Method for operating a primary beam stop
    91.
    发明授权
    Method for operating a primary beam stop 有权
    操作主梁停止的方法

    公开(公告)号:US07295650B2

    公开(公告)日:2007-11-13

    申请号:US11522382

    申请日:2006-09-18

    CPC classification number: G01N23/201

    Abstract: A method for operating an X-ray or neutron-optical system and beam stop comprising an X-ray or neutron source (1) from which corresponding radiation is guided as a primary beam (2) to a sample (4) under investigation, with an X-ray or neutron detector (6) for receiving radiation diffracted or scattered from the sample (4), wherein the source (1), the sample and the detector are disposed substantially on one line (=z-axis) and wherein a beam stop (5; 31; 41) is provided between the sample and the detector whose cross-sectional shape is adjusted to the cross-section of the primary beam is characterized in that the beam stop is disposed to be displaceable along the z-direction for optimum adjustment of the amounts of useful and interfering radiation impinging on the detector. This protects the detector from the influence of the primary beam while allowing a maximum amount of diffracted or scattered radiation to reach the detector, wherein the beam stop can be easily adjusted to temporally changing properties of the beam optics.

    Abstract translation: 一种用于操作X射线或中子光学系统和光束停止的方法,其包括X射线或中子源(1),相应的辐射从该射线或中子源(1)被引导为被调查的样品(4)作为主光束(2), 用于接收从样品(4)衍射或散射的辐射的X射线或中子检测器(6),其中源(1),样品和检测器基本上设置在一条线(= z轴)上,其中a 在样品和检测器之间设置有横梁挡块(5; 31; 41),其横截面形状被调整到主梁的横截面,其特征在于,梁挡块被设置成可沿着z方向 以便最佳地调节入射到检测器上的有用和干扰辐射的量。 这保护了检测器免受主光束的影响,同时允许最大量的衍射或散射辐射到达检测器,其中光束停止可以容易地调整到时间上改变光束光学器件的特性。

    Methods and systems for determining the average atomic number and mass of materials
    92.
    发明授权
    Methods and systems for determining the average atomic number and mass of materials 有权
    用于确定材料的平均原子数和质量的方法和系统

    公开(公告)号:US07286638B2

    公开(公告)日:2007-10-23

    申请号:US11177758

    申请日:2005-07-08

    CPC classification number: G01N23/20 G01N23/04 G01N23/20083 G01N23/201

    Abstract: Disclosed herein are methods and systems of scanning a target for potential threats using the energy spectra of photons scattered from the target to determine the spatial distributions of average atomic number and/or mass in the target. An exemplary method comprises: illuminating each of a plurality of voxels of the target with a photon beam; determining an incident flux upon each voxel; measuring the energy spectrum of photons scattered from the voxel; determining, using the energy spectrum, the average atomic number in the voxel; and determining the mass in the voxel using the incident flux, the average atomic number of the material in the voxel, the energy spectrum, and a scattering kernel corresponding to the voxel. An exemplary system may use threat detection heuristics to determine whether to trigger further action based upon the average atomic number and/or mass of the voxels.

    Abstract translation: 本文公开了使用从目标散射的光子的能谱对潜在威胁进行扫描的方法和系统,以确定目标中平均原子数和/或质量的空间分布。 一种示例性方法包括:用光子束照射目标的多个体素中的每一个; 确定每个体素的入射通量; 测量从体素散射的光子的能谱; 使用能谱确定体素中的平均原子数; 并且使用入射磁通量确定体素中的质量,体素中的材料的平均原子数,能谱和对应于体素的散射核。 示例性系统可以使用威胁检测启发式来确定是否基于体素的平均原子数和/或质量触发进一步的动作。

    Collimator fabrication
    93.
    发明申请
    Collimator fabrication 有权
    准直器制造

    公开(公告)号:US20070181821A1

    公开(公告)日:2007-08-09

    申请号:US11732237

    申请日:2007-04-03

    Applicant: James Pinchot

    Inventor: James Pinchot

    Abstract: A collimator that formed from a plurality of metal layers that are shaped by use of lithographic techniques in specific shapes. The formed metal layers are stacked and aligned together and then connected together to form the collimator.

