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公开(公告)号:US08564061B2
公开(公告)日:2013-10-22
申请号:US11132151
申请日:2005-05-18
申请人: Walter Rieger , Franz Hirler , Martin Poelzl , Manfred Kotek
发明人: Walter Rieger , Franz Hirler , Martin Poelzl , Manfred Kotek
IPC分类号: H01L29/66
CPC分类号: H01L23/481 , H01L21/76838 , H01L21/76895 , H01L23/485 , H01L2924/0002 , H01L2924/00
摘要: A semiconductor device has elongate plug structures extending in the lateral direction. The plug structures serve as electrical lines in order to enable locally defined lateral current flows within the cell array, within edge regions or logic regions of the semiconductor device.
摘要翻译: 半导体器件具有沿横向方向延伸的细长插塞结构。 插塞结构用作电线,以便能够在半导体器件的边缘区域或逻辑区域内的电池阵列内局部限定的横向电流流动。
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公开(公告)号:US20050269711A1
公开(公告)日:2005-12-08
申请号:US11132151
申请日:2005-05-18
申请人: Walter Rieger , Franz Hirler , Martin Poelzl , Manfred Kotek
发明人: Walter Rieger , Franz Hirler , Martin Poelzl , Manfred Kotek
IPC分类号: H01L21/44 , H01L21/768 , H01L23/485 , H01L23/522 , H01L29/73 , H01L29/78
CPC分类号: H01L23/481 , H01L21/76838 , H01L21/76895 , H01L23/485 , H01L2924/0002 , H01L2924/00
摘要: A semiconductor device has elongate plug structures extending in the lateral direction. The plug structures serve as electrical lines in order to enable locally defined lateral current flows within the cell array, within edge regions or logic regions of the semiconductor device.
摘要翻译: 半导体器件具有沿横向方向延伸的细长插塞结构。 插塞结构用作电线,以便能够在半导体器件的边缘区域或逻辑区域内的电池阵列内局部限定的横向电流流动。
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公开(公告)号:US07186618B2
公开(公告)日:2007-03-06
申请号:US10977118
申请日:2004-10-29
申请人: Martin Pölzl , Franz Hirler , Oliver Häberlen , Manfred Kotek , Walter Rieger
发明人: Martin Pölzl , Franz Hirler , Oliver Häberlen , Manfred Kotek , Walter Rieger
IPC分类号: H01L21/336
CPC分类号: H01L29/7813 , H01L29/402 , H01L29/407 , H01L29/41741 , H01L29/4238 , H01L29/7811
摘要: When fabricating trench power transistor arrangements (1) with active cell array trenches (5) and passive connecting trenches (6), the cell array trenches (5) are provided in greater width than the connecting trenches (6). An auxiliary layer (24) is deposited conformally onto a lower field electrode structure (11) in the cell array trenches (5) and the connecting trenches (6) and is etched back as far as the top edge in the connecting trenches (6), which removes it from the cell array trenches (5). The auxiliary layer (24) allows the gate oxide (20) to be patterned without a complex mask process. An edge trench (7), with an electrode, on the potential of the field electrode structure (11) shields the cell array (3) from a drain potential.
摘要翻译: 当制造具有有源电池阵列沟槽(5)和无源连接沟槽(6)的沟槽功率晶体管布置(1)时,电池阵列沟槽(5)的宽度大于连接沟槽(6)。 辅助层(24)保形地沉积在单元阵列沟槽(5)和连接沟槽(6)中的下部电场结构(11)上并被回蚀到连接沟槽(6)中的顶部边缘, ,其从单元阵列沟槽(5)中移除它。 辅助层(24)允许栅极氧化物(20)被图案化而不需要复杂的掩模工艺。 在场电极结构(11)的电位上具有电极的边缘沟槽(7)将电池阵列(3)与漏极电势屏蔽。
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公开(公告)号:US20050145936A1
公开(公告)日:2005-07-07
申请号:US10977118
申请日:2004-10-29
申请人: Martin Polzl , Franz Hirler , Oliver Haberlen , Manfred Kotek , Walter Rieger
发明人: Martin Polzl , Franz Hirler , Oliver Haberlen , Manfred Kotek , Walter Rieger
IPC分类号: H01L21/336 , H01L29/06 , H01L29/40 , H01L29/417 , H01L29/423 , H01L29/78
CPC分类号: H01L29/7813 , H01L29/402 , H01L29/407 , H01L29/41741 , H01L29/4238 , H01L29/7811
摘要: When fabricating trench power transistor arrangements (1) with active cell array trenches (5) and passive connecting trenches (6), the cell array trenches (5) are provided in greater width than the connecting trenches (6). An auxiliary layer (24) is deposited conformally onto a lower field electrode structure (11) in the cell array trenches (5) and the connecting trenches (6) and is etched back as far as the top edge in the connecting trenches (6), which removes it from the cell array trenches (5). The auxiliary layer (24) allows the gate oxide (20) to be patterned without a complex mask process. An edge trench (7), with an electrode, on the potential of the field electrode structure (11) shields the cell array (3) from a drain potential.
