Imaging system using polarization effects to enhance image quality
    111.
    发明授权
    Imaging system using polarization effects to enhance image quality 有权
    成像系统采用极化效果来提升图像质量

    公开(公告)号:US06577394B1

    公开(公告)日:2003-06-10

    申请号:US09641798

    申请日:2000-08-18

    CPC classification number: G01J4/00 G02B21/0032 G02B21/0056 G02B21/0068

    Abstract: The quality of images produced by confocal microscopy, and especially scanning laser confocal microscopy, is enhanced especially for images obtained in turbid mediums such as many biological tissue specimens, by reducing speckle from scatterers that exist outside (above and below) the section which is being imaged by utilizing sheared beams, both of which are focused to laterally or vertically offset spots and polarizing the beams to have opposite senses of circular polarization (right and left handed circular polarization). The return light from the section of certain polarization is detected after passing through the confocal aperture of the confocal microscope. Images can be formed using optical coherence detection of the return light. Light from scatterers outside the section of interest, which are illuminated by both of the sheared beams, interfere thereby reducing speckle due to such scatterers, and particularly scatters which are adjacent to the section being imaged. Sheared beams having orthogonal linear polarization, as may be obtained from a Wollaston or Nomarski prism are converted into circularly polarized beams of opposite polarization sense by a quarter wave plate and focused into laterally displaced spots. A Dyson type lens is used to obtain sheared beams which when focused form vertically displaced spots. The optical signals representing reflections from the section are derived by polarizing optics which may either be a polarizing beamsplitter in the incident beam path or a retarder and analyzer. The retarder may be selected to provide different polarization phase shifts of the return light, and with the analyzer, detects the degree of elliptical polarization representing the optical activity and circular dichroism producing the optical signal representing the image.

    Abstract translation: 通过共聚焦显微镜,特别是扫描激光共焦显微镜产生的图像的质量,特别是对于在诸如许多生物组织样本的混浊介质中获得的图像而言,通过减少存在于外部(上方和下方)的散射体的斑点 通过使用剪切光束成像,这两个光束被聚焦成横向或垂直偏移光斑并且使光束偏振以具有圆偏振(右和左旋圆偏振)的相反感。 在通过共聚焦显微镜的共聚焦孔之后检测来自某些偏振部分的返回光。 可以使用返回光的光学相干检测来形成图像。 由两束剪切光束照亮的感兴趣部分之外的散射体的光会干扰,从而减少由于这种散射体引起的斑点,特别是与被成像的部分相邻的散射。 具有从Wollaston或Nomarski棱镜获得的正交线偏振的剪切光束被四分之一波片转换成具有相反偏振感的圆偏振光束并聚焦到横向移位的光斑中。 Dyson型透镜用于获得剪切梁,当聚焦形成垂直位移点时。 表示来自该部分的反射的光学信号由偏振光学器件得到,其可以是入射光束路径中的偏振分束器或延迟器和分析器。 可以选择延迟器以提供返回光的不同偏振相移,并且与分析仪一起检测表示光学活动的椭圆偏振度和产生表示图像的光信号的圆二色性。

    Method and system for non-destructive dye penetration testing of a surface
    112.
    发明授权
    Method and system for non-destructive dye penetration testing of a surface 失效
    表面非破坏性染料渗透试验方法和系统

    公开(公告)号:US06556298B1

    公开(公告)日:2003-04-29

    申请号:US09647419

    申请日:2000-09-29

    CPC classification number: G01N21/91

    Abstract: A method is presented for non-destructive testing of the state of a surface that may have cracks in it by observing waves emitted by a dye applied to the surface and present in the cracks in response to an incident excitation beam of wavelength appropriate to the dye. The incident excitation beam is an ultraviolet light. The beam is made of rectilinear polarized waves. Waves emitted by the dye are observed through a rotatable polarized wave analyzer. The analyzer is rotated first to eliminate from observation the wave due to the residual dye on the surface and thereafter to determine the depths of the cracks.

    Abstract translation: 提出了一种方法,用于通过观察施加到表面上的染料发射的波和响应于适合于染料的波长的入射激发光束而存在于裂纹中的表面的状态的非破坏性测试 。 入射激发光束是紫外光。 光束由直线极化波形成。 通过可旋转的极化波分析仪观察染料发出的波。 分析仪首先旋转,以免由观察表面上的残留染料引起的波浪,然后确定裂纹的深度。

    Optical detection dental disease using polarized light
    113.
    发明授权
    Optical detection dental disease using polarized light 有权
    光学检测牙病使用偏振光

    公开(公告)号:US06522407B2

    公开(公告)日:2003-02-18

    申请号:US10100824

    申请日:2002-03-18

    Abstract: A polarization sensitive optical imaging system is used to detect changes in polarization in dental tissues to aid the diagnosis of dental disease such as caries. The degree of depolarization is measured by illuminating the dental tissue with polarized light and measuring the polarization state of the backscattered light. The polarization state of this reflected light is analyzed using optical polarimetric imaging techniques. A hand-held fiber optic dental probe is used in vivo to direct the incident beam to the dental tissue and collect the reflected light. To provide depth-resolved characterization of the dental tissue, the polarization diagnostics may be incorporated into optical coherence domain reflectometry and optical coherence tomography (OCDR/OCT) systems, which enables identification of subsurface depolarization sites associated with demineralization of enamel or bone.

