摘要:
A system for inspecting the surface of a curved object is provided. This system includes an object having a curved surface; at least one substantially flat interdigital transducer, wherein the interdigital transducer is operative to generate surface energy waves; and at least one coupling device disposed between the curved surface and the substantially flat interdigital transducer, wherein the coupling device is operative to conform to the curved surface, support the interdigital transducer, and provide a medium through which the surface energy waves can effectively travel from the interdigital transducer to the curved surface and across the curved surface in a predetermined direction.
摘要:
An apparatus and method for ultrasonic non-destructive testing provides an elongate strip of ultrasound transmissive material coupled at a proximal end to an object under test. The elongate strip has a transverse cross-section with a width and thickness giving an aspect ratio greater than unity and matched to the ultrasonic transducer such that excitation induces a substantially non-dispersive ultrasonic signal to propagate along the elongate strip to the proximal end and to enter the object under test. These non-dispersive pulses are particularly suited for time-of-flight measurements, thickness measurements, crack measurements and the like. The elongate strip helps to separate the transducer from a potentially hostile environment associated with the object under test. The elongate strip also has a large area of contact with the object under test allowing efficient transmission of energy into the object under test.
摘要:
A scanning acoustic microscope includes a transducer mounted in a cup below a particular elevation and a coupling fluid source disposed below the particular elevation and which is adapted to introduce coupling fluid into the cup. A controller is operable to control the transducer and the coupling fluid source during testing such that ultrasonic energy can be directed upwardly through coupling fluid disposed between and contacting the transducer and a first surface of a part to be inspected. The part is disposed at the particular elevation and a second surface of the part is not contacted by coupling fluid during testing.
摘要:
An ultrasonic probe for examining an item. The probe includes a body having a contact surface adapted for contacting the item when being examined and an ultrasonic transducer attached to the body and spaced from the contact surface. The probe further includes a spacer positioned in the body between the transducer and the contact surface for spacing the transducer from the item when being examined. The spacer includes a coupling surface facing the item when being examined and a transducer surface facing the transducer. The probe also includes a fluid outlet positioned adjacent the coupling surface of the spacer for delivering coupling fluid to the coupling surface as a film so that the coupling fluid tends to maintain contact with the spacer due to surface tension after the fluid is delivered through the outlet.
摘要:
A method for acoustically measuring an external surface of a component and a wall thickness or component thickness at that location is provided. The method also provides for measuring the external surface by physical contact while concurrently acoustically measuring a wall thickness at that location.
摘要:
Disclosed is a wear plate assembly for NDT/NDI probes which provides sufficient protection for the probe being wrung against test objects, desirable acoustic performance meeting the requirements for versatile ultrasonic inspections while providing a mechanism that allows the transducer to be put into or taken out conveniently. The wear plate protects probes from being pieced, worn or structurally deformed albeit being thinner than a wavelength of the acoustic echoes.
摘要:
The present invention is seen to provide a new methodology, testing system designs and concept to enable in situ real time monitoring of the cure process. Apparatus, system, and method for the non-destructive, in situ monitoring of the time dependent curing of advanced materials using one or more differential ultrasonic waveguide cure monitoring probes. A differential ultrasonic waveguide cure monitoring probe in direct contact with the material to be cured and providing in situ monitoring of the cure process to enable assessment of the degree of cure or cure level in a non-cure related signal variances (e.g., temperature) independent calibrated response manner. A differential ultrasonic waveguide cure monitoring probe including a transducer coupled to a waveguide and incorporating correction and calibration methodology to accurately and reproducibly monitor the cure process and enable assessment of cure level via ultrasonic reflection measurements. The amplitude of the corrected interface response signal reflected from the probe-resin interface indicating changes in the modulus of the material during the cure.
摘要:
A method for ultrasonic testing includes placing an ultrasonic probe in a liquid bath inside of a pressure vessel having an elastomeric diaphragm stretched across an opening of the pressure vessel, applying pressure within the pressure vessel to bring the elastomeric diaphragm towards a test piece, and conducting ultrasonic testing of the test piece using the ultrasonic probe. A device for ultrasonic testing of a test piece includes a pressure vessel having an elastomeric diaphragm and an ultrasonic probe disposed within the pressure vessel.
摘要:
Methods and systems for acoustically treating material using a continuous process in which material may be caused to flow in a continuous or intermittent fashion into/out of an acoustic treatment chamber where the material is exposed to focused acoustic energy. The methods and systems may be arranged to permit continuous processing for extended periods while an acoustic energy source operates at a relatively high power output. Treatment chambers may include features such as an acoustic window, a heat exchanger, inlet/outlet flow arrangements, an inspection window, insert elements that define a treatment volume size or shape, etc. Treatment system configurations relating to arrangements of a treatment chamber relative to an acoustic source and coupling medium, material flow paths, and others are provided.
摘要:
A method for forming a semiconductor device, the method includes providing a semiconductor substrate, applying a slurry to the semiconductor substrate, wherein the slurry was tested using a testing method includes taking a first undiluted sample from a top of the slurry; determining a first particle size distribution characteristic of the first undiluted sample; taking a second undiluted sample from a bottom of the slurry; determining a second particle size distribution characteristic of the second undiluted sample; and comparing a difference between the first particle size distribution characteristic and the second particle size distribution characteristics with a first predetermined value.