Image analysis for pick and place machines with in situ component placement inspection
    1.
    发明授权
    Image analysis for pick and place machines with in situ component placement inspection 有权
    具有原位部件放置检查的拾放机的图像分析

    公开(公告)号:US07813559B2

    公开(公告)日:2010-10-12

    申请号:US11131926

    申请日:2005-05-18

    IPC分类号: G06K9/68

    摘要: The present invention includes a method of determining a location of a component on a workpiece. A before-placement standard image is acquired of an intended placement location on a standard workpiece. Then, a standard component is placed upon the standard workpiece and the placement is verified. An after-placement standard image is acquired and a standard difference image is created from the before and after standard images. Then, a before-placement test image is acquired of an intended placement location on the workpiece. A component is then placed upon the workpiece, and after-placement test image is acquired. A test difference image is created from the before and after test images. A first offset is calculated between the before standard difference image and the before test image. Then, the test difference is transformed based on the first offset to generate a difference test image (DTR) that is registered to the standard difference image. The standard difference image is correlated to the registered difference test image (DTR) to generate a registration offset indicative of placement efficacy.

    摘要翻译: 本发明包括确定部件在工件上的位置的方法。 在标准工件上获取预定的放置位置的放置前标准图像。 然后,将标准部件放置在标准工件上并验证放置。 获取后置标准图像,并且从标准图像之前和之后创建标准差分图像。 然后,获取在工件上的预期放置位置的放置前测试图像。 然后将部件放置在工件上,并且获取放置后测试图像。 测试差异图像是从前后测试图像创建的。 在之前的标准差图像和之前的测试图像之间计算第一偏移。 然后,基于第一偏移来变换测试差,以生成被登记到标准差分图像的差分测试图像(DTR)。 标准差图像与登记的差异检验图像(DTR)相关,以产生指示放置效力的登记偏移。

    Calibration methods for placement machines incorporating on-head linescan sensing
    2.
    发明授权
    Calibration methods for placement machines incorporating on-head linescan sensing 失效
    结合头部线路的贴片机的校准方法可以感测

    公开(公告)号:US06535291B1

    公开(公告)日:2003-03-18

    申请号:US09589020

    申请日:2000-06-07

    IPC分类号: G01B1114

    摘要: A method of calibrating a pick and place machine having an on-head linescan sensor is disclosed. The calibration includes obtaining z-axis height information of one or more nozzle tips via focus metric methods, including a Fourier transform method and a normalized correlation method. Additionally, other physical characteristics such as linear detector tilt, horizontal scale factor, and vertical scale factor are measured and compensated for in the process of placing the component. Nozzle runout, another physical characteristic, is also measured by a sinusoidal curve fit method, and the resulting Z-height calibration data is used to later place the component.

    摘要翻译: 公开了一种校准具有头部线扫描传感器的拾放机的方法。 校准包括通过焦点度量方法获得一个或多个喷嘴尖端的z轴高度信息,包括傅立叶变换方法和归一化相关方法。 此外,在放置部件的过程中,测量和补偿其他物理特性,例如线性检测器倾斜,水平比例因子和垂直比例因子。 另一种物理特性的喷嘴径流也通过正弦曲线拟合法测量,并且所得到的Z高度校准数据用于稍后放置组件。

    Calibration methods for placement machines incorporating on-head linescan sensing
    3.
    发明授权
    Calibration methods for placement machines incorporating on-head linescan sensing 失效
    结合头部线路的贴片机的校准方法可以感测

    公开(公告)号:US06744499B2

    公开(公告)日:2004-06-01

    申请号:US10337644

    申请日:2003-01-07

    IPC分类号: G01J110

    摘要: A method of calibrating a pick and place machine having an on-head linescan sensor is disclosed. The calibration includes obtaining z-axis height information of one or more nozzle tips via focus metric methods, including a Fourier transform method and a normalized correlation method. Additionally, other physical characteristics such as linear detector tilt, horizontal scale factor, and vertical scale factor are measured and compensated for in the process of placing the component. Nozzle runout, another physical characteristic, is also measured by a sinusoidal curve fit method, and the resulting Z-height calibration data is used to later place the component.

    摘要翻译: 公开了一种校准具有头部线扫描传感器的拾放机的方法。 校准包括通过焦点度量方法获得一个或多个喷嘴尖端的z轴高度信息,包括傅立叶变换方法和归一化相关方法。 此外,在放置部件的过程中,测量和补偿其他物理特性,例如线性检测器倾斜,水平比例因子和垂直比例因子。 另一种物理特性的喷嘴径流也通过正弦曲线拟合法测量,并且所得到的Z高度校准数据用于稍后放置组件。

    HIGH SPEED, HIGH RESOLUTION, THREE DIMENSIONAL PRINTED CIRCUIT BOARD INSPECTION SYSTEM
    4.
    发明申请
    HIGH SPEED, HIGH RESOLUTION, THREE DIMENSIONAL PRINTED CIRCUIT BOARD INSPECTION SYSTEM 审中-公开
    高速,高分辨率,三维印刷电路板检测系统

