Pick and place machine with workpiece motion inspection
    1.
    发明授权
    Pick and place machine with workpiece motion inspection 失效
    采用放置机器进行工件运动检查

    公开(公告)号:US07706595B2

    公开(公告)日:2010-04-27

    申请号:US10978687

    申请日:2004-11-01

    IPC分类号: G06K9/00

    CPC分类号: H05K13/0812

    摘要: Embodiments include measuring motion characteristics of the workpiece through the placement process. Since the component is placed on the workpiece with some force to ensure proper adhesion to the workpiece, some deflection of the workpiece is expected during the placement cycle. The placement force is adjusted to ensure that the component is safely placed into the solder paste or adhesive. Placement force is adjusted through a number of characteristics including: choice of spring tension in the nozzle; the length of the nozzle and the amount of over-travel into the board; the rigidity of the board and design; and the placement of the board support mechanisms. With proper adjustment of these characteristics and parameters, high quality placements onto the workpiece can be ensured.

    摘要翻译: 实施例包括通过放置过程测量工件的运动特性。 由于组件以一定的力放置在工件上,以确保与工件的适当粘合,所以在放置循环期间可以预期工件的一些挠曲。 调整放置力以确保组件安全地放入焊膏或粘合剂中。 放置力通过多种特性进行调整,包括:选择喷嘴中的弹簧张力; 喷嘴的长度和过度进​​入板的量; 板的刚性和设计; 以及电路板支撑机构的放置。 通过适当调整这些特性和参数,可以确保高品质的放置在工件上。

    Image analysis for pick and place machines with in situ component placement inspection
    3.
    发明授权
    Image analysis for pick and place machines with in situ component placement inspection 有权
    具有原位部件放置检查的拾放机的图像分析

    公开(公告)号:US07813559B2

    公开(公告)日:2010-10-12

    申请号:US11131926

    申请日:2005-05-18

    IPC分类号: G06K9/68

    摘要: The present invention includes a method of determining a location of a component on a workpiece. A before-placement standard image is acquired of an intended placement location on a standard workpiece. Then, a standard component is placed upon the standard workpiece and the placement is verified. An after-placement standard image is acquired and a standard difference image is created from the before and after standard images. Then, a before-placement test image is acquired of an intended placement location on the workpiece. A component is then placed upon the workpiece, and after-placement test image is acquired. A test difference image is created from the before and after test images. A first offset is calculated between the before standard difference image and the before test image. Then, the test difference is transformed based on the first offset to generate a difference test image (DTR) that is registered to the standard difference image. The standard difference image is correlated to the registered difference test image (DTR) to generate a registration offset indicative of placement efficacy.

    摘要翻译: 本发明包括确定部件在工件上的位置的方法。 在标准工件上获取预定的放置位置的放置前标准图像。 然后,将标准部件放置在标准工件上并验证放置。 获取后置标准图像,并且从标准图像之前和之后创建标准差分图像。 然后,获取在工件上的预期放置位置的放置前测试图像。 然后将部件放置在工件上,并且获取放置后测试图像。 测试差异图像是从前后测试图像创建的。 在之前的标准差图像和之前的测试图像之间计算第一偏移。 然后,基于第一偏移来变换测试差,以生成被登记到标准差分图像的差分测试图像(DTR)。 标准差图像与登记的差异检验图像(DTR)相关,以产生指示放置效力的登记偏移。

    HIGH SPEED, HIGH RESOLUTION, THREE DIMENSIONAL SOLAR CELL INSPECTION SYSTEM
    4.
    发明申请
    HIGH SPEED, HIGH RESOLUTION, THREE DIMENSIONAL SOLAR CELL INSPECTION SYSTEM 有权
    高速,高分辨率,三维太阳能电池检测系统

    公开(公告)号:US20110069154A1

    公开(公告)日:2011-03-24

    申请号:US12886784

    申请日:2010-09-21

    IPC分类号: H04N7/18 H04N13/02

    摘要: An optical inspection system and method are provided. A workpiece transport moves a workpiece in a nonstop manner. An illuminator includes a light pipe and is configured to provide a first and second strobed illumination field types. First and second arrays of cameras are arranged to provide stereoscopic imaging of the workpiece. The first array of cameras is configured to generate a first plurality of images of the workpiece with the first illumination field and a second plurality of images of the feature with the second illumination field. The second array of cameras is configured to generate a third plurality of images of the workpiece with the first illumination field and a fourth plurality of images of the feature with the second illumination field. A processing device stores at least some of the first, second, third, and fourth pluralities of images and provides the images to an other device.

