公开(公告)号：US20190310299A1

公开(公告)日：2019-10-10

申请号：US16387449

申请日：2019-04-17

Applicant: Korea Research Institute of Standards and Science

Inventor： No Weon KANG ,  Jeongil PARK

IPC: G01R29/08

Abstract: A measurement system according to an embodiment of the present invention comprises: an analyzer; a first expansion module for transmitting a first electromagnetic wave signal to a first antenna under control of the analyzer; a second expansion module for receiving a second electromagnetic wave signal through a second antenna; a first signal generator for generating a first local oscillation signal under control of the analyzer, and detecting a reference characteristic of the first electromagnetic wave signal and a first test characteristic of the first antenna by using the first local oscillation signal; and a second signal generator for generating a second local oscillation signal under control of the analyzer, and detecting a second test characteristic of the second antenna by using the second local oscillation signal, wherein the first signal generator comprises a controller for converting instructions transmitted from the analyzer into internal instructions, and a local oscillation signal generator for generating the first local oscillation signal according to the internal instructions.

公开(公告)号：US10309011B2

公开(公告)日：2019-06-04

申请号：US15562545

申请日：2016-07-28

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Sang Woo Kang ,  Ji Hun Mun

IPC: C01B17/20 ,  C01G39/06 ,  C23C16/02 ,  C23C16/30 ,  C23C16/52 ,  C30B25/16 ,  C30B25/18 ,  C30B29/46 ,  C30B29/64 ,  C23C16/455

Abstract: The present invention relates to a method for preparing a two-dimensional transition metal dichalcogenide and, more particularly, to a method for preparing a highly uniform two-dimensional transition metal dichalcogenide thin film. More specifically, the present invention is directed to a preparation method for a highly uniform two-dimensional transition metal dichalcogenide thin film at low temperature of 500° C. or below.

公开(公告)号：US10233561B2

公开(公告)日：2019-03-19

申请号：US15246980

申请日：2016-08-25

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Geun-Woo Lee ,  Soo Heyong Lee

IPC: C30B7/02 ,  C30B30/02 ,  C30B30/08 ,  B23K26/70 ,  B01D1/00

Abstract: An electrostatic levitation crystal growth apparatus for a solution and a crystal growing method using the same. The apparatus may include an upper electrode, a lower electrode vertically spaced apart from the upper electrode, a power supply unit configured to apply a vertical electrostatic field between the upper electrode and the lower electrode, and a droplet dispenser configured to eject a solution into a region between the upper and lower electrodes and thereby to form a solution droplet. The solution droplet may be maintained in a charged state and may be electrostatically levitated against the gravity exerted thereon, by the vertical electrostatic field. The solution droplet may be evaporated in the electrostatically levitated state, and a solute dissolved in the solution may be grown to form a crystal.

公开(公告)号：US10191081B2

公开(公告)日：2019-01-29

申请号：US15238326

申请日：2016-08-16

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Byong Chon Park ,  DalHyun Kim ,  ChaeHo Shin

IPC: G01Q60/32 ,  G01Q10/06

Abstract: Provided is a measuring method for an atomic force microscope that scans a surface of a sample with a probe to measure a surface property of the sample, the measuring method including detecting a motion of the probe while vibrating the probe on the surface of the sample, acquiring surface information on the sample by using a variation in the motion of the probe, and controlling the probe by using the surface information on the sample. The surface information on the sample may include a position and a slope of the surface. The vibrating of the probe on the surface of the sample may include performing a circular motion by the probe around axes perpendicular to a scan direction of the probe and to a height direction of the sample.

公开(公告)号：US20190006144A1

公开(公告)日：2019-01-03

申请号：US16067564

申请日：2016-12-29

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Dal Hyun KIM ,  Byong Chon PARK ,  Chae Ho SHIN

IPC: H01J37/20 ,  H02N2/02 ,  H02N2/04

Abstract: Provided is a linear structure for displacement transmission having a structure that enables a desired movement to be performed smoothly while minimizing complexity of a system through a simple structure in performing a precise and fine movement, and a one-dimensional and three-dimensional micro movement device using the same.

公开(公告)号：US10145785B2

公开(公告)日：2018-12-04

申请号：US14906433

申请日：2014-05-13

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Yong Jai Cho ,  Won Chegal ,  Hyun Mo Cho

IPC: G01N21/21 ,  G01J4/00 ,  G01J4/04

Abstract: Provided is an optical element rotation type Mueller-matrix ellipsometer for solving a problem of measurement accuracy and measurement precision occurring due to residual polarization of a light source, polarization dependence of a photo-detector, measurement values of Fourier coefficients of a high order term in dual optical element rotation type Mueller-matrix ellipsometers according to the related art capable of measuring some or all of components of a Mueller-matrix for any sample.