    Abstract translation: 偏振敏感光学成像系统用于检测牙组织中极化的变化,以帮助牙科疾病如龋齿的诊断。 通过用偏振光照射牙组织并测量背向散射光的偏振状态来测量去极化度。 使用光学偏振成像技术分析该反射光的偏振状态。 体内使用手持光纤牙科探针将入射光束引导到牙齿组织并收集反射光。 为了提供牙科组织的深度分辨表征,偏振诊断可以被并入到光学相干畴反射测量和光学相干断层扫描(OCDR / OCT)系统中,其能够识别与釉质或骨的脱矿质相关的地下去极化位点。

    Measuring method of liquid crystal pretilt angle and measuring equipment of liquid crystal pretilt angle

    公开(公告)号:US06490036B2

    公开(公告)日:2002-12-03

    申请号:US09955055

    申请日:2001-09-19

    Inventor: Ichiro Hirosawa

    CPC classification number: G01C23/00

    Abstract: By setting the linearly polarized light with normal incidence on the liquid crystal sample 3 and rotating the liquid crystal sample 3 on a rotation stage 7 within plane, the dependencies of the amplitude ratio as well as the optical retardation of the transmitted light on the azimuth of the liquid crystal sample, with respect to the polarization direction of the incident light, are measured. From these measured results, a liquid crystal pretilt angle is determined.

    Dual circular polarization modulation spectrometer
    115.
    发明授权
    Dual circular polarization modulation spectrometer 失效
    双圆偏振光谱仪

    公开(公告)号:US06480277B1

    公开(公告)日:2002-11-12

    申请号:US09981442

    申请日:2001-10-18

    CPC classification number: G01J3/447

    Abstract: A circular dichroism spectrometer eliminates linear birefringent interference by having a first polarization modulator before the sample and a second polarzation modulator after the sample. The two polarization modulators vibrate at different frequencies so the signals can be distinguished and manipulated. The addition of the second polarization modulator, an additional lock in amplifier, and software to manipulate the two signals corresponding to the two vibrational frequencies allow a real time circular dichroism spectra free from interference to be determined.

    Abstract translation: 圆形二色性光谱仪通过在样品之前具有第一偏振调制器和样品之后的第二极化调制器来消除线性双折射干涉。 两个偏振调制器以不同的频率振动,从而可以区分和操纵信号。 添加第二偏振调制器,放大器中的附加锁和用于操纵对应于两个振动频率的两个信号的软件允许确定无干扰的实时圆二色光谱。

    Coherent gradient sensing ellipsometer
    116.
    发明授权
    Coherent gradient sensing ellipsometer 有权
    相干梯度感测椭偏仪

    公开(公告)号:US06469788B2

    公开(公告)日:2002-10-22

    申请号:US09820094

    申请日:2001-03-27

    CPC classification number: G01N21/211

    Abstract: Systems and techniques for integrating an optical coherent gradient sensing (CGS) module and another optical sensing module to simultaneously measure the curvature and another property of a specularly reflective surface.

    Abstract translation: 用于集成光学相干梯度感测(CGS)模块和另一光学感测模块以同时测量镜面反射表面的曲率和另一特性的系统和技术。

    Broadband spectroscopic rotating compensator ellipsometer
    117.
    发明授权
    Broadband spectroscopic rotating compensator ellipsometer 有权
    宽带光谱旋转补偿器椭偏仪

    公开(公告)号:US06449043B2

    公开(公告)日:2002-09-10

    申请号:US09944831

    申请日:2001-08-31

    Abstract: An ellipsometer, and a method of ellipsometry, for analyzing a sample using a broad range of wavelengths, includes a light source for generating a beam of polychromatic light having a range of wavelengths of light for interacting with the sample. A polarizer polarizes the light beam before the light beam interacts with the sample. A rotating compensator induces phase retardations of a polarization state of the light beam wherein the range of wavelengths and the compensator are selected such that at least a first phase retardation value is induced that is within a primary range of effective retardations of substantially 135° to 225°, and at least a second phase retardation value is induced that is outside of the primary range. An analyzer interacts with the light beam after the light beam interacts with the sample. A detector measures the intensity of light after interacting with the analyzer as a function of compensator angle and of wavelength, preferably at all wavelengths simultaneously. A processor determines the polarization state of the beam as it impinges the analyzer from the light intensities measured by the detector.

