摘要:
The present invention provides a method of manufacturing an integrated circuit including planarizing a semiconductor wafer surface. In one embodiment, the method comprises forming a dielectric layer over a first level having an irregular topography, depositing a sacrificial material over the dielectric layer, and then planarizing the semiconductor wafer surface to a planar surface. More specifically, the dielectric layer forms such that it substantially conforms to the irregular topography of the first level. The sacrificial material is formed to a substantially planar surface over the dielectric layer. Thus, the sacrificial material provides a substantially uniform chemical/mechanical planarization (CMP) process removal rate across the semiconductor wafer surface. In the ensuing step, planarizing the semiconductor wafer surface to a planar surface removes the sacrificial material and a portion of the dielectric layer with a CMP process.
摘要:
A method for making a layout for an interconnect layer of a semiconductor device to facilitate uniformity of planarization during manufacture of the semiconductor device includes determining an active interconnect feature density for each of a plurality of layout regions of the interconnect layout. The method further includes adding dummy fill features to each layout region to obtain a desire density of active interconnect features and dummy fill features to facilitate uniformity of planarization during manufacturing of the semiconductor device. By adding dummy fill features to obtain a desired density of active interconnect features and dummy fill features, dummy fill features are not unnecessarily added, and each layout region has a uniform density.
摘要:
A semiconductor device with an interconnect layer having a plurality of layout regions of active interconnects and dummy fills for uniform planarization. In one embodiment, the device will have at least one interconnect layer with a plurality of layout regions overlying the semiconductor substrate. Each layout region will comprise an active interconnect feature region and a dummy fill feature region adjacent thereto for facilitating uniformity of planarization during manufacturing. Each dummy fill region in each layout region will have a different density with respect to other dummy fill regions in other layout regions, so that the combined density of the active interconnect feature region and the dummy fill feature region in a layout region will be substantially uniform with respect to a similar combined density in each of the other layout regions.
摘要:
A polishing fluid comprising a distributed organic phase and a continuous aqueous phase, each phase comprising at least one complexing agent. The aqueous phase also having abrasive particles dispersed therein. Reaction products generated during polishing interact with the aqueous phase complexing agent to form water soluble metallic complexes, the water soluble metallic complexes diffuse to an organic/water interface where they release complexing agent molecules in the aqueous phase and generate metal ions which interact with the organic phase complexing agent to form organometallic complexes. Further disclosed is a polishing method, a semiconductor device and semiconductor device fabrication method utilizing the polishing fluid.
摘要:
A polishing fluid comprising a distributed organic phase and a continuous aqueous phase, each phase comprising at least one complexing agent. The aqueous phase also having abrasive particles dispersed therein. Reaction products generated during polishing interact with the aqueous phase complexing agent to form water soluble metallic complexes, the water soluble metallic complexes diffuse to an organic/water interface where they release complexing agent molecules in the aqueous phase and generate metal ions which interact with the organic phase complexing agent to form organometallic complexes. Further disclosed is a polishing method, a semiconductor device and semiconductor device fabrication method utilizing the polishing fluid.
摘要:
Various channels containing digital data for CATV services are distributed over the HFC CATV network from the headend. Digital data is modulated on RF sub-carriers within an allocated downstream RF spectrum. The allocated downstream RF spectrum is split such that different parts of the RF spectrum are transmitted by WDM lasers in a transmitter system including an array of such lasers. The transmitter system utilizes WDM to combine different wavelengths from the laser array on the transmitter side and then launches them onto a single fiber. The transmitted optical signals impinge on a single photo device which reproduces the combined RF spectrum at its output.
摘要:
A method for deuterium sintering to improve the hot carrier aging of an integrated circuit includes (a) providing a partially fabricated integrated circuit structure comprising a semiconductor substrate and a dielectric layer formed on at least a portion of the substrate, the dielectric layer having at least one conductive material via plug formed therein and (b) sintering the structure in the presence of a gas comprising deuterium-containing components at high temperatures prior to a metallization layer being deposited on the structure.
摘要:
Techniques and mechanisms for mitigating an overshoot of a supply voltage provided with a voltage regulator (VR). In an embodiment, buck converter functionality of a VR is provided with first circuitry comprising a first inductor and first switch circuits variously coupled thereto. Second circuitry of the VR comprises a second inductor and second switch circuits variously coupled thereto. In response to an indication of a voltage overshoot condition, respective states of the first switch circuits and the second switch circuits are configured to enable a conductive path for dissipating energy with the first inductor, the second inductor, and various ones of the first switch circuits and the second switch circuits. In another embodiment, mitigating the voltage overshoot condition comprises alternately toggling between two different configurations of the second switch circuits.
摘要:
A method and system for managing complex projects uses a framework having workflow maps containing activity blocks that provide detailed, easily accessible information within the framework about the project. The framework links functional groups, their associated activities, and the dependences between activities. The detailed, prescriptive instructions provided at each stage in the process creates in-process quality control, reducing the likelihood of costly mistakes and turnbacks. Implementing the framework as a web-based application allows easy access to the framework as well as data entered into the framework for future analysis, making it easy to identify improvement opportunities in the framework.
摘要:
A method and system for managing complex projects uses a framework having workflow maps containing activity blocks that provide detailed, easily accessible information within the framework about the project. The framework links functional groups, their associated activities, and the dependences between activities. The detailed, prescriptive instructions provided at each stage in the process creates in-process quality control, reducing the likelihood of costly mistakes and turnbacks. Implementing the framework as a web-based application allows easy access to the framework as well as data entered into the framework for future analysis, making it easy to identify improvement opportunities in the framework.