    摘要翻译: 提供光学检查系统和方法。 工件传送以不间断的方式移动工件。 照明器包括光管并且被配置为提供第一和第二选通照明场类型。 照相机的第一和第二阵列被布置成提供工件的立体成像。 第一阵列相机被配置为利用第一照明场和具有第二照明场的特征的第二多个图像来生成工件的第一多个图像。 第二阵列相机被配置为利用第一照明场和具有第二照明场的特征的第四多个图像来生成工件的第三多个图像。 处理装置存储第一,第二,第三和第四多个图像中的至少一些,并将图像提供给另一个装置。

    Inspection System
    5.
    发明申请
    Inspection System 审中-公开
    检验系统

    公开(公告)号:US20080199068A1

    公开(公告)日:2008-08-21

    申请号:US11972260

    申请日:2008-01-10

    IPC分类号: G06K9/00

    CPC分类号: G01B11/2522 G06T7/521

    摘要: An inspection system for inspecting web printed electronic circuitry includes a strobed illuminator, a detector, a motion encoder, and a processor. The strobed illuminator is adapted to project light through a reticle to project a pattern of light onto an area of the web. The projected light occurs in a pulse sufficiently short to essentially freeze the web motion. The system projects the pattern of light onto the area of the web in at least two different positions of the web each position corresponding to a different phase of the projected light. A detector is adapted to acquire at least two images of the area, each image corresponding to one of the at least two different phases. The motion encoder provides a position output relative to a position of the web. The processor is coupled to the encoder, the illuminator and the detector. The processor is adapted to synchronize the illuminator with the web motion to expose the area of the web. The processor co-sites the at least two images and can construct a height map image with the co-sited images.

    摘要翻译: 用于检查卷筒印刷电子电路的检查系统包括选通照明器,检测器,运动编码器和处理器。 频闪照明器适于通过光罩投射光线,以将光线投射到网的区域上。 投影光以足够短的脉冲发生,从而基本上冻结幅材运动。 该系统将纸的图案在纸幅的至少两个不同位置上投影到纸张的区域上,每个位置对应于投影光的不同相位。 检测器适于获取该区域的至少两个图像,每个图像对应于至少两个不同相位之一。 运动编码器提供相对于幅材位置的位置输出。 处理器耦合到编码器,照明器和检测器。 处理器适于使照明器与幅材运动同步以暴露幅材的区域。 处理器将至少两个图像并置,并且可以构建具有共同图像的高度图图像。

    HIGH SPEED DISTRIBUTED OPTICAL SENSOR INSPECTION SYSTEM
    6.
    发明申请
    HIGH SPEED DISTRIBUTED OPTICAL SENSOR INSPECTION SYSTEM 有权
    高速分布式光传感器检测系统

    公开(公告)号:US20110102575A1

    公开(公告)日:2011-05-05

    申请号:US12940214

    申请日:2010-11-05

    IPC分类号: H04N7/18

    摘要: An electronics assembly line includes a first electronics assembly machine and a second electronics assembly machine. The first electronics assembly machine has a first electronics assembly machine outlet. The second electronics assembly machine has a second electronics assembly machine inlet and outlet. The inlet of the second electronics assembly machine is coupled to the outlet of the first electronics assembly machine by a conveyor. A first optical inspection sensor is disposed over the conveyor before the inlet of the second electronics assembly and is configured to provide first sensor inspection image data relative to a substrate that passes beneath the first optical inspection sensor in a non-stop fashion. A second optical inspection sensor is disposed over the conveyor after the outlet of the second electronics assembly machine and is configured to provide second sensor inspection image data relative to a substrate that passes beneath the second optical inspection sensor in a non-stop fashion. A computer is operably coupled to the first and second optical inspection sensors and is configured to provide an inspection result based upon at least one of the first and second inspection image data.