    Abstract translation: 由通过使用特定形状的光刻技术成形的多个金属层形成的准直器。 形成的金属层被堆叠并对齐在一起,然后连接在一起以形成准直器。

    Non-intrusive container inspection system using forward-scattered radiation
    94.
    发明申请
    Non-intrusive container inspection system using forward-scattered radiation 审中-公开
    使用前向散射辐射的非侵入式集装箱检验系统

    公开(公告)号:US20060256914A1

    公开(公告)日:2006-11-16

    申请号:US11273585

    申请日:2005-11-14

    Abstract: A non-intrusive container inspection system, including apparatuses and methods, for non-intrusively scanning and inspecting containers employed to transport items therewithin that utilizes forward-scattered bremsstrahlung, or x-rays, for generating multi-plane images of items present within the containers and for distinguishing between multiple materials present in such items. The system is adapted to direct a pulsed bremsstrahlung, or x-ray, beam having multiple spectra in a substantially single direction at a container being scanned and to produce data that corresponds to portions of the beam that either pass through items within the container without being scattered or that are forward-scattered by items within the container. The system employs a detector array having sections specially configured and oriented to receive and produce data corresponding to the non-scattered and forward-scattered portions of the beam.

    Abstract translation: 一种非侵入式容器检查系统,包括用于非侵入式扫描和检查用于在其中运输物品的装置和方法,其中使用前向散射的bre致辐射或x射线来产生存在于容器内的物品的多平面图像 并用于区分这些物品中存在的多种材料。 该系统适于在被扫描的容器上以基本上单一方向引导具有多个光谱的脉冲bre致辐射束或X射线束,并且产生对应于通过容器内的物品的束的部分的数据,而不是 分散或由容器内的物品向前散射。 该系统采用具有专门配置和定向的部分的检测器阵列,以接收和产生对应于波束的非散射和前向散射部分的数据。

    Non-uniform density sample analyzing method, device and system
    95.
    发明授权
    Non-uniform density sample analyzing method, device and system 有权
    不均匀密度样品分析方法,装置和系统

    公开(公告)号:US07116755B2

    公开(公告)日:2006-10-03

    申请号:US10482022

    申请日:2002-06-17

    Applicant: Kazuhiko Omote

    Inventor: Kazuhiko Omote

    CPC classification number: G01N23/20 G01N23/201 G01N23/203

    Abstract: A non-uniform density sample analyzing method for analyzing a distribution state of particle-like matter in a non-uniform density sample, where an actually measured X-ray scattering curve is an in-plane X-ray scattering curve obtained by in-plane diffraction measurement, and fitting between the in-plane X-ray scattering curve and the simulated X-ray scattering curve is performed. The value of the fitting parameter when the simulated X-ray scattering curve agrees with the in-plane X-ray scattering curve serves to indicate the in-plane direction distribution sate of the particle-like matter in the non-uniform density sample. This method can analyze the in-plane direction distribution state of the particle-like matter in the anisotropic non-uniform density sample easily and accurately. Its device and system are also disclosed.

    Abstract translation: 用于分析非均匀密度样品中的颗粒状物质的分布状态的非均匀密度样品分析方法,其中实际测量的X射线散射曲线是通过平面内获得的平面内X射线散射曲线 衍射测量,并且在平面内X射线散射曲线和模拟的X射线散射曲线之间进行拟合。 当模拟X射线散射曲线与平面内X射线散射曲线一致时,拟合参数的值用于表示非均匀密度样品中颗粒状物质的面内方向分布状态。 该方法可以方便,准确地分析各向异性密度样品中颗粒状物质的面内方向分布状态。 其设备和系统也被公开。

    Method of evaluating ion-exchange film, method of evaluating organic sample and X-ray measuring apparatus
    96.
    发明授权
    Method of evaluating ion-exchange film, method of evaluating organic sample and X-ray measuring apparatus 失效
    离子交换膜评价方法,有机样品评价方法及X射线测定装置

    公开(公告)号:US06993113B2

    公开(公告)日:2006-01-31

    申请号:US10457354

    申请日:2003-06-10

    CPC classification number: G01N23/201

    Abstract: Disclosed herein is a method of evaluating the performance of an ion-exchange film. In the method, small-angle scattering curves for the ion-exchange film are obtained by an X-ray measuring apparatus that can detect X-rays scattered at small angles with respect to the axis of an X-ray applied to film. From the positions of the peaks on the small-angle scattering curves and the X-ray intensities at these peaks, the molecular structure of the ion-exchange film is determined, thereby to evaluate the performance of the ion-exchange film.