    公开(公告)号:US20120133920A1

    公开(公告)日:2012-05-31

    申请号:US13309211

    申请日:2011-12-01

    IPC分类号: G01P3/40

    摘要: An optical inspection system includes a printed circuit board (PCB) transport and an illuminator that provides at least a first strobed illumination field. The illuminator includes a light pipe having a first end proximate the PCB, and a second end opposite the first end and spaced from the first end. An array of cameras is configured to digitally image the PCB and to generate a plurality of images of the PCB with the at least first strobed illumination field type. At least one structured light projector is disposed to project structured illumination on the PCB. The at least one array of cameras is configured to digitally image the PCB while the PCB is illuminated with structured light, to provide a plurality of structured light images. A processing device is configured to generate an inspection result as a function of the plurality of images and the plurality of structured light images.

    摘要翻译: 光学检查系统包括印刷电路板(PCB)传输和提供至少第一选通照明场的照明器。 照明器包括具有靠近PCB的第一端的光管和与第一端相对并与第一端间隔开的第二端。 摄像机阵列被配置为对PCB进行数字成像并利用至少第一选通的照明场类型生成PCB的多个图像。 设置至少一个结构化的投光器以将结构化照明投影到PCB上。 所述至少一个相机阵列被配置为在PCB被结构化光照射的同时对PCB进行数字成像,以提供多个结构化的光图像。 处理装置被配置为产生作为多个图像和多个结构光图像的函数的检查结果。

    ON-HEAD COMPONENT ALIGNMENT USING MULTIPLE AREA ARRAY IMAGE DETECTORS
    5.
    发明申请
    ON-HEAD COMPONENT ALIGNMENT USING MULTIPLE AREA ARRAY IMAGE DETECTORS 审中-公开
    使用多区域阵列图像检测器的头部组件对齐

    公开(公告)号:US20100295935A1

    公开(公告)日:2010-11-25

    申请号:US12769151

    申请日:2010-04-28

    IPC分类号: H04N7/18

    CPC分类号: H01L21/681 H05K13/0812

    摘要: A sensor for sensing component offset and orientation when held on a nozzle of a pick and place machine is provided. The sensor includes a plurality of two-dimensional cameras, a backlight illuminator and a controller. Each camera has a field of view that includes a nozzle of the pick and place machine. The backlight illuminator is configured to direct illumination toward the plurality of two-dimensional cameras. The backlight illuminator is positioned on an opposite side of a nozzle from the plurality of two-dimensional cameras. The controller is coupled to the plurality of two-dimensional cameras and the backlight illuminator. The controller is configured to determine offset and orientation information of the component(s) based upon a plurality of backlit shadow images detected by the plurality of two-dimensional cameras. The controller provides the offset and orientation information to a controller of the pick and place machine.

    摘要翻译: 提供了用于在保持在拾放机的喷嘴上时感测部件偏移和取向的传感器。 传感器包括多个二维照相机,背光照明器和控制器。 每个相机具有包括拾取和放置机器的喷嘴的视野。 背光照明器被配置成朝向多个二维照相机引导照明。 背光照明器位于与多个二维照相机的喷嘴相反的一侧。 控制器耦合到多个二维照相机和背光照明器。 控制器被配置为基于由多个二维相机检测到的多个背光阴影图像来确定部件的偏移和取向信息。 控制器向拾取和放置机器的控制器提供偏移和取向信息。

    Method and apparatus for exposure control in light-based measurement
instruments
    6.
    发明授权
    Method and apparatus for exposure control in light-based measurement instruments 失效
    光度测量仪器中曝光控制的方法和装置

    公开(公告)号:US5519204A

    公开(公告)日:1996-05-21

    申请号:US232738

    申请日:1994-04-25

    IPC分类号: G01J1/32 G01J1/44

    摘要: A method and apparatus for nearly instantaneous and wide dynamic range exposure control in light-based measurement instruments. The excess charge drained from a CCD array by anti-blooming circuitry is effectively monitored and distinguished from leakage current. Detection of the drained charge generates a signal to deactivate the light source exposing the CCD array. The exposure control device includes a unique circuit for detecting the operating state of an anti-blooming circuit associated with a CCD array, and a unique laser light driver that ramps up the light intensity of the laser light source in an approximately exponential manner.

    摘要翻译: 一种用于光基测量仪器中几乎瞬时和宽动态范围曝光控制的方法和装置。 通过抗晕电路从CCD阵列排出的过量电荷被有效地监测并与漏电流区分开来。 排出的电荷的检测产生一个信号,以去激活曝光CCD阵列的光源。 曝光控制装置包括用于检测与CCD阵列相关联的防晕电路的操作状态的唯一电路,以及以近似指数的方式使激光光源的光强度上升的独特的激光驱动器。

    Method and apparatus for exposure control in light-based measurement
instruments

    公开(公告)号:US5821527A

    公开(公告)日:1998-10-13

    申请号:US870766

    申请日:1997-05-16

    IPC分类号: G01J1/32 G01J1/44

    摘要: A method and apparatus for nearly instantaneous and wide dynamic range exposure control in light-based measurement instruments. The excess charge drained from a CCD array by anti-blooming circuitry is effectively monitored and distinguished from leakage current. Detection of the drained charge generates a signal to deactivate the light source exposing the CCD array. The exposure control device includes a unique circuit for detecting the operating state of an anti-blooming circuit associated with a CCD array, and a unique laser light driver that ramps up the light intensity of the laser light source in an approximately exponential manner.

