公开(公告)号：US09791511B2

公开(公告)日：2017-10-17

申请号：US13836567

申请日：2013-03-15

申请人： Thien D. Nguyen ,  George W. Conner

发明人： Thien D. Nguyen ,  George W. Conner

IPC分类号： G01N37/00 ,  G01R31/319 ,  G01R31/3193

CPC分类号： G01R31/31907 ,  G01R31/31935

摘要： According to some aspects, a system and method for processing messages in a plurality of successive cycles is provided. One such system may include a plurality of first circuits, each first circuit configured to output a message, the plurality of first circuits configured to operate synchronously, a first plurality of buffers, each buffer associated with a respective first circuit and configured to store a message output by the respective first circuit, a communication path configured to receive the plurality of messages from the buffers and to perform aggregation of the messages, thereby generating an aggregated indication, and one or more second circuits. The one or more second circuits are configured to operate synchronously and to receive the aggregated indication, wherein buffers of the first plurality of buffers are configured to store messages from respective first circuits for different times.

公开(公告)号：US20170269147A1

公开(公告)日：2017-09-21

申请号：US15459983

申请日：2017-03-15

申请人： AZ, LLC

发明人： SANA REZGUI

IPC分类号： G01R31/28

CPC分类号： G01R31/2834 ,  G01R15/00 ,  G01R31/31813 ,  G01R31/31907 ,  G10L19/02

摘要： Systems and methods for testing and/or operating remote devices are disclosed. The embodiments provide cost-effective, convenient, and flexible means for the sensing and/or probing of remote devices. Signals generated by remote devices may be received, analyzed, logged, and displayed, i.e., enhancements to the functionalities of an oscilloscope are achieved. Signals to remote devices may be provided, i.e. enhancements to the functionalities of a wave generator, logic analyzers, bus analyzers, and the like are achieved. More particularly, enhancements to the operability, capabilities, and functionality of such previously available testing equipment, are provided, via the operation of a remote, portable, and lightweight test bed. The test bed may be operated and controlled remotely via a user-computing device. The test bed senses, probes, and/or controls a remote device and test data is generated and/or acquired. The test data is provided to the user-computing device for analysis, visualization, and test report generation.

公开(公告)号：US09696343B2

公开(公告)日：2017-07-04

申请号：US14341031

申请日：2014-07-25

申请人： Rohde & Schwarz GmbH & Co. KG

发明人： Harald Ripp ,  Hans-Joachim Mann ,  Michael Winkler

IPC分类号： H01H31/02 ,  G01R1/04 ,  G01R1/18 ,  G06Q10/08 ,  G06Q50/04 ,  G01R31/319

CPC分类号： G01R1/04 ,  G01R1/18 ,  G01R31/31907 ,  G06Q10/087 ,  G06Q50/04

摘要： An asset management system comprising an asset management server connected to a plurality of distributed HF sensitive measurement devices each having at least one inseparable asset tag being located outside a high frequency shield which shields an internal circuitry of the measurement device from external high frequency signals and being configured to provide asset data of the respective measurement device to be processed by the asset management server.

公开(公告)号：US20170108548A1

公开(公告)日：2017-04-20

申请号：US15240000

申请日：2016-08-18

申请人： SAMSUNG ELECTRONICS CO., LTD.

发明人： DAE-SHIK KANG ,  HYUN-SIL LIM ,  MIN-SUK CHOI

IPC分类号： G01R31/3181 ,  G01R1/067

CPC分类号： G11C29/00 ,  G01R31/31907 ,  G01R31/31908 ,  G11C29/56012 ,  G11C29/56016 ,  G11C2029/5602

摘要： A test device for testing a plurality of semiconductor devices, each of which includes a plurality of functional blocks and a plurality of test pads coupled to the functional blocks. The test device includes a test header including a plurality of test channels, a plurality of test sites on which the semiconductor devices are installed, and a test control device. The test control device allocates the test channels to at least some of the test pads of the semiconductor devices to test more than two of the semiconductor devices simultaneously. The number of the test sites is greater than a value generated by dividing the number of the test channels by the number of the test pads of each of the semiconductor devices.

