-
公开(公告)号:US20040232349A1
公开(公告)日:2004-11-25
申请号:US10797364
申请日:2004-03-10
Inventor: Pieter Kruit
IPC: H01J003/26 , H01J003/14
CPC classification number: H01J3/07 , B82Y10/00 , B82Y40/00 , H01J37/063 , H01J37/12 , H01J37/153 , H01J37/3174 , H01J37/3177 , H01J2237/1205 , H01J2237/151 , H01J2237/1536 , H01J2237/26 , H01J2237/31774
Abstract: The invention relates to an apparatus for generating a plurality of charged particle beamlets, comprising a charged particle source for generating a diverging charged particle beam, a converging means for refracting said diverging charged particle beam and a lens array comprising a plurality of lenses, wherein said lens array is located between said charged particle source and said converging means. In this way, it is possible to reduce aberrations of the converging means.
Abstract translation: 本发明涉及一种用于产生多个带电粒子束的装置,包括用于产生发散带电粒子束的带电粒子源,用于折射所述发散带电粒子束的会聚装置和包括多个透镜的透镜阵列,其中所述 透镜阵列位于所述带电粒子源和所述会聚装置之间。 以这种方式,可以减小会聚装置的像差。
-
公开(公告)号:US20080073547A1
公开(公告)日:2008-03-27
申请号:US11545975
申请日:2006-10-10
Applicant: Pieter Kruit
Inventor: Pieter Kruit
IPC: H01J3/14
CPC classification number: H01J3/07 , B82Y10/00 , B82Y40/00 , H01J37/063 , H01J37/12 , H01J37/153 , H01J37/3174 , H01J37/3177 , H01J2237/1205 , H01J2237/151 , H01J2237/1536 , H01J2237/26 , H01J2237/31774
Abstract: The invention relates to an apparatus for generating a plurality of charged particle beamlets, comprising a charged particle source for generating a diverging charged particle beam, a converging means for refracting said diverging charged particle beam and a lens array comprising a plurality of lenses, wherein said lens array is located between said charged particle source and said converging means.In this way, it is possible to reduce aberrations of the converging means.
Abstract translation: 本发明涉及一种用于产生多个带电粒子束的装置,包括用于产生发散带电粒子束的带电粒子源,用于折射所述发散带电粒子束的会聚装置和包括多个透镜的透镜阵列,其中所述 透镜阵列位于所述带电粒子源和所述会聚装置之间。 以这种方式,可以减小会聚装置的像差。
-
公开(公告)号:US07129502B2
公开(公告)日:2006-10-31
申请号:US10797364
申请日:2004-03-10
Applicant: Pieter Kruit
Inventor: Pieter Kruit
IPC: H01J37/04
CPC classification number: H01J3/07 , B82Y10/00 , B82Y40/00 , H01J37/063 , H01J37/12 , H01J37/153 , H01J37/3174 , H01J37/3177 , H01J2237/1205 , H01J2237/151 , H01J2237/1536 , H01J2237/26 , H01J2237/31774
Abstract: The invention relates to an apparatus for generating a plurality of charged particle beamlets, comprising a charged particle source for generating a diverging charged particle beam, a converging means for refracting said diverging charged particle beam and a lens array comprising a plurality of lenses, wherein said lens array is located between said charged particle source and said converging means.In this way, it is possible to reduce aberrations of the converging means.
-
公开(公告)号:US07348567B1
公开(公告)日:2008-03-25
申请号:US11545975
申请日:2006-10-10
Applicant: Pieter Kruit
Inventor: Pieter Kruit
IPC: H01J37/04
CPC classification number: H01J3/07 , B82Y10/00 , B82Y40/00 , H01J37/063 , H01J37/12 , H01J37/153 , H01J37/3174 , H01J37/3177 , H01J2237/1205 , H01J2237/151 , H01J2237/1536 , H01J2237/26 , H01J2237/31774
Abstract: The invention relates to an apparatus for generating a plurality of charged particle beamlets, comprising a charged particle source for generating a diverging charged particle beam, a converging means for refracting said diverging charged particle beam and a lens array comprising a plurality of lenses, wherein said lens array is located between said charged particle source and said converging means.In this way, it is possible to reduce aberrations of the converging means.
Abstract translation: 本发明涉及一种用于产生多个带电粒子束的装置,包括用于产生发散带电粒子束的带电粒子源,用于折射所述发散带电粒子束的会聚装置和包括多个透镜的透镜阵列,其中所述 透镜阵列位于所述带电粒子源和所述会聚装置之间。 以这种方式,可以减小会聚装置的像差。
-
公开(公告)号:US20070029509A1
公开(公告)日:2007-02-08
申请号:US11545976
申请日:2006-10-10
Applicant: Pieter Kruit
Inventor: Pieter Kruit
IPC: G21K5/10
CPC classification number: H01J3/07 , B82Y10/00 , B82Y40/00 , H01J37/063 , H01J37/12 , H01J37/153 , H01J37/3174 , H01J37/3177 , H01J2237/1205 , H01J2237/151 , H01J2237/1536 , H01J2237/26 , H01J2237/31774
Abstract: The invention relates to an apparatus for generating a plurality of charged particle beamlets, comprising a charged particle source for generating a diverging charged particle beam, a converging means for refracting said diverging charged particle beam and a lens array comprising a plurality of lenses, wherein said lens array is located between said charged particle source and said converging means. In this way, it is possible to reduce aberrations of the converging means.
