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公开(公告)号：US20220334157A1
公开(公告)日：2022-10-20
申请号：US17640527
申请日：2020-09-09
申请人： Mark Matyac
发明人： Mark Matyac
摘要： An intermediate disconnect section (100) for mounting on a meter base (10) and an electricity meter (20). A first source coupling (117) mounted on a platform (106) is electrically couplable to a source connector of the meter base (10). A second source coupling (119) is electrically coupled to a source connection of the electricity meter (120). A first load coupling (121) is electrically coupled to a load connector of the meter base (10). A second load coupling (123) electrically coupled to a load connection of the electricity meter (20) and to the first load coupling (121). A switch (110) couples and decouples the first source coupling (117) to and from the second source coupling (119). A switching mechanism (130) opens and closes the switch (110) and includes an external device (138) that allows a user to open and close the switch (110) manually.
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公开(公告)号：US20220326299A1
公开(公告)日：2022-10-13
申请号：US17841491
申请日：2022-06-15
发明人： Samer Kabbani , Paul Ferrari , Ikeda Hiroki , Kiyokawa Toshiyuki , Gregory Cruzan , Karthik Ranganathan , Todd Berk , Ian Williams , Mohammad Ghazvini , Tom Jones
摘要： A stand-alone active thermal interposer device for use in testing a system-in-package device under test (DUT), the active thermal interposer device includes a body layer having a first surface and a second surface, wherein the first surface is operable to be disposed adjacent to a cold plate, and a plurality of heating zones defined across a second surface of the body layer, the plurality of heating zones operable to be controlled by a thermal controller to selectively heat and maintain respective temperatures thereof, the plurality of heating zones operable to heat a plurality of areas of the DUT when the second surface of the body layer is disposed adjacent to an interface surface of the DUT during testing of the DUT.
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公开(公告)号：US11467205B2
公开(公告)日：2022-10-11
申请号：US17338312
申请日：2021-06-03
发明人： Kyoonwoo Kim , Jaehun Lee , Taejun Park , Sanghun Lim , Seokyung Kim , Junnyeon Jeong
摘要： A substrate testing apparatus configured to perform a hot electron analysis (HEA) test for analyzing a stand-by failure in a substrate includes a heating chuck having a first surface configured to support the substrate and a second surface opposite to the first surface. The heating chuck is configured to heat the substrate and has an aperture passing through the first surface and the second surface. A substrate moving device moves the substrate on the heating chuck in a lateral direction. A camera is under the heating chuck and photographs the substrate, which is exposed by the heating chuck aperture.
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公开(公告)号：US20220317151A1
公开(公告)日：2022-10-06
申请号：US17216748
申请日：2021-03-30
申请人： Enplas Corporation
发明人： Leo AZUMI
摘要： A socket electrically connects a first electric component and a second electric component, including: a base part in which a through hole extending through the base part from a top surface to a bottom surface in a vertical direction is formed; a contact pin inserted to the through hole such that a pin lower end is exposed from the bottom surface, and configured such that, when in use, a pin upper end makes contact with the first electric component; and a sheet member including a through electrode extending therethrough in the vertical direction, disposed at the base part in a state where the sheet member faces the bottom surface, and configured such that, when in use, an upper end of the through electrode makes contact with the pin lower end and a lower end of the through electrode makes contact with the second electric component.
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公开(公告)号：US11463127B2
公开(公告)日：2022-10-04
申请号：US17202526
申请日：2021-03-16
申请人： Avista Edge, Inc.
摘要： An electronic device includes a first housing including a power module and a second housing coupled to the first housing. The second housing includes a first antenna communicatively coupled to the power module, and oriented in a first direction. The second housing further includes a second antenna communicatively coupled to the power module, and oriented in a second direction that is different than the first direction. At least one printed circuit board (PCB) is disposed in the second housing and communicatively coupled to the power module, the first antenna, and the second antenna A modem module resides within the second housing and communicatively couples to the power module, the first antenna, the second antenna, and the at least one PCB. An interface resides within the second housing and communicatively couples to the power module, the first antenna, the second antenna, the at least one PCB, and the modem module.
