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公开(公告)号:US20230067587A1
公开(公告)日:2023-03-02
申请号:US17460200
申请日:2021-08-28
发明人: Sung-Hsin Yang , Jung-Chi Jeng , Ru-Shang Hsiao
IPC分类号: H01L27/06 , H01L27/092 , H01L29/66 , H01L29/423 , H01L29/40 , H01L21/8238
摘要: A semiconductor device includes a semiconductor substrate. The semiconductor device includes a first three-dimensional semiconductor structure of a first conductivity type protruding from a surface of the semiconductor substrate. The semiconductor device includes a second three-dimensional semiconductor structure of a second conductivity type protruding from the surface of the semiconductor substrate. The semiconductor device includes a first transistor having a first source/drain structure formed in the first three-dimensional semiconductor structure, a second source/drain structure formed in the second three-dimensional semiconductor structure, a first gate structure straddling a first portion of the first three-dimensional semiconductor structure and a first portion of the second three-dimensional semiconductor structure, and a second gate structure straddling a second portion of the second three-dimensional semiconductor structure.
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92.
公开(公告)号:US20230067527A1
公开(公告)日:2023-03-02
申请号:US17460859
申请日:2021-08-30
发明人: Wei-Chen CHU , Chia-Tien WU , Chia-Wei SU , Yu-Chieh LIAO , Chia-Chen LEE , Hsin-Ping CHEN , Shau-Lin SHUE
IPC分类号: H01L23/522 , H01L23/532 , H01L21/768
摘要: A semiconductor structure includes a substrate, a dielectric layer, a first conductive feature and a second conductive feature. The substrate includes a semiconductor device. The dielectric layer is disposed on the substrate. The first conductive feature is formed in the first dielectric layer. The second conductive feature penetrates the first conductive feature and the dielectric layer, and is electrically connected to the first conductive feature and the semiconductor device.
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公开(公告)号:US20230067311A1
公开(公告)日:2023-03-02
申请号:US17459818
申请日:2021-08-27
发明人: Chih-Yu LAI , Chih-Liang CHEN , Li-Chun TIEN
IPC分类号: H01L23/528 , H01L27/092 , H01L29/06 , H01L29/423 , H01L29/775 , H01L29/786 , H01L21/02 , H01L21/8238 , H01L29/66
摘要: An integrated circuit device includes a first-type active-region semiconductor structure, a second-type active-region semiconductor structure stacked with the first-type active-region semiconductor structure, a front-side power rail in a front-side conductive layer, and a back-side power rail in a back-side conductive layer. The integrated circuit device also includes a source conductive segment intersecting the first-type active-region semiconductor structure at a source region of a transistor, a back-side power node in the back-side conductive layer, and a top-to-bottom via-connector. The source conductive segment is conductively connected to the front-side power rail through a front-side terminal via-connector. The top-to-bottom via-connector is connected between the source conductive segment and the back-side power node
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公开(公告)号:US20230067299A1
公开(公告)日:2023-03-02
申请号:US17461308
申请日:2021-08-30
发明人: MING CHYI LIU , CHUN-TSUNG KUO
IPC分类号: H01L49/02
摘要: A semiconductor structure includes a substrate, at least one dielectric layer and a capacitor structure. The at least one dielectric layer is disposed over the substrate, and the at least one dielectric layer includes a step edge profile. The capacitor structure is disposed over the substrate. The capacitor structure includes a bottom electrode, a capacitor dielectric layer and a top electrode. The bottom electrode covers the step edge profile of the at least one dielectric layer and has a first step profile substantially conformal to the step edge profile of the at least one dielectric layer. The capacitor dielectric layer covers the bottom electrode and has a second step profile substantially conformal to the first step profile. The top electrode covers the capacitor dielectric layer.
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公开(公告)号:US20230067210A1
公开(公告)日:2023-03-02
申请号:US17463507
申请日:2021-08-31
发明人: HSING-I TSAI , FU-HUAN TSAI , CHIA-CHUNG CHEN , HSIAO-CHUN LEE , CHI-FENG HUANG , CHO-YING LU , VICTOR CHIANG LIANG
摘要: A semiconductor structure includes a gate structure, a source region, a drain region, and an isolation structure. The gate structure includes a first portion, a second portion and a third portion. The first portion extends in a first direction, and the second portion and the third portion extend in a second direction. The second portion and the third portion are disposed at opposite ends of the first portion. The source region and the drain region are separated by the gate structure. The isolation structure surrounds the gate structure, the source region and the drain region. The first portion has a first sidewall, the second portion has a second sidewall, and the third portion has a third sidewall. The first sidewall, the second sidewall and the third sidewall are parallel to the first direction and aligned with each other to form a straight line.