    Method and apparatus for exposure control in light-based measurement
instruments
    8.
    发明授权
    Method and apparatus for exposure control in light-based measurement instruments 失效
    光度测量仪器中曝光控制的方法和装置

    公开(公告)号:US5665958A

    公开(公告)日:1997-09-09

    申请号:US587399

    申请日:1996-01-17

    摘要: A method and apparatus for nearly instantaneous and wide dynamic range exposure control in light-based measurement instruments. The excess charge drained from a CCD array by anti-blooming circuitry is effectively monitored and distinguished from leakage current. Detection of the drained charge generates a signal to deactivate the light source exposing the CCD array. The exposure control device includes a unique circuit for detecting the operating state of an anti-blooming circuit associated with a CCD array, and a unique laser light driver that ramps up the light intensity of the laser light source in an approximately exponential manner.

    摘要翻译: 一种用于光基测量仪器中几乎瞬时和宽动态范围曝光控制的方法和装置。 通过抗晕电路从CCD阵列排出的过量电荷被有效地监测并与漏电流区分开来。 排出的电荷的检测产生一个信号,以去激活曝光CCD阵列的光源。 曝光控制装置包括用于检测与CCD阵列相关联的防晕电路的操作状态的唯一电路,以及以近似指数的方式使激光光源的光强度上升的独特的激光驱动器。

    High speed, high resolution, three dimensional solar cell inspection system
    9.
    发明授权
    High speed, high resolution, three dimensional solar cell inspection system 有权
    高速,高分辨率,三维太阳能电池检测系统

    公开(公告)号:US08388204B2

    公开(公告)日:2013-03-05

    申请号:US12886784

    申请日:2010-09-21

    IPC分类号: F21V8/00

    摘要: An optical inspection system and method are provided. A workpiece transport moves a workpiece in a nonstop manner. An illuminator includes a light pipe and is configured to provide a first and second strobed illumination field types. First and second arrays of cameras are arranged to provide stereoscopic imaging of the workpiece. The first array of cameras is configured to generate a first plurality of images of the workpiece with the first illumination field and a second plurality of images of the feature with the second illumination field. The second array of cameras is configured to generate a third plurality of images of the workpiece with the first illumination field and a fourth plurality of images of the feature with the second illumination field. A processing device stores at least some of the first, second, third, and fourth pluralities of images and provides the images to an other device.

    摘要翻译: 提供光学检查系统和方法。 工件传送以不间断的方式移动工件。 照明器包括光管并且被配置为提供第一和第二选通照明场类型。 照相机的第一和第二阵列被布置成提供工件的立体成像。 第一阵列相机被配置为利用第一照明场和具有第二照明场的特征的第二多个图像来生成工件的第一多个图像。 第二阵列相机被配置为利用第一照明场和具有第二照明场的特征的第四多个图像来生成工件的第三多个图像。 处理装置存储第一,第二,第三和第四多个图像中的至少一些,并将图像提供给另一个装置。

    Solder paste inspection system
    10.
    发明授权
    Solder paste inspection system 有权
    焊膏检测系统

    公开(公告)号:US06750899B1

    公开(公告)日:2004-06-15

    申请号:US09524133

    申请日:2000-03-10

    IPC分类号: H04N718

    摘要: A novel inspection system for inspecting an article of manufacture, such as a printed circuit board, is disclosed, where the system includes a strobed illuminator adapted to project light through a reticle so as to project a pattern of light onto an area of the printed circuit board. A board transport responsively positions the board to at least two distinct positions, where each position corresponding to a different phase of the projected light. Also included is a detector adapted to acquire at least two images of the area, each image corresponding to one of the at least two different phases. An encoder monitors the movement of the board and outputs a position output, and a processor connected to the encoder, the board transport, the illuminator and the detector controlledly energizes the illuminator to expose the area as a function of the position output, the processor co-siting the at least two images and constructing a height map image with the co-sited images.

    摘要翻译: 公开了一种用于检查诸如印刷电路板的制品的新型检查系统,其中系统包括频闪照明器,其适用于通过掩模版投射光以将光线投射到印刷电路的区域上 板。 板传输响应地将板定位到至少两个不同的位置,其中每个位置对应于投影光的不同相位。 还包括检测器,其适于获取该区域的至少两个图像,每个图像对应于至少两个不同相中的一个。 编码器监视电路板的移动并输出位置输出,连接到编码器的处理器,电路板传输,照明器和检测器控制地照亮照明器,使位置输出的函数露出该区域,处理器 选择所述至少两个图像并且使用所述共同图像构建高度图图像。