公开(公告)号：US20180318780A1

公开(公告)日：2018-11-08

申请号：US16039797

申请日：2018-07-19

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Min Cheol CHU ,  Seon Ae HWANGBO ,  Sae Won YOON

IPC: B01F11/02 ,  B01F13/10 ,  B01F5/10 ,  B01F3/08 ,  B01F15/00

CPC classification number: B01F11/0266 ,  B01F3/0803 ,  B01F3/0819 ,  B01F5/10 ,  B01F11/0241 ,  B01F11/0283 ,  B01F11/0291 ,  B01F13/1027 ,  B01F15/00207 ,  B01F15/00214 ,  B01F15/0022 ,  B01F15/00233 ,  B01F15/00324 ,  B01F2215/0014 ,  B01F2215/0031 ,  B01F2215/0032

Abstract: A fluid feeder includes a fluid storage unit and a pre-treatment unit. The fluid storage unit provides a fluid flow path through which a fluid mixture of a hydrophilic fluid and a hydrophobic fluid flows. The fluid storage unit is connected through a plurality of connectors to the fluid flow path having a portion, in which an ultrasound focusing unit for focusing ultrasound to disperse and mix the fluids contained in the fluid mixture by focused ultrasound is mounted, to flow the fluid mixture in the fluid flow path and to flow the fluid mixture dispersed by the ultrasound focusing unit through the fluid flow path. In the pre-treatment unit, the fluid mixture is dispersed at micrometer scale and supplied to the fluid storage unit before the fluid mixture is stored in the fluid storage unit.

公开(公告)号：US10121658B2

公开(公告)日：2018-11-06

申请号：US15576664

申请日：2016-03-24

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Hyuksang Kwon ,  Jeong Won Kim ,  Eun Seong Lee

IPC: H01L21/02 ,  H01L21/428 ,  H01L21/205 ,  H01L29/24 ,  H01L29/34 ,  H01L29/786 ,  H01L31/032 ,  H01L33/26

Abstract: The present invention relates to a method of fabricating a black phosphorus thin film and a black phosphorus thin film thereof and, more particularly, to a method of fabricating a black phosphorus ultrathin film by forming the black phosphorous ultrathin film in a chamber by active oxygen and removing accompanying black phosphorus oxide film water. The black phosphorus ultrathin film has a surface that does not substantially have defects and is uniform in a large area, and has a surface roughness property of 1 nm or less, to represent a high application property to an optoelectronic device and a field effect transistor.

公开(公告)号：US20180286655A1

公开(公告)日：2018-10-04

申请号：US15518408

申请日：2015-10-07

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Chang Joon Park ,  Sang Jung AHN ,  Cheolsu HAN ,  Keu Chan LEE ,  Seok Rae YOON

IPC: H01J49/14 ,  H01J49/06 ,  H01J49/42 ,  H01J49/00

CPC classification number: H01J49/147 ,  G01N27/62 ,  H01J49/0031 ,  H01J49/009 ,  H01J49/0095 ,  H01J49/061 ,  H01J49/4225

Abstract: The present invention relates to a particle beam mass spectrometer and particle measurement method by means of same. More particularly, the present invention relates to a particle beam mass spectrometer including: a particle focusing unit focusing a particle beam induced by gas flow; an electron gun forming a charged particle beam by accelerating thermal electrons to ionize the particle beam focused by the particle focusing unit; a deflector deflecting the charged particle beam according to kinetic energy to charge ratio; and a sensing unit measuring a current induced by the deflected charged particle beam, wherein the deflector includes at least one particle beam separation electrode provided at each of opposite sides with respect to a progress axis of the charged particle beam before being deflected.

公开(公告)号：US10082468B2

公开(公告)日：2018-09-25

申请号：US15580117

申请日：2017-04-27

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Hyuksang Kwon

IPC: G01J3/44 ,  G01N21/65 ,  G01N21/25

CPC classification number: G01N21/658 ,  G01N21/255 ,  G01N2201/06113 ,  G01N2201/12

Abstract: The present invention relates to a method for evaluating a SERS sensor substrate, comprising the steps of: a) measuring, through a dark-field microscope, the color of nanoparticles positioned on the SERS sensor substrate; b) converting the measured color into a distance between the nanoparticles; c) acquiring the Raman signal intensity of the SERS sensor substrate; d) acquiring the standard Raman signal intensity of a standard SERS sensor substrate including the nanoparticles having the distance that is the same as the converted distance; and e) comparing the Raman signal intensity and the standard Raman signal intensity.