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公开(公告)号:US20230067140A1
公开(公告)日:2023-03-02
申请号:US17463172
申请日:2021-08-31
发明人: Chien-Ying CHEN , Yao-Jen YANG
IPC分类号: H01L27/112 , G06F30/392
摘要: A one-time programmable (OTP) bit cell includes a substrate including a front side and a back side, an active area on the front side, a first read transistor including a first gate and a first portion of the active area intersected by the first gate, a program transistor including a second gate and a second portion of the active area intersected by the second gate, a first electrical connection to the first gate, a second electrical connection to the second gate, and a third electrical connection to the active area. At least one of the first, second, or third electrical connections includes a metal line positioned on the back side.
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公开(公告)号:US20230066968A1
公开(公告)日:2023-03-02
申请号:US17460346
申请日:2021-08-30
发明人: Tzu-Sung Huang , Ming-Hung Tseng , Yen-Liang Lin , Ban-Li Wu , Hsiu-Jen Lin , Teng-Yuan Lo , Hao-Yi Tsai
IPC分类号: H01L23/31 , H01L23/367 , H01L23/498 , H01L21/56
摘要: A semiconductor package includes a semiconductor device, an encapsulating material, a redistribution structure, and an adhesive residue. The encapsulating material encapsulates a first part of a side surface of the semiconductor device. The redistribution structure is disposed over the semiconductor device and a first side of the encapsulating material. The adhesive residue is disposed over a second side of the encapsulating material opposite to the first side and surrounding the semiconductor device, wherein the adhesive residue encapsulates a second part of the side surface of the semiconductor device.
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公开(公告)号:US20230066861A1
公开(公告)日:2023-03-02
申请号:US17460978
申请日:2021-08-30
发明人: Cheng-Chin LEE , Hsiao-Kang CHANG , Ting-Ya LO , Chi-Lin TENG , Cherng-Shiaw TSAI , Shao-Kuan LEE , Kuang-Wei YANG , Hsin-Yen HUANG , Shau-Lin SHUE
IPC分类号: H01L21/768 , H01L23/522
摘要: A method for forming an interconnect structure is described. In some embodiments, the method includes forming a conductive layer, removing portions of the conductive layer to form a via portion extending upward from a bottom portion, forming a sacrificial layer over the via portion and the bottom portion, recessing the sacrificial layer to a level substantially the same or below a level of a top surface of the bottom portion, forming a first dielectric material over the via portion, the bottom portion, and the sacrificial layer, and removing the sacrificial layer to form an air gap adjacent the bottom portion.
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公开(公告)号:US20230066752A1
公开(公告)日:2023-03-02
申请号:US17462505
申请日:2021-08-31
发明人: Yu-Sheng LIN , Shu-Shen YEH , Chin-Hua WANG , Po-Yao LIN , Shin-Puu JENG
IPC分类号: H01L21/56 , H01L23/31 , H01L23/58 , H01L23/498 , H01L23/00 , H01L25/065
摘要: A semiconductor die package and a method of forming the same are provided. The semiconductor die package includes a package substrate, an interposer substrate over the package substrate, two semiconductor dies over the interposer substrate, and an underfill element formed over the interposer substrate and surrounding the semiconductor dies. A ring structure is disposed over the package substrate and surrounds the semiconductor dies. Recessed parts are recessed from the bottom surface of the ring structure. The recessed parts include multiple first recessed parts arranged in each corner area of the ring structure and two second recessed parts arranged in opposite side areas of the ring structure and aligned with a portion of the underfill element between the semiconductor dies. An adhesive layer is interposed between the bottom surface of the ring structure and the package substrate.
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100.
公开(公告)号:US20230066449A1
公开(公告)日:2023-03-02
申请号:US17460327
申请日:2021-08-30
发明人: Chih-Piao Chuu , Tse-An Chen
IPC分类号: H01L29/205 , H01L29/04 , H01L29/16 , H01L21/02
摘要: A transistor includes a channel layer, a gate stack, and source/drain regions. The channel layer includes a graphene layer and hexagonal boron nitride (hBN) flakes dispersed in the graphene layer. Orientations of the hBN flakes are substantially aligned. The gate stack is over the channel layer. The source/drain regions are aside the gate stack.
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