    摘要翻译: 电子装配线包括第一电子组装机和第二电子组装机。 第一个电子组装机器具有第一电子组装机出口。 第二电子组装机具有第二电子组装机入口和出口。 第二电子组装机的入口通过输送机联接到第一电子组装机的出口。 在第二电子组件的入口之前,第一光学检测传感器设置在输送机之上,并且被配置为相对于以第一光学检测传感器以不间断方式通过的基板提供第一传感器检查图像数据。 在第二电子组装机器的出口之后,第二光学检测传感器设置在传送器上方并且被配置为相对于在第二光学检测传感器下方以不间断的方式通过的基板提供第二传感器检查图像数据。 计算机可操作地耦合到第一和第二光学检测传感器,并且被配置为基于第一和第二检查图像数据中的至少一个提供检查结果。

    HIGH SPEED OPTICAL INSPECTION SYSTEM WITH ADAPTIVE FOCUSING
    7.
    发明申请
    HIGH SPEED OPTICAL INSPECTION SYSTEM WITH ADAPTIVE FOCUSING 有权
    具有自适应聚焦的高速光学检测系统

    公开(公告)号:US20110090333A1

    公开(公告)日:2011-04-21

    申请号:US12939267

    申请日:2010-11-04

    IPC分类号: H04N7/18

    摘要: An optical inspection system for inspecting a substrate is provided. The system includes an array of cameras configured to acquire a plurality of sets of images as the substrate and the array undergo relative motion with respect to each other. At least one focus actuator is operably coupled to each camera of the array of cameras to cause displacement of at least a portion of each camera that affects focus. A substrate range calculator is configured to receive at least portions of images from the array and to calculate range between the array of cameras and the substrate. A controller is coupled to the array of cameras and to the range calculator. The controller is configured to provide a control signal to each of the at least one focus actuator to adaptively focus each camera of the array during the relative motion.

    摘要翻译: 提供了一种用于检查基板的光学检查系统。 该系统包括被配置为获取多组图像作为基板并且阵列相对于彼此经历相对运动的相机阵列。 至少一个聚焦致动器可操作地耦合到相机阵列的每个相机,以引起影响焦点的每个相机的至少一部分的位移。 衬底范围计算器被配置为从阵列接收至少部分图像并计算相机阵列和衬底之间的范围。 控制器耦合到相机阵列和距离计算器。 控制器被配置为向至少一个聚焦致动器中的每一个提供控制信号,以在相对运动期间自适应地对准阵列的每个相机。

    Laser probe for determining distance
    9.
    发明授权
    Laser probe for determining distance 失效
    用于确定距离的激光探头

    公开(公告)号:US4733969A

    公开(公告)日:1988-03-29

    申请号:US904882

    申请日:1986-09-08

    CPC分类号: G01B11/007

    摘要: A laser based optically triggered sensor system is described which can function as a coordinate measuring machine (CMM) probe. With the sensor, a CMM can find the exact location of the surface of a test object without physically having to touch the object. The reflectivity of the laser beam is sensed by a detector pair. The ratio of light on the detector pair is sensed and used to indicate when the probe is in range for a measurement, out of range for the measurement, and when in range, whether the object being sensed is too far or too close from the trigger point of the probe. The system is a plug compatible replacement for existing contact trigger probes currently used on most CMM's.

    摘要翻译: 描述了可以用作坐标测量机(CMM)探针的基于激光的光学触发传感器系统。 使用传感器,CMM可以找到测试对象表面的确切位置,而无需物理触摸对象。 激光束的反射率由检测器对检测。 检测器对上的光的比率被感测并用于指示探针何时在测量的范围内,超出测量的范围,并且在范围内,被检测物体是否与触发器太远或太近 探针点。 该系统是针对当前大多数CMM上使用的现有触点触发探头的插头兼容替代。

    Laser endoscope
    10.
    发明授权

    公开(公告)号:US4589404A

    公开(公告)日:1986-05-20

    申请号:US567800

    申请日:1984-01-03

    摘要: A laser endoscope includes a micro-thin optic cable assembly which may be inserted into a body cavity by micro-surgical or non-surgical procedures. A coherent jacketed fiber optical bundle is provided in the center of the assembly having a diameter of no more than 3.5 mm. with an optical lens system at the distal end for reflecting an image of a portion of the interior of the cavity. A pair of single optical fibers are spirally wound around the cable, each of which has a total diameter including a jacket of approximately 140 microns. One of these fibers carries a laser light beam to the cavity and the other is for redundancy.The proximate end of the optical cable assembly connects to a remote unit wherein a laser diode light source is provided to direct a beam of light into the end of one of the single optical fibers. A TV camera is also provided in the remote unit together with suitable optics for transmitting the image from the optical cable to a viewing screen on the remote unit.