Abstract translation: 本发明涉及一种用于产生多个带电粒子束的装置,包括用于产生发散带电粒子束的带电粒子源,用于折射所述发散带电粒子束的会聚装置和包括多个透镜的透镜阵列,其中所述 透镜阵列位于所述带电粒子源和所述会聚装置之间。 以这种方式,可以减小会聚装置的像差。
-
公开(公告)号:US20070018112A1
公开(公告)日:2007-01-25
申请号:US11527206
申请日:2006-09-25
Applicant: Pieter Kruit
Inventor: Pieter Kruit
CPC classification number: H01J3/07 , B82Y10/00 , B82Y40/00 , H01J37/063 , H01J37/12 , H01J37/153 , H01J37/3174 , H01J37/3177 , H01J2237/1205 , H01J2237/151 , H01J2237/1536 , H01J2237/26 , H01J2237/31774
Abstract: The invention relates to an apparatus for generating a plurality of charged particle beamlets, comprising a charged particle source for generating a diverging charged particle beam, a converging means for refracting said diverging charged particle beam and a lens array comprising a plurality of lenses, wherein said lens array is located between said charged particle source and said converging means. In this way, it is possible to reduce aberrations of the converging means.
-
公开(公告)号:US07569833B2
公开(公告)日:2009-08-04
申请号:US11545976
申请日:2006-10-10
Applicant: Pieter Kruit
Inventor: Pieter Kruit
IPC: H01J37/147
CPC classification number: H01J3/07 , B82Y10/00 , B82Y40/00 , H01J37/063 , H01J37/12 , H01J37/153 , H01J37/3174 , H01J37/3177 , H01J2237/1205 , H01J2237/151 , H01J2237/1536 , H01J2237/26 , H01J2237/31774
Abstract: The invention relates to an apparatus for generating a plurality of charged particle beamlets, comprising a charged particle source for generating a diverging charged particle beam, a converging means for refracting said diverging charged particle beam and a lens array comprising a plurality of lenses, wherein said lens array is located between said charged particle source and said converging means.In this way, it is possible to reduce aberrations of the converging means.
Abstract translation: 本发明涉及一种用于产生多个带电粒子束的装置,包括用于产生发散带电粒子束的带电粒子源,用于折射所述发散带电粒子束的会聚装置和包括多个透镜的透镜阵列,其中所述 透镜阵列位于所述带电粒子源和所述会聚装置之间。 以这种方式,可以减小会聚装置的像差。
-
公开(公告)号:US07391037B2
公开(公告)日:2008-06-24
申请号:US11544980
申请日:2006-10-06
Applicant: Pieter Kruit
Inventor: Pieter Kruit
IPC: H01J37/317 , H01J37/147 , H01J37/26
CPC classification number: H01J3/07 , B82Y10/00 , B82Y40/00 , H01J37/063 , H01J37/12 , H01J37/153 , H01J37/3174 , H01J37/3177 , H01J2237/1205 , H01J2237/151 , H01J2237/1536 , H01J2237/26 , H01J2237/31774
Abstract: The invention relates to an apparatus for generating a plurality of charged particle beamlets, comprising a charged particle source for generating a diverging charged particle beam, a converging means for refracting said diverging charged particle beam and a lens array comprising a plurality of lenses, wherein said lens array is located between said charged particle source and said converging means.In this way, it is possible to reduce aberrations of the converging means.
-
公开(公告)号:US07365338B2
公开(公告)日:2008-04-29
申请号:US11527206
申请日:2006-09-25
Applicant: Pieter Kruit
Inventor: Pieter Kruit
IPC: H01J37/04
CPC classification number: H01J3/07 , B82Y10/00 , B82Y40/00 , H01J37/063 , H01J37/12 , H01J37/153 , H01J37/3174 , H01J37/3177 , H01J2237/1205 , H01J2237/151 , H01J2237/1536 , H01J2237/26 , H01J2237/31774
Abstract: The invention relates to an apparatus for generating a plurality of charged particle beamlets, comprising a charged particle source for generating a diverging charged particle beam, a converging means for refracting said diverging charged particle beam and a lens array comprising a plurality of lenses, wherein said lens array is located between said charged particle source and said converging means.In this way, it is possible to reduce aberrations of the converging means.
-
公开(公告)号:US20070029499A1
公开(公告)日:2007-02-08
申请号:US11544980
申请日:2006-10-06
Applicant: Pieter Kruit
Inventor: Pieter Kruit
IPC: H01J3/14
CPC classification number: H01J3/07 , B82Y10/00 , B82Y40/00 , H01J37/063 , H01J37/12 , H01J37/153 , H01J37/3174 , H01J37/3177 , H01J2237/1205 , H01J2237/151 , H01J2237/1536 , H01J2237/26 , H01J2237/31774
Abstract: The invention relates to an apparatus for generating a plurality of charged particle beamlets, comprising a charged particle source for generating a diverging charged particle beam, a converging means for refracting said diverging charged particle beam and a lens array comprising a plurality of lenses, wherein said lens array is located between said charged particle source and said converging means. In this way, it is possible to reduce aberrations of the converging means.
-
-
-
-
-
-
-
-
-