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公开(公告)号:US20200225853A1
公开(公告)日:2020-07-16
申请号:US16248685
申请日:2019-01-15
Applicant: Micron Technology, Inc.
Inventor: Dean D. Gans
IPC: G06F3/06 , G06F12/0802
Abstract: Methods, systems, and devices related to a memory system or scheme that includes a first memory device configured for low-energy access operations and a second memory device configured for storing high-density information and operations of the same are described. The memory system may include an array configured for high-density information and may interface with a host via a controller and a cache or another array of a relatively fast memory type. The memory system may support signals communicated according to one or several modulation schemes, including a modulation scheme or schemes that employ two, three, or more voltage levels (e.g., NRZ, PAM4). The memory system may include, e.g., separate channels configured to communicate using different modulation schemes between a host and between memory arrays or memory types within the memory system.
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102.
公开(公告)号:US10714159B2
公开(公告)日:2020-07-14
申请号:US15975621
申请日:2018-05-09
Applicant: Micron Technology, Inc.
Inventor: Robert Nasry Hasbun , Dean D. Gans , Sharookh Daruwalla
Abstract: Methods, systems, and devices for a latency indication in a memory system or sub-system are described. An interface controller of a memory system may transmit an indication of a time delay (e.g., a wait signal) to a host in response to receiving an access command from the host. The interface controller may transmit such an indication when a latency associated with performing the access command is likely to be greater than a latency anticipated by the host. The interface controller may determine a time delay based on a status of buffer or a status of memory device, or both. The interface controller may use a pin designated and configured to transmit a command or control information to the host when transmitting a signal including an indication of a time delay. The interface controller may use a quantity, duration, or pattern of pulses to indicate a duration of a time delay.
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公开(公告)号:US20200160902A1
公开(公告)日:2020-05-21
申请号:US16198433
申请日:2018-11-21
Applicant: MICRON TECHNOLOGY, INC.
Inventor: Dean D. Gans
IPC: G11C11/4076 , H03K5/156
Abstract: Embodiments of the disclosure are drawn to apparatuses and methods for a multi-bit duty cycle monitor. A clock signal may be provided to a memory in order to synchronize one or more operations of the memory. The clock signal may have a duty cycle which is adjusted by a duty cycle adjustor of the memory. The duty cycle of the adjusted clock signal may be monitored by a multi-bit duty cycle monitor. The multi-bit duty cycle monitor may provide a multi-bit signal which indicates if the duty cycle of the adjusted clock signal is above or below a target duty cycle value (or if the duty cycle is outside tolerances around the target duty cycle). The multi-bit duty cycle monitor may provide the multi-bit signal while access operations of the memory are occurring.
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公开(公告)号:US20200043545A1
公开(公告)日:2020-02-06
申请号:US16530092
申请日:2019-08-02
Applicant: Micron Technology, Inc.
Inventor: Dean D. Gans
IPC: G11C11/406 , G11C16/34
Abstract: A method of operating a memory device is provided, comprising determining a number of operations corresponding to a memory location during a first timing period; and scheduling an extra refresh operation for the memory location after the first timing period when the determined number of operations exceeds a predetermined threshold. A memory device is provided, comprising a memory including a memory location; and circuitry configured to: determine a number of operations corresponding to the memory location during a first timing period; and schedule an extra refresh operation for the memory location after the first timing period when the determined number of operations exceeds a predetermined threshold.
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公开(公告)号:US20200020367A1
公开(公告)日:2020-01-16
申请号:US16530525
申请日:2019-08-02
Applicant: Micron Technology, Inc.
Inventor: Robert Nasry Hasbun , Timothy M. Hollis , Jeffrey P. Wright , Dean D. Gans
IPC: G11C7/10 , G11C11/22 , G06F1/3234 , G06F13/42
Abstract: Methods, systems, and devices for multiple concurrent modulation schemes in a memory system are described. Techniques are provided herein to communicate data using a modulation scheme having at least three levels and using a modulation scheme having at least two levels within a common system or memory device. Such communication with multiple modulation schemes may be concurrent. The modulated data may be communicated to a memory die through distinct signal paths that may correspond to a particular modulation scheme. An example of a modulation scheme having at least three levels may be pulse amplitude modulation (PAM) and an example of a modulation scheme having at least two levels may be non-return-to-zero (NRZ).
