SAMPLE HOLDER ASSEMBLY FOR EFFECTIVE THERMAL CONDUCTIVITY MEASUREMENT OF PEBBLE-BED IN LASER FLASH APPARATUS

    公开(公告)号:US20190302044A1

    公开(公告)日:2019-10-03

    申请号:US15983593

    申请日:2018-05-18

    Abstract: The present disclosure provides a sample holder assembly for a laser flash apparatus for measuring a thermal conductivity of a pebble-bed, the assembly comprising: a tubular sample container configured to be mounted on a sample carrier tube for the laser flash apparatus, wherein the sample container has open top and bottom; a bottom disc disposed in the sample container to block the open bottom of the sample container and configured for delivering a laser from a laser flash unit of the apparatus to a pebble-bed; the pebble-bed packed on the bottom disc to a predetermined thickness; and a top disc disposed on the pebble-bed and in the sample container to block the open top of the sample container and configured for receiving heat from the pebble-bed to transfer the heat upward.

    FAST PARALLEL OPTICAL COHERENCE TOMOGRAPHIC IMAGE GENERATING APPARATUS AND METHOD

    公开(公告)号:US20190117077A1

    公开(公告)日:2019-04-25

    申请号:US16164543

    申请日:2018-10-18

    Abstract: Provided is a fast parallel optical coherence tomographic image generating method including dispersing light into N spectral regions Δλ1 through ΔλN sequentially from a low wavelength to a high wavelength, the light being emitted from a broadband light source of a fast parallel optical coherence tomographic image generating apparatus, N being an integer greater than or equal to “2”, splitting the light emitted from the broadband light source to be incident on a sample and a reference mirror, partitioning the sample into N image regions P1 through PN, discretely controlling a beam scanner such that the light emitted from the broadband light source is incident on the sample at a position changed by a preset distance, acquiring an interference spectral image through interference light formed in response to interference of measurement light and reference light, and generating a tomographic image of the sample using the interference spectral image.

    WAFER INSPECTION APPARATUS
    124.
    发明申请

    公开(公告)号:US20180364181A1

    公开(公告)日:2018-12-20

    申请号:US15974111

    申请日:2018-05-08

    Abstract: Disclosed is a wafer inspection apparatus. The wafer inspection apparatus includes: a magnetic field generating unit forming a magnetic field such that magnetic lines of force flow in a direction perpendicular or parallel to a first surface of a wafer on which a magnetic thin film is formed; a microwave guide unit emitting microwaves to a measurement region that is at least a partial region of the wafer and is a region affected by the magnetic field generated by the magnetic field generating unit; and a sensing unit receiving waves reflected or transmitted after the microwaves are emitted to the measurement region from the microwave guide unit.

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