Bidirectional split gate NAND flash memory structure and array, method of programming, erasing and reading thereof, and method of manufacturing
    1.
    发明授权
    Bidirectional split gate NAND flash memory structure and array, method of programming, erasing and reading thereof, and method of manufacturing 有权
    双向分闸门NAND闪存结构和阵列,编程方法,擦除和读取方法以及制造方法

    公开(公告)号:US07544569B2

    公开(公告)日:2009-06-09

    申请号:US11516431

    申请日:2006-09-05

    IPC分类号: H01L21/336

    摘要: A split gate NAND flash memory structure is formed on a semiconductor substrate of a first conductivity type. The NAND structure comprises a first region of a second conductivity type and a second region of the second conductivity type in the substrate, spaced apart from the first region, thereby defining a channel region therebetween. A plurality of floating gates are spaced apart from one another and each is insulated from the channel region. A plurality of control gates are spaced apart from one another, with each control gate insulated from the channel region. Each of the control gate is between a pair of floating gates and is capacitively coupled to the pair of floating gates. A plurality of select gates are spaced apart from one another, with each select gate insulated from the channel region. Each select gate is between a pair of floating gates.

    摘要翻译: 在第一导电类型的半导体衬底上形成分离栅极NAND闪速存储器结构。 NAND结构包括第二导电类型的第一区域和第二导电类型的第二区域,与第一区域间隔开,由此在其间限定沟道区域。 多个浮动栅极彼此间隔开并且各自与沟道区域绝缘。 多个控制栅极彼此间隔开,每个控制栅极与沟道区域绝缘。 每个控制栅极位于一对浮动栅极之间,并且电容耦合到该对浮置栅极。 多个选择栅极彼此间隔开,每个选择栅极与沟道区域绝缘。 每个选择门位于一对浮动门之间。

    Bidirectional split gate NAND flash memory structure and array, method of programming, erasing and reading thereof, and method of manufacturing
    2.
    发明授权
    Bidirectional split gate NAND flash memory structure and array, method of programming, erasing and reading thereof, and method of manufacturing 有权
    双向分闸门NAND闪存结构和阵列,编程方法,擦除和读取方法以及制造方法

    公开(公告)号:US07247907B2

    公开(公告)日:2007-07-24

    申请号:US11134557

    申请日:2005-05-20

    IPC分类号: H01L29/788

    摘要: A split gate NAND flash memory structure is formed on a semiconductor substrate of a first conductivity type. The NAND structure comprises a first region of a second conductivity type and a second region of the second conductivity type in the substrate, spaced apart from the first region, thereby defining a channel region therebetween. A plurality of floating gates are spaced apart from one another and each is insulated from the channel region. A plurality of control gates are spaced apart from one another, with each control gate insulated from the channel region. Each of the control gate is between a pair of floating gates and is capacitively coupled to the pair of floating gates. A plurality of select gates are spaced apart from one another, with each select gate insulated from the channel region. Each select gate is between a pair of floating gates.

    摘要翻译: 在第一导电类型的半导体衬底上形成分离栅极NAND闪速存储器结构。 NAND结构包括第二导电类型的第一区域和第二导电类型的第二区域,与第一区域间隔开,由此在其间限定沟道区域。 多个浮动栅极彼此间隔开并且各自与沟道区域绝缘。 多个控制栅极彼此间隔开,每个控制栅极与沟道区域绝缘。 每个控制栅极位于一对浮动栅极之间,并且电容耦合到该对浮置栅极。 多个选择栅极彼此间隔开,每个选择栅极与沟道区域绝缘。 每个选择门位于一对浮动门之间。

    BIDIRECTIONAL SPLIT GATE NAND FLASH MEMORY STRUCTURE AND ARRAY, METHOD OF PROGRAMMING, ERASING AND READING THEREOF, AND METHOD OF MANUFACTURING
    9.
    发明申请
    BIDIRECTIONAL SPLIT GATE NAND FLASH MEMORY STRUCTURE AND ARRAY, METHOD OF PROGRAMMING, ERASING AND READING THEREOF, AND METHOD OF MANUFACTURING 有权
    双向分割门NAND闪存存储器结构和阵列,编程,擦除和读取方法及其制造方法

    公开(公告)号:US20060273378A1

    公开(公告)日:2006-12-07

    申请号:US11134557

    申请日:2005-05-20

    IPC分类号: H01L29/792

    摘要: A split gate NAND flash memory structure is formed on a semiconductor substrate of a first conductivity type. The NAND structure comprises a first region of a second conductivity type and a second region of the second conductivity type in the substrate, spaced apart from the first region, thereby defining a channel region therebetween. A plurality of floating gates are spaced apart from one another and each is insulated from the channel region. A plurality of control gates are spaced apart from one another, with each control gate insulated from the channel region. Each of the control gate is between a pair of floating gates and is capacitively coupled to the pair of floating gates. A plurality of select gates are spaced apart from one another, with each select gate insulated from the channel region. Each select gate is between a pair of floating gates.

    摘要翻译: 在第一导电类型的半导体衬底上形成分离栅极NAND闪速存储器结构。 NAND结构包括第二导电类型的第一区域和第二导电类型的第二区域,与第一区域间隔开,由此在其间限定沟道区域。 多个浮动栅极彼此间隔开并且各自与沟道区域绝缘。 多个控制栅极彼此间隔开,每个控制栅极与沟道区域绝缘。 每个控制栅极位于一对浮动栅极之间,并且电容耦合到该对浮置栅极。 多个选择栅极彼此间隔开,每个选择栅极与沟道区域绝缘。 每个选择门位于一对浮动门之间。