摘要翻译: 当制造具有有源电池阵列沟槽(5)和无源连接沟槽(6)的沟槽功率晶体管布置(1)时,电池阵列沟槽(5)的宽度大于连接沟槽(6)。 辅助层(24)保形地沉积在单元阵列沟槽(5)和连接沟槽(6)中的下部电场结构(11)上并被回蚀到连接沟槽(6)中的顶部边缘, ,其从单元阵列沟槽(5)中移除它。 辅助层(24)允许栅极氧化物(20)被图案化而不需要复杂的掩模工艺。 在场电极结构(11)的电位上具有电极的边缘沟槽(7)将电池阵列(3)与漏极电势屏蔽。
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公开(公告)号:US06528355B2
公开(公告)日:2003-03-04
申请号:US10058526
申请日:2002-01-28
申请人: Franz Hirler , Manfred Kotek , Joost Larik
发明人: Franz Hirler , Manfred Kotek , Joost Larik
IPC分类号: H01L21332
CPC分类号: H01L29/7813 , H01L29/407 , H01L29/42368 , H01L29/511 , H01L29/513 , H01L29/518 , H01L29/7811
摘要: A method for fabricating a trench MOS transistor includes the step of at least partly filling the trench with a conductive material which is isolated from the inner surface of the trench by an insulating layer. The insulating layer has a layer thickness that is larger in the region of the lower end of the trench than at the upper end of the trench.
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公开(公告)号:US06833584B2
公开(公告)日:2004-12-21
申请号:US10165912
申请日:2002-06-10
申请人: Ralf Henninger , Franz Hirler , Manfred Kotek , Joost Larik , Markus Zundel
发明人: Ralf Henninger , Franz Hirler , Manfred Kotek , Joost Larik , Markus Zundel
IPC分类号: H01L2976
CPC分类号: H01L29/7811 , H01L29/407 , H01L29/42368 , H01L29/7397 , H01L29/7813
摘要: A trench power semiconductor component is described which has an edge cell in which an edge trench is provided. The edge trench, at least on an outer side wall, has a thicker insulating layer than an insulating layer of trenches of the cell array. This simple configuration provides a high dielectric strength and is economical to produce.
摘要翻译: 描述了具有其中设置有边缘沟槽的边缘单元的沟槽功率半导体部件。 至少在外侧壁上的边缘沟槽具有比电池阵列的沟槽的绝缘层更厚的绝缘层。 这种简单的结构提供了很高的介电强度并且是经济的。
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公开(公告)号:US06720616B2
公开(公告)日:2004-04-13
申请号:US10027531
申请日:2001-12-26
申请人: Franz Hirler , Manfred Kotek , Joost Larik , Frank Pfirsch
发明人: Franz Hirler , Manfred Kotek , Joost Larik , Frank Pfirsch
IPC分类号: H01L2978
CPC分类号: H01L29/7813 , H01L29/1095 , H01L29/42368
摘要: A trench MOS-transistor includes a body region strengthened by an implantation area that faces the drain region to increase the avalanche resistance.