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116.发明授权公开(公告)号：US11462859B2
公开(公告)日：2022-10-04
申请号：US17201577
申请日：2021-03-15
申请人： ADVANTEST Corporation , Molex, LLC
发明人： Takahito Seshimo , Atsunori Shibuya , Masayuki Arai , Masataka Oyama , Shigeru Akiyama , Ayako Matsumoto
IPC分类号： H01R13/6471 , H01R24/50 , H01R13/40 , H01R12/71 , G01R1/04
摘要： A coaxial terminal includes a signal terminal, a tubular ground terminal that covers the signal terminal, and an insulating member interposed between the signal terminal and the ground terminal. The signal terminal includes a main body that is covered by the insulating member, an upper contact piece that extends from the main body to +Z direction side, and a lower contact piece that extends from the main body to −Z direction side. The insulating member has an opening through which a part of the main body is exposed. A following formula (1) is satisfied: L2≥½×L1 (1) where L1 is a length of the insulating member along an axial direction of the coaxial terminal, L2 is a length of the opening along the axial direction.
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公开(公告)号：US11460504B2
公开(公告)日：2022-10-04
申请号：US16509685
申请日：2019-07-12
申请人： Chaojiong Zhang
发明人： Chaojiong Zhang
IPC分类号： G01R31/36 , G12B17/08 , G01R31/371 , G01R31/385 , G01R1/04 , G01R1/44
摘要： A cabinet box comprises a plurality of independent, explosion-proof chambers. A battery wiring assembly for receiving and testing a battery is attached to an inner wall of an explosion-proof door, and an electrical connector is provided on an outer wall of the door. The assembly is placed inside a chamber, and the door seals the chamber. The temperature in each chamber is controlled independently, allowing batteries to be tested simultaneously at different temperatures. An air-circulating temperature-control module can be in a chamber, or a temperature controller with a refrigeration sheet can be integrated with the battery wiring assembly for direct battery contact. Separate, independent explosion-proof chambers effectively eliminate the possibility of a battery explosion in one chamber causing a chain-reaction explosion in another chamber. Modularity allows damaged parts to be replaced easily. An external battery testing machine can connected to the connector on each door.
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118.发明授权公开(公告)号：US11454678B2
公开(公告)日：2022-09-27
申请号：US17124298
申请日：2020-12-16
发明人： Stanislaw Zurek , Mark Hadley , Jeffrey Jones
摘要： An electrical plug for testing an electrical mains socket is provided. The plug comprises a pin for engagement with a pin receptor of the mains socket. The pin comprises first and second electrical contacts, each comprising a surface portion to engage with a different respective region of the receptor. The first and second contacts are electrically isolated from one another at the pin. An electrical testing system and a method of testing an electrical mains socket is provided. The testing system comprises the electrical plug and a first circuit connected to the contacts and configured to measure an electrical resistance therebetween. The method includes providing the electrical plug and measuring an electrical resistance between the electrical contacts. A further method is provided for testing an electrical mains plug comprising a pin, by providing an electrical socket with a pin receptor having first and second regions electrically isolated from one another.
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公开(公告)号：US11448688B2
公开(公告)日：2022-09-20
申请号：US17258977
申请日：2019-07-09
申请人： CELERINT, LLC
摘要： Methods are provided that performs continuous semiconductor testing during long soak time testing using a chamberless single insertion model (SIM) handler and also using a chamberless asynchronous insertion model (AIM) handler having two manipulators. The methods include dividing a group of semiconductors having an ambient temperature into a first subgroup having a plurality of portions and a second subgroup having a plurality of portions, the second subgroup being identical to the first subgroup. The methods also include using thermal chucks to change the temperature of the first portion of the first subgroup and the first portion of a second subgroup prior to testing from ambient temperature to a stabilized designated temperature during a soak time. The methods also include testing all of the portions of the first subgroup and the second subgroup using predetermined protocols that include Soak Time, Test Time, Index Time, and sometimes Wait Time.
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公开(公告)号：US11428710B2
公开(公告)日：2022-08-30
申请号：US17158406
申请日：2021-01-26
发明人： Matt Karlgaard
摘要： An electric meter includes: a plurality of connectors configured to form electrical connections to corresponding plurality of receptacles in an electric meter socket, wherein at least one electrical connection to the plurality of receptacles is formed with a neutral wire; and a plurality of measurement devices configured to measure electrical characteristics of voltage and current waveforms provided to the electric meter from an electric distribution system and a distributed energy resource (DER) device via the plurality of connectors. The neutral wire provides an electrical reference point for measurement of the voltage waveforms.
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