摘要:
A fin-semiconductor region (13) is formed on a substrate (11). A first impurity which produces a donor level or an acceptor level in a semiconductor is introduced in an upper portion and side portions of the fin-semiconductor region (13), and oxygen or nitrogen is further introduced as a second impurity in the upper portion and side portions of the fin-semiconductor region (13).
摘要:
Disclosed here is a method of controlling a dose amount of dopant to be doped into object (1) to be processed in plasma doping. According to the method, the doping control is formed of the following processes: determining the temperature of object (1), the amount of ions having dopant in plasma that collide with object (1), and types of gases in plasma during doping; calculating a dose amount by neutral gas according to the temperature of object (1), and a dose amount by ions from the determined amount of ions containing dopant that collide with object (1); and carrying out doping so that the sum of the dose amount by neutral gas and the dose amount by ions equal to a predetermined dose amount.
摘要:
An ion irradiation system has a leader and a trailer at its beam line, and at least one non-beam-breaking beam-current measuring instrument is prepared between the leader and the trailer. The leader is an ion source, and the trailer is a process chamber where semiconductor wafers are placed. The beam-current measuring instrument is placed before the wafers.
摘要:
After a fin-semiconductor region (13) is formed on a substrate (11), impurity-containing gas and oxygen-containing gas are used to perform plasma doping on the fin-semiconductor region (13). This forms impurity-doped region (17) in at least side portions of the fin-semiconductor region (13).
摘要:
Plasma doping is performed using a plasma made of a gas containing an impurity which will serve as a dopant. In this case, at least one of plasma generation high-frequency power and biasing high-frequency power is supplied in the form of pulses.
摘要:
A method is provided for controlling a dose amount of dopant to be doped into an object to be processed in plasma doping. According to the method, the doping control is formed of the following processes: determining the temperature of the object, the amount of ions having dopant in plasma that collide with the object, and types of gases in plasma during doping; calculating a dose amount by neutral gas according to the temperature of the object, and a dose amount by ions from the determined amount of ions containing dopant that collide with the object; and carrying out doping so that the sum of the dose amount by neutral gas and the dose amount by ions equal to a predetermined dose amount.
摘要:
The pressure contact holding-type connector in accordance with the present invention is configured to be interposed between opposing electrodes; a conductive pin is located in at least one end portion of each through-hole of an insulating housing having a through-hole oriented in the thickness direction; a flange section provided at the conductive pin is mated with a small-diameter section provided in one end portion of the through-hole to maintain at least part of the conductive pin in a state of accommodation inside the through-hole; and a conductive coil spring having one end thereof mated with the flange section provided at the conductive pin and pushing the conductive pin with a snap to the outside of the through-hole is installed inside the through-hole. The conductive pin can be disposed at both ends of the coil spring.
摘要:
Disclosed here is a cyclotron having a beam phase selector capable of controlling phase widths of beams and improving beam permeability for increasing beam current. The cyclotron contains an acceleration voltage applying section and a beam blocking section, at least any one of the two sections has a movable structure. While a particle is passing across a gap between dee electrodes, the acceleration voltage applying section applies RF acceleration voltage to the particle, and further applies RF acceleration voltage having a phase different from the phase of previously applied RF acceleration voltage. The beam blocking section blocks undesired particles. Preferably, the acceleration voltage applying section at least has an electrode having an opening in a direction of the core of the cyclotron. Also preferably, operations on phase-width control can be performed outside the cyclotron, with vacuum condition in the cyclotron maintained.
摘要:
A powder molded magnet manufactured by a method comprising the steps of: (1) forming a granular compound of diameter of not more than 250 μm with a rare earth-iron rapid-quenched flake, which has not more than 150 μm in diameter, being coarsely ground if necessary, and a binder, (2) dry-blending the granular compound with fatty acid metallic soap powder, (3) forming compressed powder from the granular compound dry-blended with the fatty acid metallic soap powder, by powder molding, and (4) heat-treating the compressed powder to a temperature higher than a thermally dissociating temperature of stabilized isocyanate.