Abstract:
The quality of images produced by confocal microscopy, and especially scanning laser confocal microscopy, is enhanced especially for images obtained in turbid mediums such as many biological tissue specimens, by reducing speckle from scatterers that exist outside (above and below) the section which is being imaged by utilizing sheared beams, both of which are focused to laterally or vertically offset spots and polarizing the beams to have opposite senses of circular polarization (right and left handed circular polarization). The return light from the section of certain polarization is detected after passing through the confocal aperture of the confocal microscope. Images can be formed using optical coherence detection of the return light. Light from scatterers outside the section of interest, which are illuminated by both of the sheared beams, interfere thereby reducing speckle due to such scatterers, and particularly scatters which are adjacent to the section being imaged. Sheared beams having orthogonal linear polarization, as may be obtained from a Wollaston or Nomarski prism are converted into circularly polarized beams of opposite polarization sense by a quarter wave plate and focused into laterally displaced spots. A Dyson type lens is used to obtain sheared beams which when focused form vertically displaced spots. The optical signals representing reflections from the section are derived by polarizing optics which may either be a polarizing beamsplitter in the incident beam path or a retarder and analyzer. The retarder may be selected to provide different polarization phase shifts of the return light, and with the analyzer, detects the degree of elliptical polarization representing the optical activity and circular dichroism producing the optical signal representing the image.
Abstract:
A method is presented for non-destructive testing of the state of a surface that may have cracks in it by observing waves emitted by a dye applied to the surface and present in the cracks in response to an incident excitation beam of wavelength appropriate to the dye. The incident excitation beam is an ultraviolet light. The beam is made of rectilinear polarized waves. Waves emitted by the dye are observed through a rotatable polarized wave analyzer. The analyzer is rotated first to eliminate from observation the wave due to the residual dye on the surface and thereafter to determine the depths of the cracks.
Abstract:
A polarization sensitive optical imaging system is used to detect changes in polarization in dental tissues to aid the diagnosis of dental disease such as caries. The degree of depolarization is measured by illuminating the dental tissue with polarized light and measuring the polarization state of the backscattered light. The polarization state of this reflected light is analyzed using optical polarimetric imaging techniques. A hand-held fiber optic dental probe is used in vivo to direct the incident beam to the dental tissue and collect the reflected light. To provide depth-resolved characterization of the dental tissue, the polarization diagnostics may be incorporated into optical coherence domain reflectometry and optical coherence tomography (OCDR/OCT) systems, which enables identification of subsurface depolarization sites associated with demineralization of enamel or bone.
Abstract:
By setting the linearly polarized light with normal incidence on the liquid crystal sample 3 and rotating the liquid crystal sample 3 on a rotation stage 7 within plane, the dependencies of the amplitude ratio as well as the optical retardation of the transmitted light on the azimuth of the liquid crystal sample, with respect to the polarization direction of the incident light, are measured. From these measured results, a liquid crystal pretilt angle is determined.
Abstract:
A circular dichroism spectrometer eliminates linear birefringent interference by having a first polarization modulator before the sample and a second polarzation modulator after the sample. The two polarization modulators vibrate at different frequencies so the signals can be distinguished and manipulated. The addition of the second polarization modulator, an additional lock in amplifier, and software to manipulate the two signals corresponding to the two vibrational frequencies allow a real time circular dichroism spectra free from interference to be determined.
Abstract:
Systems and techniques for integrating an optical coherent gradient sensing (CGS) module and another optical sensing module to simultaneously measure the curvature and another property of a specularly reflective surface.
Abstract:
An ellipsometer, and a method of ellipsometry, for analyzing a sample using a broad range of wavelengths, includes a light source for generating a beam of polychromatic light having a range of wavelengths of light for interacting with the sample. A polarizer polarizes the light beam before the light beam interacts with the sample. A rotating compensator induces phase retardations of a polarization state of the light beam wherein the range of wavelengths and the compensator are selected such that at least a first phase retardation value is induced that is within a primary range of effective retardations of substantially 135° to 225°, and at least a second phase retardation value is induced that is outside of the primary range. An analyzer interacts with the light beam after the light beam interacts with the sample. A detector measures the intensity of light after interacting with the analyzer as a function of compensator angle and of wavelength, preferably at all wavelengths simultaneously. A processor determines the polarization state of the beam as it impinges the analyzer from the light intensities measured by the detector.
Abstract:
An optical measurement system is disclosed for evaluating samples with multi-layer thin film stacks. The optical measurement system includes a reference ellipsometer and one or more non-contact optical measurement devices. The reference ellipsometer is used to calibrate the other optical measurement devices. Once calibration is completed, the system can be used to analyze multi-layer thin film stacks. In particular, the reference ellipsometer provides a measurement which can be used to determine the total optical thickness of the stack. Using that information coupled with the measurements made by the other optical measurement devices, more accurate information about individual layers can be obtained.
Abstract:
A method for testing injection-molded discs, such as CD or DVD discs, for the presence of residual stress by placing the discs between two polarizers uses a video screen provided as part of the injection machine's display unit as a light source. The screen is preferably made uniformly bright by removing text or drawings and being set to emit bright white light. The disc is set between and parallel to the two polarizing plates, whose axes are crossed. The machine operator views the screen through the crossed polarizers and freshly-made disc. Stress disturbs the polarization of light transmitted through the disc and shows molding defects as bright patches. The screen can be a CRT or a liquid crystal panel. The light is preferably made uniform by temporarily erasing letters or figures, used to show molding data, from the screen. Preferably a push-button activates and deactivates the bright white screen.
Abstract:
An apparatus for measuring the optical-signal-to-noise ratio (OSNR) of an optical system is adapted to function in single channel or in multi-channel wavelength division multiplexed optical communication systems. An optical signal spectrum and a center frequency characterize the optical signals. A narrow-band notch filter, realized by an in-fiber Bragg grating, is utilized to remove a component of the signal so the remaining signal can be measured. When multiple channels are present, a bandpass filter is used to select the part of the multiplexed signal to be measured. Both the narrow-band notch filter and the bandpass filter can be tunable to further extend the capabilities of the system. Two detectors are utilized with the power in the channel being measured by a low-gain detector and the power in the noise being measured by a high-gain detector. A processor receives the detector outputs, calculates OSNR, and controls the tunable components.