    Abstract translation: 用于使用宽波长范围分析样品的椭偏仪的椭偏仪和椭偏仪的方法包括用于产生具有用于与样品相互作用的光波长范围的多色光束的光源。 在光束与样品相互作用之前,偏振器使光束偏振。 旋转补偿器引起光束的偏振状态的相位延迟,其中选择波长范围和补偿器,使得至少引入第一相位延迟值,该第一相位延迟值在大致135°至225°的有效延迟的主要范围内 °,并且引起超出初级范围的至少第二相位延迟值。 在光束与样品相互作用后,分析仪与光束相互作用。 检测器测量与分析仪相互作用后的光强度,作为补偿器角度和波长的函数,优选同时在所有波长处。 处理器确定当光束从由检测器测量的光强度撞击分析仪时的偏振状态。

    Apparatus for analyzing multi-layer thin film stacks on semiconductors

    公开(公告)号:US06417921B2

    公开(公告)日:2002-07-09

    申请号:US09880203

    申请日:2001-06-13

    CPC classification number: G01B11/0641

    Abstract: An optical measurement system is disclosed for evaluating samples with multi-layer thin film stacks. The optical measurement system includes a reference ellipsometer and one or more non-contact optical measurement devices. The reference ellipsometer is used to calibrate the other optical measurement devices. Once calibration is completed, the system can be used to analyze multi-layer thin film stacks. In particular, the reference ellipsometer provides a measurement which can be used to determine the total optical thickness of the stack. Using that information coupled with the measurements made by the other optical measurement devices, more accurate information about individual layers can be obtained.

    Inspection of molded discs with polarizers and display screen
    119.
    发明授权
    Inspection of molded discs with polarizers and display screen 失效
    使用偏光片和显示屏检查模制光盘

    公开(公告)号:US06404496B1

    公开(公告)日:2002-06-11

    申请号:US09487346

    申请日:2000-01-19

    Applicant: Mitsunori Seki

    Inventor: Mitsunori Seki

    CPC classification number: G01M11/081

    Abstract: A method for testing injection-molded discs, such as CD or DVD discs, for the presence of residual stress by placing the discs between two polarizers uses a video screen provided as part of the injection machine's display unit as a light source. The screen is preferably made uniformly bright by removing text or drawings and being set to emit bright white light. The disc is set between and parallel to the two polarizing plates, whose axes are crossed. The machine operator views the screen through the crossed polarizers and freshly-made disc. Stress disturbs the polarization of light transmitted through the disc and shows molding defects as bright patches. The screen can be a CRT or a liquid crystal panel. The light is preferably made uniform by temporarily erasing letters or figures, used to show molding data, from the screen. Preferably a push-button activates and deactivates the bright white screen.

    Abstract translation: 用于通过将光盘放置在两个偏振器之间来测量残留应力的注射成型盘(例如CD或DVD盘)的方法使用作为注射机的显示单元的一部分提供的视频屏幕作为光源。 屏幕优选通过去除文本或图纸而均匀地亮起并被设置为发出明亮的白光。 光盘被设置在两个偏振片之间并平行于它们的轴线交叉。 机器操作员通过交叉的偏振器和新鲜的光盘来观察屏幕。 应力会干扰通过光盘传播的光的偏振,并显示成形缺陷作为亮片。 屏幕可以是CRT或液晶面板。 优选地,通过从屏幕上暂时擦除用于显示模制数据的字母或图形来使光线均匀。 优选地,按钮激活和去激活亮白屏幕。

    High resolution optical performance monitor for DWDM system
    120.
    发明授权
    High resolution optical performance monitor for DWDM system 有权
    用于DWDM系统的高分辨率光学性能监视器

    公开(公告)号:US06396051B1

    公开(公告)日:2002-05-28

    申请号:US09589942

    申请日:2000-06-07

    CPC classification number: G02B6/29322 H04B10/07953

    Abstract: An apparatus for measuring the optical-signal-to-noise ratio (OSNR) of an optical system is adapted to function in single channel or in multi-channel wavelength division multiplexed optical communication systems. An optical signal spectrum and a center frequency characterize the optical signals. A narrow-band notch filter, realized by an in-fiber Bragg grating, is utilized to remove a component of the signal so the remaining signal can be measured. When multiple channels are present, a bandpass filter is used to select the part of the multiplexed signal to be measured. Both the narrow-band notch filter and the bandpass filter can be tunable to further extend the capabilities of the system. Two detectors are utilized with the power in the channel being measured by a low-gain detector and the power in the noise being measured by a high-gain detector. A processor receives the detector outputs, calculates OSNR, and controls the tunable components.

    Abstract translation: 用于测量光学系统的光信噪比(OSNR)的装置适于在单通道或多通道波分复用光通信系统中起作用。 光信号频谱和中心频率表征光信号。 使用由光纤内布拉格光栅实现的窄带陷波滤波器来去除信号的分量,从而可以测量剩余的信号。 当存在多个通道时,使用带通滤波器来选择待测量的复用信号的一部分。 窄带陷波滤波器和带通滤波器都可以调节,以进一步扩展系统的功能。 利用两个检测器,通道中的功率由低增益检测器测量,噪声中的功率由高增益检测器测量。 处理器接收检测器输出,计算OSNR,并控制可调组件。

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