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公开(公告)号:US20200004420A1
公开(公告)日:2020-01-02
申请号:US16452424
申请日:2019-06-25
Applicant: MICRON TECHNOLOGY, INC.
Inventor: Dean D. Gans , Shunichi Saito
Abstract: Apparatuses and methods for configurable memory array bank architectures are described. An example apparatus includes a mode register configured to store information related to bank architecture and a memory array including a plurality of memory banks. The plurality of memory banks are configured to be arranged in a bank architecture based at least in part on the information related to bank architecture stored in the mode register.
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公开(公告)号:US20190273642A1
公开(公告)日:2019-09-05
申请号:US16419870
申请日:2019-05-22
Applicant: Micron Technology, Inc.
Inventor: Robert Nasry Hasbun , Timothy M. Hollis , Jeffrey P. Wright , Dean D. Gans
IPC: H04L27/04 , G11C8/12 , G06F13/38 , G11C5/06 , G06F12/02 , H04L27/06 , H04L27/02 , H04L25/49 , G11C7/10 , G06F13/16
Abstract: Methods, systems, and devices for multiplexing distinct signals on a single pin of a memory device are described. Techniques are described herein to multiplex data using a modulation scheme having at least three levels. The modulated data may be communicated to multiple memory dies over a shared bus. Each of the dies may include a same or different type of memory cell and, in some examples, a multi-level signaling scheme may be pulse amplitude modulation (PAM). Each unique symbol of the modulated signal may be configured to represent a plurality of bits of data.
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公开(公告)号:US20190129637A1
公开(公告)日:2019-05-02
申请号:US16048078
申请日:2018-07-27
Applicant: Micron Technology, Inc.
Inventor: Dean D. Gans , Yoshiro Riho , Shunichi Saito , Osamu Nagashima
IPC: G06F3/06
Abstract: Methods, systems, and apparatuses related to memory operation with multiple sets of latencies are disclosed. A memory device or system that includes a memory device may be operable with one or several sets of latencies (e.g., read, write, or write recovery latencies), and the memory device or system may apply a set of latencies depending on which features of the memory device are enabled. For example, control circuitry may be configured to enable one or more features during operations on a memory array, and the control circuitry may apply a set of latency values based on a number or type of features that are enabled. The sets of latency values may depend, for example, on whether various control features (e.g., dynamic voltage frequency scaling) are enabled, and a device may operate within certain frequency ranges irrespective of other characteristics (e.g., mode register values) or latencies applied.
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109.
公开(公告)号:US20190122707A1
公开(公告)日:2019-04-25
申请号:US16222806
申请日:2018-12-17
Applicant: MICRON TECHNOLOGY, INC.
Inventor: Dean D. Gans , Daniel C. Skinner
IPC: G11C7/10
CPC classification number: G11C7/1045 , G11C7/109
Abstract: Apparatuses and methods for writing and storing parameter codes for operating parameters, and selecting between the parameter codes to set an operating condition for a memory are disclosed. An example apparatus includes a first mode register and a second mode register. The first mode register is configured to store first and second parameter codes for a same operating parameter. The second mode register is configured to store a parameter code for a control parameter to select between the first and second parameter codes to set a current operating condition for the operating parameter. An example method includes storing in a first register a first parameter code for an operating parameter used to set a first memory operating condition, and further includes storing in a second register a second parameter code for the operating parameter used to set a second memory operating condition.
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公开(公告)号:US10256817B2
公开(公告)日:2019-04-09
申请号:US16013827
申请日:2018-06-20
Applicant: MICRON TECHNOLOGY, INC.
Inventor: Dean D. Gans
IPC: H03K19/00 , G11C11/4093 , H03K19/0175 , G11C11/4094 , G11C29/02 , H03K19/003 , G11C7/10 , G11C29/50
Abstract: A semiconductor device also includes programmable termination components and a calibration circuit. The calibration circuit generates impedance calibration codes. The calibration circuit also calibrates impedance of the programmable termination components based on an average impedance calibration code of the impedance calibration codes. The semiconductor device further includes an averaging circuit that determines the average impedance calibration code of the impedance calibration codes.
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