公开(公告)号：US09606183B2

公开(公告)日：2017-03-28

申请号：US13656684

申请日：2012-10-20

申请人： Gerald Moon ,  Ira Harris Leventhal ,  Ron Larson ,  Sangeet Karamchandani

发明人： Gerald Moon ,  Ira Harris Leventhal ,  Ron Larson ,  Sangeet Karamchandani

IPC分类号： G01R31/319

CPC分类号： G01R31/31907 ,  G01R31/31926

摘要： A system and method for testing devices are presented. Embodiments of the present invention use a central controller to coordinate the testing of a plurality of devices under test as well as a plurality of channel circuits that are each operable to be coupled to at least one I/O pin of a device under test of the aforementioned plurality of devices under test. Also, embodiments of the present invention include a plurality of intermediate processors that are each coupled to the central controller and operable to receive and send control signals. These intermediate processors are each coupled to a different set of channel circuits of the plurality of channel circuits and are operable to execute their own instantiation of a test program that is independent of any other intermediate processor of the plurality of intermediate processors for the testing of a device under test associated therewith.

公开(公告)号：US09551746B2

公开(公告)日：2017-01-24

申请号：US14644867

申请日：2015-03-11

申请人： Dell Products L.P.

发明人： Umesh Chandra ,  Timothy Thinh Mai

IPC分类号： G01R31/317 ,  G01R31/3181

CPC分类号： G01R31/31703 ,  G01R31/31708 ,  G01R31/31712 ,  G01R31/31716 ,  G01R31/3177 ,  G01R31/31813 ,  G01R31/31907 ,  G06F11/2221

摘要： A backplane testing system includes a test backplane coupled to a test device chassis and including a first connector system, a second connector system, and channels that connect the first connector system and the second connector system. A first test device in a first test device slot on the test device chassis engages the first connector system and provides a loop back circuit for the first connector system. A second test device in a second test device slot on the test device chassis engages the second connector system. The second test device sends a test signal through a channel on the test backplane such that the test signal is provided to the loop back circuit on the first test device and received back through the channel. The second test device analyzes the test signal that is received to determine a testing compliance of the channel on the test backplane.

摘要翻译： 背板测试系统包括耦合到测试设备机箱并包括第一连接器系统，第二连接器系统和连接第一连接器系统和第二连接器系统的通道的测试背板。 测试设备底盘上的第一测试设备插槽中的第一测试设备接合第一连接器系统，并为第一连接器系统提供环回电路。 第二测试设备在测试设备底盘上的第二测试设备插槽中接合第二连接器系统。 第二测试设备通过测试背板上的通道发送测试信号，使得测试信号被提供给第一测试设备上的环回电路并通过通道接收回来。 第二个测试设备分析接收到的测试信号，以确定测试背板上的通道的测试符合性。

公开(公告)号：US09480184B1

公开(公告)日：2016-10-25

申请号：US14936415

申请日：2015-11-09

申请人： Advanced Testing Technologies, Inc. ,  Eli Levi

发明人： Richard Engel ,  Robert Spinner ,  Eli Levi

IPC分类号： H05K7/20 ,  H05K5/00

CPC分类号： H05K7/20136 ,  G01R31/2834 ,  G01R31/31907 ,  H01H31/02 ,  H05K5/0017

摘要： A module that incorporates a chassis for enabling use of at least one smaller functional module in at least one slot of a chassis designed to mate with a larger functional module having a different standard than the smaller functional module. The module has a housing having electrical connections adapted to mate with electrical connections provided by the chassis for the larger functional module and dimensions that fit within at least one slot provided by the chassis for housing the larger functional module. The module includes at least one set of electrical connections adapted to mate with the electrical connections of the smaller functional module(s) and at least one air passage for conveying air from an opening of the chassis that provides air flow to cool the larger functional module to an area in which the smaller functional module(s) is/are situated when mated with the housing.

摘要翻译： 一种包括机箱的模块，用于使得能够在设计成与具有与较小功能模块不同的标准的较大功能模块配合的机箱的至少一个槽中使用至少一个较小功能模块。 该模块具有壳体，该壳体具有适于与用于较大功能模块的底盘所提供的电气连接相匹配的电气连接以及适合于由底盘提供的用于容纳较大功能模块的至少一个狭槽的尺寸。 模块包括适于与较小功能模块的电气连接配合的至少一组电连接以及至少一个空气通道，用于输送空气从底盘的开口提供空气流以冷却较大的功能模块 到与壳体配合时较小功能模块所在的区域。

公开(公告)号：US20160169961A1

公开(公告)日：2016-06-16

申请号：US14831807

申请日：2015-08-20

申请人： INTERNATIONAL BUSINESS MACHINES CORPORATION

发明人： STEVE L. LECLERC

IPC分类号： G01R31/28

CPC分类号： G01R31/31724 ,  G01R31/2803 ,  G01R31/2834 ,  G01R31/2851 ,  G01R31/2856 ,  G01R31/2882 ,  G01R31/303 ,  G01R31/31701 ,  G01R31/31712 ,  G01R31/31718 ,  G01R31/318597 ,  G01R31/31907 ,  G01R31/31908

