bit error rate than the second memory area.

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