摘要翻译: 沟槽MOS晶体管包括通过面向漏极区域的注入区域增强的体区,以增加雪崩阻力。
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公开(公告)号:US20050151190A1
公开(公告)日:2005-07-14
申请号:US10987189
申请日:2004-11-12
申请人: Manfred Kotek , Oliver Haberlen , Martin Polzl , Walter Rieger
发明人: Manfred Kotek , Oliver Haberlen , Martin Polzl , Walter Rieger
IPC分类号: H01L21/336 , H01L29/40 , H01L29/417 , H01L29/423 , H01L29/76 , H01L29/78
CPC分类号: H01L29/7813 , H01L29/407 , H01L29/41741 , H01L29/4238 , H01L29/7811
摘要: In the case of the cost-effective method according to the invention for fabricating a power transistor arrangement, a trench power transistor arrangement (1) is fabricated with four patterning planes each containing a lithography step. The power transistor arrangement according to the invention has a cell array (3) with cell array trenches (5) each containing a field electrode structure (11) and a gate electrode structure (10). The field electrode structure (11) is electrically conductively connected to the source metallization (15) by a connection trench (6) in the cell array (3).
摘要翻译: 在根据本发明的用于制造功率晶体管布置的成本有效的方法的情况下,制造具有四个图案平面的沟槽功率晶体管布置(1),每个图案平面包含光刻步骤。 根据本发明的功率晶体管装置具有一个具有单元阵列沟槽(5)的单元阵列(3),每个单元阵列具有场电极结构(11)和栅电极结构(10)。 场电极结构(11)通过电池阵列(3)中的连接沟槽(6)与源极金属化(15)导电连接。
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公开(公告)号:US07250343B2
公开(公告)日:2007-07-31
申请号:US10987189
申请日:2004-11-12
申请人: Manfred Kotek , Oliver Häberlen , Martin Pölzl , Walter Rieger
发明人: Manfred Kotek , Oliver Häberlen , Martin Pölzl , Walter Rieger
IPC分类号: H01L21/336
CPC分类号: H01L29/7813 , H01L29/407 , H01L29/41741 , H01L29/4238 , H01L29/7811
摘要: In the case of the cost-effective method according to the invention for fabricating a power transistor arrangement, a trench power transistor arrangement (1) is fabricated with four patterning planes each containing a lithography step. The power transistor arrangement according to the invention has a cell array (3) with cell array trenches (5) each containing a field electrode structure (11) and a gate electrode structure (10). The field electrode structure (11) is electrically conductively connected to the source metallization (15) by a connection trench (6) in the cell array (3).
摘要翻译: 在根据本发明的用于制造功率晶体管布置的成本有效的方法的情况下,制造具有四个图案平面的沟槽功率晶体管布置(1),每个图案平面包含光刻步骤。 根据本发明的功率晶体管装置具有一个具有单元阵列沟槽(5)的单元阵列(3),每个单元阵列具有场电极结构(11)和栅电极结构(10)。 场电极结构(11)通过电池阵列(3)中的连接沟槽(6)与源极金属化(15)导电连接。
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公开(公告)号:US20090098684A1
公开(公告)日:2009-04-16
申请号:US12246983
申请日:2008-10-07
IPC分类号: H01L21/50
CPC分类号: H01L21/78 , H01L21/6835 , H01L2221/68318 , H01L2221/68331
摘要: A method of fabricating a semiconductor chip includes the providing an adhesive layer on the outer area of the active surface of a device wafer and attaching a rigid body to the active surface by the adhesive layer. The device wafer is thinned by treating the passive surface of the device wafer. A first backing tape is connected to the passive surface of the device wafer. The outer portion of the rigid body is separated from the central portion of the rigid body and the outer portion of the device wafer is separated from the central portion of the device wafer. The central portion of the rigid body, the outer portion of the device wafer and the outer portion of the rigid body are removed from the first backing tape. The device wafer may be diced into semiconductor chips.
摘要翻译: 制造半导体芯片的方法包括在器件晶片的有源表面的外部区域上提供粘合剂层,并通过粘合剂层将刚性体附着到活性表面。 通过处理器件晶片的被动表面来使器件晶片变薄。 第一背衬带连接到器件晶片的被动表面。 刚体的外部与刚体的中心部分分离,并且装置晶片的外部与装置晶片的中心部分分开。 刚性体的中心部分,装置晶片的外部部分和刚体的外部部分从第一背衬带上移除。 器件晶片可以切成半导体芯片。
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