摘要： A test controller controlled by a design entity sends at least one closed type command of a closed loop architecture test flow to an arbiter of a vendor test platform controlled by a vendor entity, wherein the test controller controls nondeterministic testing on a protected integrated circuit (IC) integrated into an electronic assembly, as performed by test equipment hardware within the vendor test platform, without the design entity disclosing an underlying design of the protected IC to the vendor entity. In response to the test controller receiving at least one response of the at least one closed type command, from the arbiter interface passing the at least one closed type command directly through the test equipment hardware to the protected IC, determining, by the test controller, based on the at least one response, a next at least one closed type command of the closed loop architecture test flow to send to the arbiter.

公开(公告)号：US09341675B2

公开(公告)日：2016-05-17

申请号：US13952491

申请日：2013-07-26

申请人： Advantest (Singapore) Pte. Ltd.

发明人： Jens Kilian

IPC分类号： G01R31/28 ,  G06F11/00 ,  G01R31/3181 ,  G01R31/319

CPC分类号： G01R31/31813 ,  G01R31/31907

摘要： A test card for testing one or more devices under test includes a plurality of test resources configured to communicate with the one or more devices under test. The test card further includes a matching circuit configured to receive a test sequence of at least two matching instructions followed by one or more processing instructions. The matching instructions define a group of resources which are to operate in accordance with the processing instructions. The matching circuit is configured to determine based on the at least two matching instructions whether a given test resource out of a plurality of test resources belongs to the group or not and to forward the processing instructions to the given test resource if the given test resource belongs to the group and to not forward the processing instructions to the given test resource if the given test resource does not belong to the group.

摘要翻译： 用于测试被测试的一个或多个设备的测试卡包括被配置为与被测试的一个或多个设备进行通信的多个测试资源。 测试卡还包括匹配电路，其被配置为接收至少两个匹配指令的测试序列，之后是一个或多个处理指令。 匹配指令定义要根据处理指令进行操作的一组资源。 匹配电路被配置为基于至少两个匹配指令来确定多个测试资源中的给定测试资源是否属于该组，并且如果给定的测试资源属于，则将处理指令转发到给定的测试资源 如果给定的测试资源不属于该组，则不将转发处理指令转发给给定的测试资源。

公开(公告)号：US09267965B2

公开(公告)日：2016-02-23

申请号：US14084028

申请日：2013-11-19

申请人： Advantest Corporation

发明人： Michael Jones ,  Takahiro Yasui ,  Alan S. Krech, Jr. ,  Edmundo Delapuente ,  Taichi Fukuda

IPC分类号： G01R31/00 ,  G01R1/00

CPC分类号： G01R1/00 ,  G01R31/00 ,  G01R31/31907

摘要： A method for performing test site synchronization within automated test equipment (ATE) is presented. The method comprises controlling a plurality of test program controllers (TPCs) using a plurality of bridge controllers (BCs), wherein each TPC can initiate multiple asynchronous events. For an asynchronous event initiated by a TPC, raising a busy flag while the asynchronous event is not yet complete and de-asserting the busy flag when the asynchronous event is complete, wherein the asynchronous event corresponds to a task requiring an indeterminate amount of time. It also comprises generating a busy signal in the first BCs in response to receiving a busy flag from any of the plurality of TPCs, wherein the busy signal remains asserted while any of the plurality of TPCs asserts a busy flag. Finally, it comprises transmitting the busy signal to the plurality of TPCs, wherein the TPCs use the busy signal to synchronize operations.

摘要翻译： 提出了一种在自动测试设备（ATE）内执行测试现场同步的方法。 该方法包括使用多个桥接控制器（BC）来控制多个测试程序控制器（TPC），其中每个TPC可以启动多个异步事件。 对于由TPC启动的异步事件，当异步事件尚未完成时提升忙标志，并且当异步事件完成时取消断言忙标志，其中异步事件对应于需要不确定时间量的任务。 它还包括响应于从多个TPC中的任一个接收到忙标志而在第一BC中产生忙信号，其中当多个TPC中的任一个断言忙标志时，该忙信号保持断言。 最后，它包括向多个TPC发送忙信号，其中TPC使用忙信号来同步操作。