HIGH ACCURACY FAST VOLTAGE AND TEMPERATURE SENSOR CIRCUIT

    公开(公告)号:US20230140251A1

    公开(公告)日:2023-05-04

    申请号:US17965282

    申请日:2022-10-13

    Inventor: Atul DWIVEDI

    Abstract: A temperature sensing circuit includes a current generation circuit generating an initial current proportional to absolute temperature (Iptat), and a voltage generation circuit configured to mirror Iptat using an adjustable current source to produce a scaled current and to source the scaled current to a first terminal of a resistor to produce a reference voltage at the first terminal. A second terminal of the resistor has a voltage complementary to absolute temperature (Vctat) applied thereto. An analog-to-digital converter (ADC) has a reference input receiving the reference voltage, and a data input receiving Vctat or an externally sourced voltage. The ADC generates an output code indicative of a ratio between: a) either Vctat or the externally sourced voltage, and b) the reference voltage. A digital circuit determines a temperature readout from the output code and calibrates the reference voltage and the temperature readout determination based upon the output code.

    REGULATOR OF A SENSE AMPLIFIER
    184.
    发明申请

    公开(公告)号:US20230110870A1

    公开(公告)日:2023-04-13

    申请号:US17490976

    申请日:2021-09-30

    Abstract: A system and method for operating a memory cell is provided. A non-volatile memory storage device includes an array of memory cells of differential or single-ended type. In an embodiment, a regulator is coupled to a sense amplifier. The regulator is configured to generate a voltage to gate terminals of one or two transistors of the sense amplifier. In the differential type, the voltage is generated such that the first bias current and the second bias current have a current value equal to the sum of a maximum current flowing in a memory cell being in a RESET state and a fixed current. In the single-ended type, the regulated voltage is generated such that the first bias current and the second bias current have a current value equal to the sum of a fixed current and the reference current generated by the reference current source across temperature.

    LOW POWER CRYSTAL OSCILLATOR
    186.
    发明申请

    公开(公告)号:US20230090782A1

    公开(公告)日:2023-03-23

    申请号:US17931863

    申请日:2022-09-13

    Abstract: A low power crystal oscillator circuit having a high power part and a low power part. Oscillation is initialized using the high power part. Once the crystal is under stable oscillation, the circuit switches to the low power part and continue operation for a long duration.

    NON-VOLATILE MEMORY DEVICE READABLE ONLY A PREDETERMINED NUMBER OF TIMES

    公开(公告)号:US20230018738A1

    公开(公告)日:2023-01-19

    申请号:US17812122

    申请日:2022-07-12

    Abstract: In an embodiment a noon-volatile memory device includes a memory plane including at least one memory area including an array of memory cells having two rows and N columns, wherein each memory cell comprises a state transistor having a control gate and a floating gate selectable by a vertical selection transistor buried in a substrate and including a buried selection gate, and wherein each column of memory cells includes a pair of twin memory cells, two selection transistors of the pair of twin memory cells having a common selection gate and a processor configured to store in the memory area information including a succession of N bits so that, with exception of the last bit of the succession, a current bit of the succession is stored in two memory cells located on the same row and on two adjacent columns and a current bit and the following bit are respectively stored in two twin cells.

    LOW POWER AND FAST MEMORY RESET
    190.
    发明申请

    公开(公告)号:US20230015002A1

    公开(公告)日:2023-01-19

    申请号:US17852677

    申请日:2022-06-29

    Abstract: A method of memory reset includes precharging bit lines of a memory array, asserting a signal at a reset node to remove the precharge voltage, and selecting write drivers associated with the bit lines associated with columns of the memory array that contain memory cells to be reset, with the assertion of the signal at the reset node also resulting in application of desired logic states to inputs of the selected write drivers to cause those selected write drivers to change a logic state of the bit lines associated with those write drivers. The method continues with asserting each word line associated with a row of the memory that contains memory cells to be reset to write desired logic states to all of the memory cells of the columns and rows of the memory to be reset during a single clock cycle, and then deasserting those word lines.

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