    Abstract translation: 本文公开了评价离子交换膜的性能的方法。 在该方法中,通过X射线测量装置获得离子交换膜的小角度散射曲线,该X射线测量装置可以检测相对于施加到膜的X射线的轴以小角度散射的X射线。 从这些峰的小角散射曲线上的峰位置和X射线强度的位置,确定离子交换膜的分子结构,评价离子交换膜的性能。

    Analyzing apparatus and analyzing method
    97.
    发明授权
    Analyzing apparatus and analyzing method 失效
    分析仪器和分析方法

    公开(公告)号:US06937695B2

    公开(公告)日:2005-08-30

    申请号:US10673185

    申请日:2003-09-30

    Inventor: Kazuhito Hoshino

    CPC classification number: G01N23/201

    Abstract: Provided are an analyzing apparatus and an analyzing method for analyzing a sample by performing measurements using X-rays and measuring a gas generated from the sample.

    Abstract translation: 提供了一种分析装置和分析方法,用于通过使用X射线进行测量并测量从样品产生的气体来分析样品。

    Collimator fabrication
    98.
    发明申请
    Collimator fabrication 审中-公开
    准直器制造

    公开(公告)号:US20050084072A1

    公开(公告)日:2005-04-21

    申请号:US10687685

    申请日:2003-10-17

    Applicant: James Pinchot

    Inventor: James Pinchot

    Abstract: A collimator that formed from a plurality of metal foil layers that are shaped by use of lithographic techniques in specific shapes. The formed metal foil layers are stacked and aligned together and then connected together to form the collimator.

    Abstract translation: 由多个金属箔层形成的准直器,其通过使用特定形状的光刻技术成形。 将形成的金属箔层层叠并排列在一起,然后连接在一起形成准直器。

    X-ray optical system for small angle scattering
    99.
    发明申请
    X-ray optical system for small angle scattering 有权
    用于小角度散射的X射线光学系统

    公开(公告)号:US20040066903A1

    公开(公告)日:2004-04-08

    申请号:US10654350

    申请日:2003-09-02

    CPC classification number: G01N23/201

    Abstract: An X-ray optical system for small angle scattering has a parabolic multilayer mirror and, so that switching to other X-ray incident optical systems for X-ray analysis can be easily performed. A parabolic multilayer mirror, an optical-path selecting slit device, a small-angle selecting slit device and a Soller slit are arranged between an X-ray source and a specimen-side slit. An X-ray beam having passed through the first aperture of an aperture slit plate is interrupted by the optical-path selecting slit. An X-ray beam having passed through the second aperture of the aperture slit plate is reflected at the reflecting surface of the multilayer mirror to become a parallel beam. This parallel beam passes through an aperture of the optical-path selecting slit device. The beam width is restricted by a narrow slit of the small-angle selecting slit device.

    Abstract translation: 用于小角度散射的X射线光学系统具有抛物面多层反射镜,因此可以容易地进行切换到用于X射线分析的其它X射线入射光学系统。 在X射线源和试样侧狭缝之间配置抛物面多层反射镜,光路选择狭缝装置,小角度选择狭缝装置和索勒狭缝。 通过光阑狭缝板的第一孔的X射线束被光路选择狭缝中断。 已经穿过孔径狭缝板的第二孔的X射线束在多层反射镜的反射表面处被反射成平行光束。 该平行光束通过光路选择缝隙装置的孔。 光束宽度受到小角度选择狭缝装置的狭窄狭缝的限制。

    X-ray inspection by coherent-scattering from variably disposed scatterers identified as suspect objects
    100.
    发明授权
    X-ray inspection by coherent-scattering from variably disposed scatterers identified as suspect objects 有权
    通过相干散射从被识别为可疑物体的不同布置的散射体进行X射线检查

    公开(公告)号:US06621888B2

    公开(公告)日:2003-09-16

    申请号:US10190903

    申请日:2002-07-08

    CPC classification number: G01N23/201 G01N23/20 G01V5/0025

    Abstract: A system and method for inspecting an enclosure with penetrating radiation. Radiation side-scattered from an object within the enclosure is detected, allowing the object to be located. If the object is deemed suspect, a volume element of the suspect object is further irradiated with penetrating radiation, and radiation coherently-scattered by the volume element is detected. The energy spectrum and angular distribution of the coherently-scattered radiation are used to characterize the volume element of the suspect object.

    Abstract translation: 用于检查具有穿透辐射的外壳的系统和方法。 检测到从外壳内的物体散射的辐射,允许对象被定位。 如果对象被认为是可疑的,则可疑对象的体积元素被进一步照射穿透辐射,并且检测到被音量元件相干散射的辐射。 相干散射辐射的能谱和角分布用于表征可疑物体的体积元素。

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